Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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F374
Abstract: SN54BCT8374A SN74BCT8374A SN74BCT8374
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
SN74BCT8374
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
SN54BCT8374A
BCT374
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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BCT8374A
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
SCBA004C
SDYA010
SDYA012
SZZU001B,
SDYU001N,
SCET004,
BCT8374A
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shift register by using D flip-flop
Abstract: F374 SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
shift register by using D flip-flop
F374
SN54BCT8374A
SN74BCT8374A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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F374
Abstract: SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
SCBS045e
SN74BCT8374
bct8374
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
SN54BCT8374A
BCT374
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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PDF
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74BCT8374
Abstract: D3641 TEX-E wire
Text: SN54BCT8374, SN74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— 0 3 6 4 1 , JUNE 1990 SN54BCT8374 IT PACKAGE SN74BCT8374 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE Family of Testability Products TOP VIEW
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OCR Scan
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SN54BCT8374,
SN74BCT8374
TI0223--
SN54BCT8374
SN74BCT8374
SN54/74F374
SN54/74BCT374
74BCT8374
D3641
TEX-E wire
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bct8374
Abstract: D3641 BSR10 SN74BCT8374 PRPG 74BCT8374
Text: SN54BCT8374, SN74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— D3641, JUNE 1990 M em bers o f Texas Instrum ents SCOPE” Family o f Testability P roducts SN54BCT8374 . . . JT PACKAGE SN74BCT8374 . . . DW OR NT PACKAGE TOP VIEW
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OCR Scan
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SN54BCT8374,
SN74BCT8374
TI0223â
D3641,
SN54BCT8374
SN54/74F374
SN54/74BCT374
bct8374
D3641
BSR10
SN74BCT8374
PRPG
74BCT8374
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBSQ45D - JUNE 1990 - REVISED APRIL 1994 I I I • Members of the Texas Instruments SCOPE Family of Testability Products • Octal Test-Integrated Circuits I I • Functionally Equivalent to SN54/74F374
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OCR Scan
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SN54BCT8374A,
SN74BCT8374A
SCBSQ45D
SN54/74F374
SN54/74BCT374
SN54BCT8374A
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PDF
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GDS741S
Abstract: SN54BCT8374A SN74BCT8374A SCBS045D-JUNE BI72 74BCT8374
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS S C B S 0 4 5 D -J U N E 1 9 9 0 - REVISED A P R IL 1 99 4 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits SN54BCT8374A . . . JT PACKAGE
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OCR Scan
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SN54BCT8374A,
SN74BCT8374A
SCBS045D-JUNE
APRIL1994
SN54BCT8374A
SN74BCT8374A
SN54/74F374
SN54/74BCT374
0C174HC1
GDS741S
SN54BCT8374A
BI72
74BCT8374
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PDF
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BCT8374
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E - JUNE 1990 - REVISED JULY 1996 SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW M e m b e r s of the Texas I n s t r u m e nt s SC O PE F a mi l y of Testabil ity P r o d u c t s
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OCR Scan
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374
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PDF
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