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Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
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SCBS045E
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SN54BCT8374A
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Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
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SCBS045E
BCT374
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
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F374
Abstract: SN54BCT8374A SN74BCT8374A SN74BCT8374
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
SN74BCT8374
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
SN54BCT8374A
BCT374
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
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SCBS045E
BCT374
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
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SCBS045E
BCT374
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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BCT8374A
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
SCBA004C
SDYA010
SDYA012
SZZU001B,
SDYU001N,
SCET004,
BCT8374A
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shift register by using D flip-flop
Abstract: F374 SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
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SCBS045E
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SN54BCT8374A
shift register by using D flip-flop
F374
SN54BCT8374A
SN74BCT8374A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SCBS045E
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F374
Abstract: SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
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SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
SCBS045e
SN74BCT8374
bct8374
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
SN54BCT8374A
BCT374
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SCBS045E
BCT374
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FT 4013 d dual flip flop
Abstract: FT 4013 D flip flop 74HC octal bidirectional latch 74HCT 4013 DATASHEET 4511 pin configuration SN7432 fairchild CMOS TTL Logic Family Specifications 7805 acv Datasheet of decade counter CD 4017 sn74154
Text: T H E W O R L D L E A D E R I N L O G I C P R O D U C T S Logic Selection Guide February 2000 1999 EEProduct News PRODUCTS OF THE YEAR AWARD New products for prototype design AVC Advanced Very-Low-Voltage CMOS Logic See Section 4 LOGIC OVERVIEW 1 FUNCTIONAL INDEX
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SN74HC02 Spice model
Abstract: philips semiconductor data handbook SDAD001C SDFD001B SCAD001D SN7497 spice model SN74AHC14 spice Transistor Crossreference SLLS210 ci ttl sn74ls00
Text: LOGIC OVERVIEW 1 FUNCTIONAL INDEX 2 FUNCTIONAL CROSSĆREFERENCE 3 DEVICE SELECTION GUIDE 4 3 LOGIC SELECTION GUIDE FIRST QUARTER 1997 IMPORTANT NOTICE Texas Instruments TI reserves the right to make changes to its products or to discontinue any semiconductor product or service without notice, and advises its customers to obtain the latest
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transistor fn 1016
Abstract: SN74HC1G00 SCAD001D sn74154 SN74ALVC1G32 JK flip flop IC SDFD001B philips 18504 FB 3306 CMOS Data Book Texas Instruments Incorporated
Text: W O R L D L Logic Selection Guide August 1998 E A D E R I N L O G I C P R O D U C T S LOGIC OVERVIEW 1 FUNCTIONAL INDEX 2 FUNCTIONAL CROSSĆREFERENCE 3 DEVICE SELECTION GUIDE 4 3 LOGIC SELECTION GUIDE AUGUST 1998 IMPORTANT NOTICE Texas Instruments and its subsidiaries TI reserve the right to make changes to their products or
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T flip flop IC
Abstract: pin designation for CD40110B IC 74LS series logic gates 3 input or gate FT 4013 d dual flip flop ic cmos 4011 CD4001* using NAND gates IC CD 4033 pin configuration Quad 2 input nand gate cd 4093 FT 4013 D flip flop 74HCT 4013 DATASHEET
Text: T H E W O R L D L E A D E R I N L O G I C P R O D U C T S Logic Selection Guide February 2000 1999 EEProduct News PRODUCTS OF THE YEAR AWARD New products for prototype design AVC Advanced Very-Low-Voltage CMOS Logic See Section 4 LOGIC OVERVIEW 1 FUNCTIONAL INDEX
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BCT8374
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E - JUNE 1990 - REVISED JULY 1996 SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW M e m b e r s of the Texas I n s t r u m e nt s SC O PE F a mi l y of Testabil ity P r o d u c t s
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OCR Scan
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SCBS045E
BCT8374
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