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    BCT374 Search Results

    BCT374 Result Highlights (6)

    Part ECAD Model Manufacturer Description Download Buy
    SN74BCT374N Texas Instruments Octal D-Type Edge-Triggered Flip-Flops 20-PDIP 0 to 70 Visit Texas Instruments Buy
    SNJ54BCT374FK Texas Instruments Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs 20-LCCC -55 to 125 Visit Texas Instruments Buy
    SNJ54BCT374J Texas Instruments Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs 20-CDIP -55 to 125 Visit Texas Instruments Buy
    SNJ54BCT374W Texas Instruments Octal Edge-Triggered D-type Flip-Flops With 3-State Outputs 20-CFP -55 to 125 Visit Texas Instruments Buy
    SN74BCT374DW Texas Instruments Octal D-Type Edge-Triggered Flip-Flops 20-SOIC 0 to 70 Visit Texas Instruments Buy
    SN74BCT374NSR Texas Instruments Octal D-Type Edge-Triggered Flip-Flops 20-SO 0 to 70 Visit Texas Instruments Buy
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    BCT374 Price and Stock

    Rochester Electronics LLC SN74BCT374DB

    BUS DRIVER, BCT/FBT SERIES
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SN74BCT374DB Bulk 4,900 84
    • 1 -
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    • 100 $3.61
    • 1000 $3.61
    • 10000 $3.61
    		Buy Now

    Rochester Electronics LLC 74BCT374SCX

    D FLIP-FLOP, 8-FUNC
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey 74BCT374SCX Bulk 3,000 567
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    • 1000 $0.53
    • 10000 $0.53
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    Rochester Electronics LLC SNJ54BCT374FK

    54BCT374 OCTAL EDGE-TRIGGERED D-
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SNJ54BCT374FK Bulk 258 9
    • 1 -
    • 10 $35.8
    • 100 $35.8
    • 1000 $35.8
    • 10000 $35.8
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    Rochester Electronics LLC SNJ54BCT374J

    54BCT374 OCTAL EDGE-TRIGGERED D-
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SNJ54BCT374J Bulk 199 8
    • 1 -
    • 10 $37.59
    • 100 $37.59
    • 1000 $37.59
    • 10000 $37.59
    		Buy Now

    Texas Instruments SN74BCT374N

    IC FF D-TYPE SNGL 8BIT 20DIP
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    DigiKey SN74BCT374N Tube 240
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    • 1000 $4.22467
    • 10000 $4.22467
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    Mouser Electronics SN74BCT374N 30
    • 1 $6.16
    • 10 $5.93
    • 100 $4.22
    • 1000 $4.13
    • 10000 $4.13
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    Bristol Electronics SN74BCT374N 15
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    Rochester Electronics SN74BCT374N 5,882 1
    • 1 $3.3
    • 10 $3.3
    • 100 $3.1
    • 1000 $2.8
    • 10000 $2.8
    		Buy Now
    Find more BCT374 price and stock on Findchips.com

    BCT374 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A

    Untitled

    Abstract: No abstract text available
    Text: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading


    Original     		PDF SN54BCT374, SN74BCT374 SCBS019C SN54BCT374 SN74BCT374 000-V A114-A)

    ABT245

    Abstract: F244 F245 SN74ABT8245 SN74ABT8952 SN74ABT8952DW SN74BCT8244A an7005 ti8245
    Text: Using ispGDX to Replace Texas Instruments Boundary Scan Bus Devices TM sible, especially with 5.0 ns Tpd and Tco. After a brief overview of the ispGDX architecture, several examples illustrating the use of the ispGDX devices for boundary scan bus devices follow. For more detailed information


    Original     		PDF SN74BCT8374A ti8374; ispGDX160-5Q208; ABT245 F244 F245 SN74ABT8245 SN74ABT8952 SN74ABT8952DW SN74BCT8244A an7005 ti8245

    SN54BCT374

    Abstract: SN74BCT374 SN74BCT374DW SN74BCT374DWR SN74BCT374N SN74BCT374NSR
    Text: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading


    Original     		PDF SN54BCT374, SN74BCT374 SCBS019C 000-V A114-A) SN54BCT374 SN54BCT374 SN74BCT374 SN74BCT374DW SN74BCT374DWR SN74BCT374N SN74BCT374NSR

    SN54LVT18502

    Abstract: SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502
    Text: Using ispGDX to Replace Boundary Scan Bus Devices the I/O cells make almost any TTL-bus application possible, especially with the 3.5ns Tpd and Tco of the 3.3V ispGDXV devices. After a brief overview of the ispGDX architecture, several examples illustrating the use of the


    Original     		PDF SN74BCT8374A ti8374; ispGDX160VA-3Q208; SN54LVT18502 SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    Untitled

    Abstract: No abstract text available
    Text: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading


    Original     		PDF SN54BCT374, SN74BCT374 SCBS019C SN54BCT374 SN74BCT374 000-V A114-A)

    Untitled

    Abstract: No abstract text available
    Text: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCBS019B – SEPTEMBER 1988 – REVISED APRIL 1994 • • • • • BCT374 . . . J OR W PACKAGE BCT374 . . . DB OR DW OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design


    Original     		PDF SN54BCT374, SN74BCT374 SCBS019B MIL-Std-883C, 300-mil SN54BCT374 SN74BCT374 SN74BCT374DWR SN74BCT374N SN74BCT374NSR

    F374

    Abstract: SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    F374

    Abstract: SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A

    F374

    Abstract: SN54BCT8374A SN74BCT8374A SN74BCT8374
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A SN74BCT8374

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    texas F245

    Abstract: ti8245 an7005 A37 diode ABT245 F244 F245 SN74ABT8245 SN74ABT8952 SN74ABT8952DW
    Text: Using ispGDX to Replace Texas Instruments Boundary Scan Bus Devices TM sible, especially with 5.0 ns Tpd and Tco. After a brief overview of the ispGDX architecture, several examples illustrating the use of the ispGDX devices for boundary scan bus devices follow. For more detailed information


    Original     		PDF SN74BCT8374A ti8374; ispGDX160-5Q208; texas F245 ti8245 an7005 A37 diode ABT245 F244 F245 SN74ABT8245 SN74ABT8952 SN74ABT8952DW

    Untitled

    Abstract: No abstract text available
    Text: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading


    Original     		PDF SN54BCT374, SN74BCT374 SCBS019C SN54BCT374 SN74BCT374 000-V A114-A) 20/clocks

    Untitled

    Abstract: No abstract text available
    Text: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading


    Original     		PDF SN54BCT374, SN74BCT374 SCBS019C SN54BCT374 SN74BCT374 000-V A114-A) SNJ54BCT374FK 5962View

    Untitled

    Abstract: No abstract text available
    Text: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading


    Original     		PDF SN54BCT374, SN74BCT374 SCBS019C 000-V A114-A) SN54BCT374

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E SN54BCT8374A BCT374

    F374

    Abstract: SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A

    Untitled

    Abstract: No abstract text available
    Text: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading


    Original     		PDF SN54BCT374, SN74BCT374 SCBS019C SN54BCT374 SN74BCT374 000-V A114-A)

    Untitled

    Abstract: No abstract text available
    Text: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading


    Original     		PDF SN54BCT374, SN74BCT374 SCBS019C SN54BCT374 SN74BCT374 000-V A114-A) 20Timers

    Untitled

    Abstract: No abstract text available
    Text: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading


    Original     		PDF SN54BCT374, SN74BCT374 SCBS019C SN54BCT374 SN74BCT374 000-V A114-A) 20Timers

    Untitled

    Abstract: No abstract text available
    Text: BCT374, BCT374 OCTAL EDGE-TRIGGERED D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS019C – SEPTEMBER 1988 – REVISED MARCH 2003 D D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading


    Original     		PDF SN54BCT374, SN74BCT374 SCBS019C SN54BCT374 SN74BCT374 000-V A114-A)

    Untitled

    Abstract: No abstract text available
    Text: NA TI ON AL S E M I C O N D LOGIC 4TE D NSC1 b S 0 1 1 2 2 0 0 7 3 33 2 June 1992 BCT374 Octal D Flip-Flop with TRI-STATE Outputs General Description Features The 'BCT374 is a high-speed, low-power octal D-type flipflop featuring separate D-type inputs for each flip-flop and


    OCR Scan     		PDF 74BCT374 BCT374