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Catalog Datasheet	MFG & Type	PDF	Document Tags
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBSQ45D - JUNE 1990 - REVISED APRIL 1994 I I I • Members of the Texas Instruments SCOPE Family of Testability Products • Octal Test-Integrated Circuits I I • Functionally Equivalent to SN54/74F374	OCR Scan	PDF	SN54BCT8374A, SN74BCT8374A SCBSQ45D SN54/74F374 SN54/74BCT374 SN54BCT8374A

Catalog Datasheet

MFG & Type

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Document Tags

Untitled

Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBSQ45D - JUNE 1990 - REVISED APRIL 1994 I I I • Members of the Texas Instruments SCOPE Family of Testability Products • Octal Test-Integrated Circuits I I • Functionally Equivalent to SN54/74F374

OCR Scan

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SN54BCT8374A, SN74BCT8374A SCBSQ45D SN54/74F374 SN54/74BCT374 SN54BCT8374A