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    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBSQ45D - JUNE 1990 - REVISED APRIL 1994 I I I • Members of the Texas Instruments SCOPE Family of Testability Products • Octal Test-Integrated Circuits I I • Functionally Equivalent to SN54/74F374


    OCR Scan     		SN54BCT8374A, SN74BCT8374A SCBSQ45D SN54/74F374 SN54/74BCT374 SN54BCT8374A PDF