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SN74BCT8374ADW		Texas Instruments	Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70

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Texas Instruments SN74BCT8374ADW IC SCAN TEST DEVICE W/FF 24-SOIC
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
DigiKey	SN74BCT8374ADW	Tube	39		1	1 $10.65 10 $8.329 100 $7.1097 1000 $6.47088 10000 $6.47088	Buy Now
Mouser Electronics	SN74BCT8374ADW		68			1 $13.95 10 $9.96 100 $8.41 1000 $7.07 10000 $7.07	Buy Now
Bristol Electronics	SN74BCT8374ADW		1,823			1 - 10 - 100 - 1000 - 10000 -	Get Quote
Texas Instruments SN74BCT8374ANT IC SCAN TEST DEVICE W/FF 24-DIP
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
DigiKey	SN74BCT8374ANT	Tube			60	1 - 10 - 100 $7.56983 1000 $7.56983 10000 $7.56983	Buy Now
Bristol Electronics	SN74BCT8374ANT		45			1 - 10 - 100 - 1000 - 10000 -	Get Quote
Quest Components	SN74BCT8374ANT		36			1 $8.064 10 $5.9136 100 $5.376 1000 $5.376 10000 $5.376	Buy Now
	SN74BCT8374ANT		4			1 $8.64 10 $6.336 100 $6.336 1000 $6.336 10000 $6.336	Buy Now
Rochester Electronics	SN74BCT8374ANT		825		1	1 $4.3 10 $4.3 100 $4.04 1000 $3.66 10000 $3.66	Buy Now
Rochester Electronics LLC SN74BCT8374ANT BUS DRIVER
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DigiKey	SN74BCT8374ANT	Tube			68	1 - 10 - 100 $4.47 1000 $4.47 10000 $4.47	Buy Now
Texas Instruments SN74BCT8374ADWR IC SCAN TEST DEVICE W/FF 24-SOIC
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
DigiKey	SN74BCT8374ADWR	Reel			2,000	1 - 10 - 100 - 1000 - 10000 $5.80746	Buy Now
Bristol Electronics	SN74BCT8374ADWR		1,823			1 - 10 - 100 - 1000 - 10000 -	Get Quote
Texas Instruments SN74BCT8374ANTG4 IC SCAN TEST DEVICE W/FF 24-DIP
Distributors	Part	Package	Stock	Lead Time	Min Order Qty	Price	Buy
DigiKey	SN74BCT8374ANTG4	Tube			60	1 - 10 - 100 $7.56983 1000 $7.56983 10000 $7.56983	Buy Now

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SN74BCT8374A Datasheets (14)

Part	Manufacturer	Description	Datasheet Type	PDF
SN74BCT8374A	Texas Instruments	SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS	Original	PDF
SN74BCT8374A	Texas Instruments	SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS	Original	PDF
SN74BCT8374ADW	Texas Instruments	SCAN Bridge, JTAG Test Port	Original	PDF
SN74BCT8374ADW	Texas Instruments	Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70	Original	PDF
SN74BCT8374ADWE4	Texas Instruments	SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS	Original	PDF
SN74BCT8374ADWG4	Texas Instruments	Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70	Original	PDF
SN74BCT8374ADWR	Texas Instruments	Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops	Original	PDF
SN74BCT8374ADWR	Texas Instruments	Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70	Original	PDF
SN74BCT8374ADWRE4	Texas Instruments	SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS	Original	PDF
SN74BCT8374ADWRG4	Texas Instruments	Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70	Original	PDF
SN74BCT8374ANT	Texas Instruments	SCAN Bridge, JTAG Test Port	Original	PDF
SN74BCT8374ANT	Texas Instruments	Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-PDIP 0 to 70	Original	PDF
SN74BCT8374ANTE4	Texas Instruments	SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS	Original	PDF
SN74BCT8374ANTG4	Texas Instruments	Integrated Circuits (ICs) - Logic - Specialty Logic - IC SCAN TEST DEVICE W/FF 24-DIP	Original	PDF

SN74BCT8374A Datasheets Context Search

Catalog Datasheet	MFG & Type	Document Tags	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
F374 Abstract: SN54BCT8374A SN74BCT8374A Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
F374 Abstract: SN54BCT8374A SN74BCT8374A Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A	PDF
F374 Abstract: SN54BCT8374A SN74BCT8374A SN74BCT8374 Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A SN74BCT8374	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products	Original	SN54BCT8374A, SN74BCT8374A SCBS045E SN54BCT8374A BCT374	PDF
F374 Abstract: SN54BCT8374A SN74BCT8374A Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A	PDF
F374 Abstract: SN54BCT8374A SN74BCT8374A Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
F374 Abstract: SN54BCT8374A SN74BCT8374A Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A	PDF
BCT8374A Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374 SCBA004C SDYA010 SDYA012 SZZU001B, SDYU001N, SCET004, BCT8374A	PDF

shift register by using D flip-flop Abstract: F374 SN54BCT8374A SN74BCT8374A Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A shift register by using D flip-flop F374 SN54BCT8374A SN74BCT8374A	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
F374 Abstract: SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374 Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products	Original	SN54BCT8374A, SN74BCT8374A SCBS045E SN54BCT8374A BCT374	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability	Original	SN54BCT8374A, SN74BCT8374A SCBS045E BCT374	PDF
ABT245 Abstract: F244 F245 SN74ABT8245 SN74ABT8952 SN74ABT8952DW SN74BCT8244A an7005 ti8245 Text: Using ispGDX to Replace Texas Instruments Boundary Scan Bus Devices TM sible, especially with 5.0 ns Tpd and Tco. After a brief overview of the ispGDX architecture, several examples illustrating the use of the ispGDX devices for boundary scan bus devices follow. For more detailed information	Original	SN74BCT8374A ti8374; ispGDX160-5Q208; ABT245 F244 F245 SN74ABT8245 SN74ABT8952 SN74ABT8952DW SN74BCT8244A an7005 ti8245	PDF
SN54LVT18502 Abstract: SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502 Text: Using ispGDX to Replace Boundary Scan Bus Devices the I/O cells make almost any TTL-bus application possible, especially with the 3.5ns Tpd and Tco of the 3.3V ispGDXV devices. After a brief overview of the ispGDX architecture, several examples illustrating the use of the	Original	SN74BCT8374A ti8374; ispGDX160VA-3Q208; SN54LVT18502 SN54ABT8245 SN54ABT8543 SN54ABTH18502A SN54BCT8240A SN54BCT8244A SN54BCT8245A SN54BCT8373A SN74ABT18245A SN74ABT18502	PDF
Untitled Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBSQ45D - JUNE 1990 - REVISED APRIL 1994 I I I • Members of the Texas Instruments SCOPE Family of Testability Products • Octal Test-Integrated Circuits I I • Functionally Equivalent to SN54/74F374	OCR Scan	SN54BCT8374A, SN74BCT8374A SCBSQ45D SN54/74F374 SN54/74BCT374 SN54BCT8374A	PDF
GDS741S Abstract: SN54BCT8374A SN74BCT8374A SCBS045D-JUNE BI72 74BCT8374 Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS S C B S 0 4 5 D -J U N E 1 9 9 0 - REVISED A P R IL 1 99 4 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits SN54BCT8374A . . . JT PACKAGE	OCR Scan	SN54BCT8374A, SN74BCT8374A SCBS045D-JUNE APRIL1994 SN54BCT8374A SN74BCT8374A SN54/74F374 SN54/74BCT374 0C174HC1 GDS741S SN54BCT8374A BI72 74BCT8374	PDF
BCT8374 Abstract: No abstract text available Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E - JUNE 1990 - REVISED JULY 1996 SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW M e m b e r s of the Texas I n s t r u m e nt s SC O PE F a mi l y of Testabil ity P r o d u c t s	OCR Scan	SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374	PDF

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SN74BCT8374A Datasheets (14)

SN74BCT8374A Datasheets Context Search

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F374

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F374

BCT8374A

shift register by using D flip-flop

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F374

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ABT245

SN54LVT18502

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GDS741S

BCT8374