DSASW00296628.pdf

Manufacturer -
Partial File Text Drop Test Reliability of Wafer Level Chip Scale Packages Mikko Alajoki, Luu Nguyen(* and Jorma Kivilahti Lab. of Electronics Production Technology Helsinki University of Technology P.O.Box 3000, 0
Type Original
ECAD Model

DSASW00296628.pdf preview Download Datasheet