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    DSASW00296583.pdf

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    • Mean Time To Failure in Wafer Level-CSP Packages with SnPb and SnAgCu Solder Bumps Stephen Gee and Luu Nguyen National Semiconductor M/S 19-100 3875 Kifer Rd. Santa Clara, CA 95051 stephen.gee@n
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    DSASW00296583.pdf preview Download Datasheet

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    "Hall Effect Sensor" mttf Cu6Sn5 IPACK2005 resistor activation energy sac 405 SAC405 sensors mttf sURVEY OF Hall Effect Current Measurements WLCSP

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