Cu6Sn5
Abstract: Olin-194
Text: Whisker on Cu 06-June-03 Back Up Block 1 Whisker on Cu Whisker on Cu 06-June-03 Storage conditions • Test data showed that whiskers grow longest at room temperature Explanation: irregular intermetallic growth 1,9 µm ambient 250 1,9 µm 55 °C / ambient
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06-June-03
Cu6Sn5
Olin-194
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RESISTOR NETWORK
Abstract: CTS RESISTOR NETWORK resistor single in line resistor package c series transistor equivalent table CTS NETWORK RESISTOR transistor equivalent table testing of diode network resistor series RESISTOR NETWORK
Text: PRODUCT EVALUATION Date: January, 2008 PRODUCT EVALUATION REPORT FOR Series:770 TIN WHISKER TEST Test Report Series 770 Resistor Network Tin Whisker Report Series: 770 Figure 1. Package Style Single-In-Line resistor network testing performed per conditions as outlined in Table 1.
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x2000)
RESISTOR NETWORK
CTS RESISTOR NETWORK
resistor
single in line resistor package
c series transistor equivalent table
CTS NETWORK RESISTOR
transistor equivalent table
testing of diode
network resistor
series RESISTOR NETWORK
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resistor
Abstract: array resistor 741 series c series transistor equivalent table 741 data sheet 745 diode resistor datasheet
Text: PRODUCT EVALUATION Date: February, 2007 PRODUCT EVALUATION REPORT FOR Series:740/741/742/743/744/745/746 TIN WHISKER TEST Test Report Series 74X Chip Resistor Arrays Tin Whisker Report for Series: 740/741/742/743/744/745/746 Resistor chip array testing performed per conditions as outlined in Table 1.
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Untitled
Abstract: No abstract text available
Text: VS-HFA25TB60HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 25 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 2 whisker test • Material categorization:
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VS-HFA25TB60HN3
AEC-Q101
O-220AC
VS-HFA25TB60.
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
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PDF
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Untitled
Abstract: No abstract text available
Text: VS-HFA08TB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 8 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 2 whisker test 2 • Material categorization:
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Original
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VS-HFA08TB120HN3
AEC-Q101
O-220AC
VS-HFA08TB120HN3
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
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PDF
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Untitled
Abstract: No abstract text available
Text: VS-HFA16PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 16 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:
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VS-HFA16PB120HN3
AEC-Q101
O-247AC
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
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PDF
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Untitled
Abstract: No abstract text available
Text: VS-HFA50PA60CHN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 2 x 25 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:
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VS-HFA50PA60CHN3
AEC-Q101
O-247AC
VS-HFA50PA60CHN3
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
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PDF
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Whisker test data
Abstract: OY Series Composition
Text: Whisker Test Data OX/OY Series Carbon Composition Resistors Ambient Temp./ Humidity Test condition: • 30°C±2 • 60%RH±3 • 4000hrs Ohmite Mfg. Co. Type Plating Treatment 500 hrs. No.1 No.2 No.3 No.4 No.5 No.6 No.7 No.8 No.9 No.10 Ave. Max. Min. 1000 hrs. No.1
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4000hrs
1-866-9-OHMITE
Whisker test data
OY Series
Composition
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PDF
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Untitled
Abstract: No abstract text available
Text: VS-HFA30PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 30 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:
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Original
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VS-HFA30PB120HN3
AEC-Q101
O-247AC
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
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PDF
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VS-HFA30PB120
Abstract: No abstract text available
Text: New Product VS-HFA30PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 30 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:
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VS-HFA30PB120HN3
AEC-Q101
O-247AC
VS-HFA30PB120.
2011/65/EU
2002/95/EC.
2002/95/EC
2011/65/EU.
12-Mar-12
VS-HFA30PB120
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PDF
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Untitled
Abstract: No abstract text available
Text: New Product VS-HFA25TB60HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 25 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 2 whisker test • Material categorization:
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Original
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VS-HFA25TB60HN3
AEC-Q101
O-220AC
VS-HFA25TB60.
2011/65/EU
2002/95/EC.
2002/95/EC
2011/65/EU.
12-Mar-12
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PDF
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Untitled
Abstract: No abstract text available
Text: Whisker Test Data OX/OY Series Carbon Composition Resistors Ambient Temp./ Humidity Test condition: • 30°C±2 • 60%RH±3 • 4000hrs Type Plating Treatment 500 hrs. No.1 No.2 No.3 No.4 No.5 No.6 No.7 No.8 No.9 No.10 Ave. Max. Min. 1000 hrs. No.1 No.2
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Original
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4000hrs
1-866-9-OHMITE
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PDF
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Untitled
Abstract: No abstract text available
Text: VS-HFA30PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 30 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:
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Original
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VS-HFA30PB120HN3
AEC-Q101
O-247AC
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
|
PDF
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Untitled
Abstract: No abstract text available
Text: New Product VS-HFA30PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 30 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:
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Original
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VS-HFA30PB120HN3
AEC-Q101
O-247AC
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
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PDF
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Untitled
Abstract: No abstract text available
Text: VS-HFA30TA60CHN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 2 x 15 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:
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VS-HFA30TA60CHN3
AEC-Q101
O-220AB
VS-HFA30TA60CHN3
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
|
PDF
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Untitled
Abstract: No abstract text available
Text: VS-HFA16PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 16 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:
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Original
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VS-HFA16PB120HN3
AEC-Q101
O-247AC
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
|
PDF
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Untitled
Abstract: No abstract text available
Text: VS-HFA08TB60HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 8 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified meets JESD 201 class 2 whisker test 2 • Material categorization:
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Original
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VS-HFA08TB60HN3
AEC-Q101
O-220AC
VS-HFA08TB60.
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
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PDF
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Untitled
Abstract: No abstract text available
Text: VS-HFA06TB120HN3 www.vishay.com Vishay Semiconductors HEXFRED , Ultrafast Soft Recovery Diode, 6 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 2 whisker test 2 • Material categorization:
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VS-HFA06TB120HN3
AEC-Q101
O-220AC
VS-HFA06TB120HN3
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
|
PDF
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Untitled
Abstract: No abstract text available
Text: VS-HFA30PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 30 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:
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Original
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VS-HFA30PB120HN3
AEC-Q101
O-247AC
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
|
PDF
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smema
Abstract: smema control STR223 smema wiring electronics nasa smema specifications Phoenix contact subcon 9 connector tamura solder paste tamura tin lead solder paste Telcon
Text: TND311 Tin Whisker Info Brief" http://onsemi.com APPLICATION NOTE acceleration test with quantified acceleration factors is unknown. This is complicated further by the highly variable “incubation” period during which stress builds before whiskers grow. However, ON has completed testing using
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TND311
TND311/D
smema
smema control
STR223
smema wiring
electronics nasa
smema specifications
Phoenix contact subcon 9 connector
tamura solder paste
tamura tin lead solder paste
Telcon
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PDF
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Untitled
Abstract: No abstract text available
Text: New Product VS-HFA30TA60CHN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 2 x 15 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:
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Original
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VS-HFA30TA60CHN3
AEC-Q101
O-220AB
O-220AB
VS-HFA30TAtrademarks
2011/65/EU
2002/95/EC.
2002/95/EC
2011/65/EU.
12-Mar-12
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PDF
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Untitled
Abstract: No abstract text available
Text: VS-HFA50PA60CHN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 2 x 25 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:
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Original
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VS-HFA50PA60CHN3
AEC-Q101
O-247AC
VS-HFA50PA60CHN3
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
|
PDF
|
Untitled
Abstract: No abstract text available
Text: VS-HFA30TA60CHN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 2 x 15 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization: for definitions of
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VS-HFA30TA60CHN3
AEC-Q101
O-220AB
VS-HFA30TA60CHN3
2002/95/EC.
2002/95/EC
2011/65/EU.
JS709A
02-Oct-12
|
PDF
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sem 2005
Abstract: TA016TCM106KBR
Text: TIN WHISKER TANTALUM DATA REPORT Product: Tantalum Chip Capacitors Solder Coat Finish: 100% Matte Tin Sn over high porosity Nickel (Ni) Item: Tin Whisker Growth & Density Testing Venkel P/N: TA016TCM106KBR Date Performed: September 2007 Contents: 1. 2. 3.
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TA016TCM106KBR
sem 2005
TA016TCM106KBR
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