Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
|
Original
|
PDF
|
SN54BCT8374A,
SN74BCT8374A
SCBS045E
SN54BCT8374A
BCT374
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
|
Original
|
PDF
|
SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
|
Original
|
PDF
|
SN54BCT8374A,
SN74BCT8374A
SCBS045E
SN54BCT8374A
BCT374
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
|
Original
|
PDF
|
SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
|
Original
|
PDF
|
SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
|
Untitled
Abstract: No abstract text available
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E − MAY 1990 − REVISED JULY 1996 SN54BCT8245A . . . JT PACKAGE SN74BCT8245A . . . DW OR NT PACKAGE TOP VIEW D Members of the Texas Instruments D D D D D DIR B1 B2 B3 B4 GND
|
Original
|
PDF
|
SN54BCT8245A,
SN74BCT8245A
SCBS043E
SN54BCT8245A
BCT245
|
9.1 b2
Abstract: SN54ABT2952A SN74ABT2952A
Text: SN54ABT2952A, SN74ABT2952A OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS SCBS203A – AUGUST 1992 – REVISED JULY 1994 • • • • B8 B7 B6 B5 B4 B3 B2 B1 OEAB CLKAB CLKENAB GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13
|
Original
|
PDF
|
SN54ABT2952A,
SN74ABT2952A
SCBS203A
SN54ABT2952A
9.1 b2
SN54ABT2952A
SN74ABT2952A
|
BCT2827C
Abstract: SN54BCT2827C SN74BCT2827C SN74BCT2827CDW SN74BCT2827CDWE4 SN74BCT2827CDWR SN74BCT2827CDWRE4
Text: SN54BCT2827C, SN74BCT2827C 10-BIT BUS/MOS MEMORY DRIVERS WITH 3-STATE OUTPUTS SCBS007E – APRIL 1987 – REVISED NOVEMBER 1993 • • • • OE1 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 VCC Y1 Y2
|
Original
|
PDF
|
SN54BCT2827C,
SN74BCT2827C
10-BIT
SCBS007E
SN54BCT2827C
23plifiers
BCT2827C
SN54BCT2827C
SN74BCT2827C
SN74BCT2827CDW
SN74BCT2827CDWE4
SN74BCT2827CDWR
SN74BCT2827CDWRE4
|
P3C60
Abstract: SN54AS882A SN74AS882A AS1881
Text: SN54AS882A, SN74AS882A 32•81T LOOK·AHEAD CARRY GENERATORS 02661, DECEMBER 1982 - REVISED NOVEMBER 1985 • Directly Compatible with 'AS181B, 'AS1181, 'AS881B, and 'AS1881 ALUs • Included among the Package Options are Compact, 24-Pin, 300-mil-Wide DIPs and
|
Original
|
PDF
|
SN54AS882A,
SN74AS882A
AS181B,
AS1181,
AS881B,
AS1881
24-Pin,
300-mil-Wide
28-Pin
SN54AS882A
P3C60
SN54AS882A
SN74AS882A
|
BCT2827C
Abstract: SN54BCT2827C SN74BCT2827C SN74BCT2827CDW SN74BCT2827CDWR SN74BCT2827CNSR SN74BCT2827CNT
Text: SN54BCT2827C, SN74BCT2827C 10-BIT BUS/MOS MEMORY DRIVERS WITH 3-STATE OUTPUTS SCBS007E – APRIL 1987 – REVISED NOVEMBER 1993 • • • • OE1 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 VCC Y1 Y2
|
Original
|
PDF
|
SN54BCT2827C,
SN74BCT2827C
10-BIT
SCBS007E
SN54BCT2827C
23plifiers
BCT2827C
SN54BCT2827C
SN74BCT2827C
SN74BCT2827CDW
SN74BCT2827CDWR
SN74BCT2827CNSR
SN74BCT2827CNT
|
BCT2827C
Abstract: SN54BCT2827C SN74BCT2827C SN74BCT2827CDW SN74BCT2827CDWE4 SN74BCT2827CDWR SN74BCT2827CDWRE4
Text: SN54BCT2827C, SN74BCT2827C 10-BIT BUS/MOS MEMORY DRIVERS WITH 3-STATE OUTPUTS SCBS007E – APRIL 1987 – REVISED NOVEMBER 1993 • • • • OE1 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 VCC Y1 Y2
|
Original
|
PDF
|
SN54BCT2827C,
SN74BCT2827C
10-BIT
SCBS007E
SN54BCT2827C
23Amplifiers
BCT2827C
SN54BCT2827C
SN74BCT2827C
SN74BCT2827CDW
SN74BCT2827CDWE4
SN74BCT2827CDWR
SN74BCT2827CDWRE4
|
Untitled
Abstract: No abstract text available
Text: SN54BCT2827C, SN74BCT2827C 10-BIT BUS/MOS MEMORY DRIVERS WITH 3-STATE OUTPUTS SCBS007E – APRIL 1987 – REVISED NOVEMBER 1993 • • • • OE1 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 VCC Y1 Y2
|
Original
|
PDF
|
SN54BCT2827C,
SN74BCT2827C
10-BIT
SCBS007E
MIL-STD-883C,
300-mil
SN54BCT2827C
SN74BCT2827C
|
Untitled
Abstract: No abstract text available
Text: SN54ABT652A, SN74ABT652A OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS072F – JANUARY 1991 – REVISED MAY 1997 D D D CLKAB SAB OEAB A1 A2 A3 A4 A5 A6 A7 A8 GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 VCC CLKBA SBA OEBA B1
|
Original
|
PDF
|
SN54ABT652A,
SN74ABT652A
SCBS072F
MIL-STD-883,
JESD-17
32-mA
64-mA
SN54ABT652A
|
F240
Abstract: SN54BCT8240A SN74BCT8240A BCT8240A DB471
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS067D - FEBRUARY 1990 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products SN54BCT8240A . . . JT PACKAGE SN74BCT8240A . . . DW OR NT PACKAGE TOP VIEW
|
OCR Scan
|
PDF
|
SN54BCT8240A,
SN74BCT8240A
SCBS067D
BCT240
F240
SN54BCT8240A
BCT8240A
DB471
|
|
|
TDI14
Abstract: TI0286-D3597
Text: SN54ACT8997, SN74ACT8997 SCAN PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES Members of the Texas Instruments SCOPE Family of Testability Products PRODUCT PREVIEW T 10286— D3597, APRIL 1990 SN54ACT8997 . . . JT PACKAGE SN74ACTS997 . . . OW OR NT PACKAGE
|
OCR Scan
|
PDF
|
SN54ACT8997,
SN74ACT8997
D3597,
TIO206--03597,
TDI14
TI0286-D3597
|
d3598
Abstract: 74ACT8999 SN74ACT8999 ACT8999 SN54ACT8999
Text: SN54ACT8999, SN74ACT8999 SCAN PATH SELECTORS WITH 8-BIT BIDIRECTIONAL DATA BUSES TI0287— D3598, JUNE 1990 PRODUCT SN54ACT8999 . . . JT PACKAGE SN74ACT8999 . . . DW OR NT PACKAGE Members of the Texas Instruments SCOPE" Family of Testability Products TOP VIEW
|
OCR Scan
|
PDF
|
SN54ACT8999,
SN74ACT8999
TI0287â
D3598,
TI0287
ACT8999
d3598
74ACT8999
SN74ACT8999
ACT8999
SN54ACT8999
|
BCT8244A
Abstract: SN54BCT8244A SN74BCT8244A
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 SN 54BCT8244A . . . JT PACKAGE SN 74BCT8244A . . . DW OR NT PACKAGE TOP VIEW Members of the Texas Instruments SCOPE Family of Testability Products
|
OCR Scan
|
PDF
|
SN54BCT8244A,
SN74BCT8244A
SCBS042D
SN54/74F244
SN54/74BCT244
BCT8244A
SN54BCT8244A
|
BCT8245
Abstract: 54BCT8245 74BCT245 D35-14 74BCT8245
Text: SN54BCT8245, SN74BCT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS TI0038— D3514, MAY 1990 SN54BCT8245 . . . JT PACKAGE SN74BCT8245 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE” Family of Testability Products TOP VIEW Octal Test Integrated Circuits
|
OCR Scan
|
PDF
|
SN54BCT8245,
SN74BCT8245
TI0038â
03S14,
SNS4/74F245
SN54/74BCT245
BCT8245
54BCT8245
74BCT245
D35-14
74BCT8245
|
T10222-08373
Abstract: No abstract text available
Text: SN54BCT8373, SN74BCT8373 SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES T10222—08373 JUNE 1990 Members of Texas Instruments SCOPE Family of Testability Products SNS4BCT8373 . . . JT PACKAGE SN74BCT8373 . . . DW OR NT PACKAGE TOP VIEW Octal Test Integrated Circuits
|
OCR Scan
|
PDF
|
SN54BCT8373,
SN74BCT8373
T10222--08373
SNS4BCT8373
SN74BCT8373
SN54/74F373
SN54/74BCT373
T10222-08373
|
74BCT8245
Abstract: 74BCT245 54BCT8245 ha 11226
Text: SN54BCT8245, SN74BCT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS TI0038— D 3514, MAY 1990 SN54BCT8245 . . . JT PACKAGE SN74BCT8245 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE"1 Family of Testability Products TOP VIEW Octal Test Integrated Circuits
|
OCR Scan
|
PDF
|
SN54BCT8245,
SN74BCT8245
TI0038--
SN54/74F245
SN54/74BCT245
74BCT8245
74BCT245
54BCT8245
ha 11226
|
d837
Abstract: 74BCT373 ti0222 SN74BCT8373
Text: SN54BCT8373, SN74BCT8373 SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES TI0222— D8373 JUNE 1990 Members of Texas Instruments SCOPE Family of Testability Products SN54BCT8373 . . . JT PACKAGE SN74BCT8373 . . . DW OR NT PACKAGE TOP VIEW Octal Test Integrated Circuits
|
OCR Scan
|
PDF
|
SN54BCT8373,
SN74BCT8373
TI0222â
D8373
SN54/74F373
SN54/74BCT373
d837
74BCT373
ti0222
SN74BCT8373
|
d3413
Abstract: BCT8244 54BCT8244 SCBS042-TI0037-D3413 74BCT8244 74BCT244 SN74BCT8244 Texas Instruments bct8244
Text: SN54BCT8244, SN74BCT8244 SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042— TI0037— D3413, FEBRUARY 1990 Members of Texas Instruments SCOPE Family of Testability Products SN54BCT8244 . . . JT PACKAGE SN74BCT6244 . . . DW OR NT PACKAGE TOP VIEW Octal Test Integrated Circuits
|
OCR Scan
|
PDF
|
SN54BCT8244,
SN74BCT8244
SCBS042â
TI0037â
D3413,
SN54BCT8244
SN74BCT6244
SN54/74F244
SN54/74BCT244
d3413
BCT8244
54BCT8244
SCBS042-TI0037-D3413
74BCT8244
74BCT244
SN74BCT8244
Texas Instruments bct8244
|
74BCT8374
Abstract: D3641 TEX-E wire
Text: SN54BCT8374, SN74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— 0 3 6 4 1 , JUNE 1990 SN54BCT8374 IT PACKAGE SN74BCT8374 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE Family of Testability Products TOP VIEW
|
OCR Scan
|
PDF
|
SN54BCT8374,
SN74BCT8374
TI0223--
SN54BCT8374
SN74BCT8374
SN54/74F374
SN54/74BCT374
74BCT8374
D3641
TEX-E wire
|
SN74HC7008
Abstract: 74* multifunction nand nor D2880
Text: SN54HC7008, SN74HC7008 6-SECTION MULTIFUNCTION NANO, INVERT. NOR CIRCUITS D 2880 , M A R C H 1 9 8 5 -R E V IS E D SEPTEM BER 1987 Dependable Texas Instruments Quality and Reliability SN 74H C 7008 . . . DW OR NT PA C K AG E (T O P VIEW ) T h e S N 5 4 H C 7 0 0 8 an d S N 7 4 H C 7 0 0 8 a re e a c h
|
OCR Scan
|
PDF
|
SN54HC7008,
SN74HC7008
D2880,
300-mil
SN54HC7008
74* multifunction nand nor
D2880
|
