transistor f422
Abstract: transistor f423 f422 transistor transistor f421 BV09 F423 fet 13187 RJ4B L442 bvoe
Text: CMOS-8LCX 3-VOLT, 0.50-MICRON CMOS GATE ARRAYS CROSSCHECK TEST SUPPORT NEC Electronics Inc. Preliminary Description October 1993 Figure 1. Various CMOS-8LCX Packages NEC’s 3-volt CMOS-8LCX family consists of ultra-high performance, sub-micron gate arrays, targeted for
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50-MICRON
PD658xx
transistor f422
transistor f423
f422 transistor
transistor f421
BV09
F423
fet 13187
RJ4B
L442
bvoe
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RJ4C-26S
Abstract: RJ4B RJ4C JENNINGS spdt 270
Text: SPDT Vacuum Relays RJ 4C SPECIFICATIONS 18 kV Model Number Test Voltage kV Peak 60 Hz Rated Operating Voltage (kV Peak) DC or 60 Hz 2.5 MHz 16 MHz 32 MHz Continous Current, Carry (Amps, RMS) DC or 60 Hz 2.5 MHz 16 MHz 32 MHz Contact Capacitance (pF) Between Open Contacts
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RJ4C-26S
RJ4C-26S
RJ4B
RJ4C
JENNINGS spdt 270
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bv0T
Abstract: F423 FV06 RJ4B 83YL-9164B "Single-Port RAM" B00J transistor f423 bewf diode ru4d
Text: CMOS-8L 3-VOLT, 0.50-MICRON CMOS GATE ARRAYS NEC Electronics Inc. Preliminary Description October 1993 Figure 1. Various CMOS-8L Packages NEC’s 3-volt CMOS-8L family consists of ultra-high performance, sub-micron gate arrays, targeted for applications requiring extensive integration and high
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50-MICRON
PD658xx
bv0T
F423
FV06
RJ4B
83YL-9164B
"Single-Port RAM"
B00J
transistor f423
bewf
diode ru4d
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RJ4B
Abstract: RJ2B RJ6B-26S RJ2B-26S rj2c-26s RB1D RJ2C JENNINGS spdt 270 JENNINGS RB1D
Text: SPDT Vacuum Relays RJ 2B, 2C, 4B, 6B SPECIFICATIONS Model Number Test Voltage kV Peak 60 Hz Rated Operating Voltage (kV Peak) DC or 60 Hz 2.5 MHz 16 MHz 32 MHz Continous Current, Carry (Amps, RMS) DC or 60 Hz 2.5 MHz 16 MHz 32 MHz Contact Capacitance (pF)
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RJ2C-26S
RJ2B-26S
RJ4B-26S
RJ4B
RJ2B
RJ6B-26S
RJ2B-26S
rj2c-26s
RB1D
RJ2C
JENNINGS spdt 270
JENNINGS RB1D
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MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR
Abstract: uPD65837 uPD65869 X17512 upd65839 RF Transistors Ceramic MARKING F25 marking code F302 535 D65841 uPD65851 X46358
Text: Design Manual CMOS-8L Family CMOS Gate Array Ver. 5.0 Document No. A12158EJ5V0DM00 5th edition Date Published June 1999 N CP(K) 1997, 1998 Printed in Japan 1 [MEMO] 2 Design Manual A12158EJ5V0DM00 NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
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A12158EJ5V0DM00
Semiconductor2/9044
MARKING CODE N-CHANNEL MOS FIELD EFFECT TRANSISTOR
uPD65837
uPD65869
X17512
upd65839
RF Transistors Ceramic MARKING F25
marking code F302 535
D65841
uPD65851
X46358
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PDF
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JENNINGS RF1J
Abstract: RB7a RJ2B SFD-373 AVQ-10 L4698B JENNINGS RF1D JENNINGS Rb1h RD6B
Text: I 77340=10 14E D RICHARDSON ELECTRONICS GOOOSfll fc, Vacuum Transfer Relays iype Ooil voltage VDC typ Coll voltage (VDC RBID RB1H RB1J RB2A RB7A RB7B RD6B RF1D RF1E RF1J 26 26 26 26 26 26 26 26 26 26 RF4A RF5C RF5D RF6C RF6D RJ1H RJ2B RJ4B RJ8A 26 12 12
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SFD373A
L4698B
L4727
WSR-74C
AVQ-10
VTV075
VTV150
VTV300
VTV1250
UTV005
JENNINGS RF1J
RB7a
RJ2B
SFD-373
AVQ-10
JENNINGS
RF1D
JENNINGS Rb1h
RD6B
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transistor f422
Abstract: transistor f423 F422 transistor transistor f421 nec product naming rule BK-DK
Text: i O 1993 iir n r, . . NEC E le ctro n ics Inc. Prelim inary Description CMOS-8LCX 3-VOLT, 0.50-M ICRON CMOS GATE ARRAYS c ro s s c h e c k te s t s u p p o rt February 1993 Figure 1. Various CMOS-8LCX Packages NEC’s 3-volt CMOS-8LCX family are ultra-high perform
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OCR Scan
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iPD658xx
transistor f422
transistor f423
F422 transistor
transistor f421
nec product naming rule
BK-DK
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PDF
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bv0T
Abstract: 658X
Text: N E C ELECTRONICS INC b7E D • b4E75S5 QQ3T701 4bD HINECE CMOS-8L 3 -V O LT, 0.50-M IC R O N cm os g a te a r r a y s ä I M t L NEC Electronics Inc. P re lim in a r y Description October 1993 Figure 1. Various CMOS-8L Packages NEC’s 3-volt CMOS-8L family consists of ultra-high per
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OCR Scan
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b4E75S5
QQ3T701
nPD658xx
bv0T
658X
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D65806
Abstract: 9215K1
Text: tFEB i 7 1993 CMOS-8 5 VOLT, 0 .65-MICRON CMOS GATE ARRAYS NEC Electronics Inc. Prelim inary January 1993 Figure 1. Sample CMOS-8 Packages Description NEC’s 5-volt CMOS-8 family are ultra-high performance, sub-m icron gate arrays, targe te d fo r a pp lications
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OCR Scan
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65-MICRON
xPD65800
D65806
9215K1
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PDF
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J18M
Abstract: itt 2222 marking code F302 L-423 d 65632 "Single-Port RAM" marking L442 em 288 NEC uPD 65658 RU4D
Text: <S *W¿ NEC C M O S -6 /6 A /6 V /6 X 1 .0 -M IC R O N C M O S G A TE A R R A Y S NEC Electronics Inc. April 1992 Description Figure 1. Sample CMOS-6/6A/6V/6X Packages NEC’s CMOS-6 gate array fam ilies CMOS-6, CMOS6A, CM OS-6V and CMOS-6X are ultra-high perform
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transistor f422
Abstract: transistor f423 BKDF f422 transistor B00J f422 F423 fet 13187 RJ4B ru4f
Text: N E C ELECTRONICS INC b7E D NEC NEC Electronics Inc. I b *427525 Q D 3 ci 7 n bTD « N E C E CMOS-8LCX 3-VOLT, O.5O-MICRON CMOS GATE ARRAYS CROSSCHECK TEST SUPPORT Prelim inary Description O c to b e r 1 9 9 3 Figure 1. Various CMOS-8LCX Packages N EC 's 3-volt C M O S -8L C X family consists of ultra-high
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OCR Scan
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xPD658xx
transistor f422
transistor f423
BKDF
f422 transistor
B00J
f422
F423
fet 13187
RJ4B
ru4f
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PDF
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ru4f
Abstract: F422 F423 rj8b "Single-Port RAM" TT 2246 RU89 BE09 L737 f425
Text: *,yt * *W¿ NEC NEC Electronics Inc. C M O S -6 /6 A /6 V /6 X 1 .0 -M IC R O N C M O S G A TE A R R A Y S April 1992 Description Figure 1. Sample CMOS-6/6A/6V/6X Packages NEC’s CMOS-6 gate array fam ilies CMOS-6, CMOS6A, CMOS-6V and CMOS-6X are ultra-high perform
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OCR Scan
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IEU-7922,
IP-8090
ru4f
F422
F423
rj8b
"Single-Port RAM"
TT 2246
RU89
BE09
L737
f425
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ETP80
Abstract: aui to rj45 ECT1101 UTP20038T 2km fm transmitter ETT1101
Text: i MODEL DESCRIPTION LIST P-'ICE 5 1 Ethernet 1EEE802.3 - The Most Popular Choice for Reliable and Economical Networking In the early 1980s, Digital Equipment Corporation, Intel, and Xerox Co-developed the Ethernet Local Area Networking format. This technology was soon accepted by the IEEE Committee, creating the 802.3 standard.
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1EEE802
1980s,
RJ11/12
TDHS256FK
TDHS256MK
TDHS258FK
TDHS258MK
ETP80
aui to rj45
ECT1101
UTP20038T
2km fm transmitter
ETT1101
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PDF
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diode ru4d
Abstract: ru4f bvde RJ4B 364-pin ITT 2222 A rj8b diode ru4d compatible "RJ-49" FWB1
Text: C M O S -8 L 3 -V O L T , 0 .5 0 -M IC R O N C M O S G A TE A R R A YS NEC Electronics Inc. P r e lim in a r y Description February 1993 Figure 1. Various CMOS-8L Packages NEC’s 3-volt CMOS- 8 L family consists of ultra-high per fo rm a n c e , s u b -m ic ro n g a te a rra y s , ta rg e te d fo r
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aPD658xx
diode ru4d
ru4f
bvde
RJ4B
364-pin
ITT 2222 A
rj8b
diode ru4d compatible
"RJ-49"
FWB1
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Untitled
Abstract: No abstract text available
Text: Alle Rechte vorbehalfen/ Ml tights reserred m 2 5 6 A G e s a m t l a n g e m o n t i e r t ca. 73 complete length assembled acc. to 13 •> v \ A ll D iie n sio n s in y O rig in a l Size DIN A 4 Techn. C haracter. Dat. D e ta il. 0 1 .0 3 .1 0 hsv Insp.
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D65806
Abstract: No abstract text available
Text: W So 1393 C M O S -8 5 -V O L T , 0 .6 5 -M IC R O N CM OS GATE ARRAYS NEC NEC Electronics Inc. April 1993 Description Figure 1. Sample CMOS-8 Packages NEC’s 5-volt CMOS-8 family are ultra-high performance, s u b -m ic ro n gate a rra y s , ta rg e te d fo r a p p lic a tio n s
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65-micron
D65806
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PDF
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65630
Abstract: RK4B 83nr-7843b ru4f RJ49 RJ4B NEC uPD 65658 transistor f423 F423 L442
Text: *,yt * *W¿ NEC C M O S -6 /6 A /6 V /6 X 1 .0 -M IC R O N C M O S G A TE A R R A Y S NEC Electronics Inc. April 1992 Description Figure 1. Sample CMOS-6/6A/6V/6X Packages NEC’s CMOS-6 gate array fam ilies CMOS-6, CMOS6A, CMOS-6V and CMOS-6X are ultra-high perform
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OCR Scan
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IEU-7922,
IP-8090
65630
RK4B
83nr-7843b
ru4f
RJ49
RJ4B
NEC uPD 65658
transistor f423
F423
L442
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PDF
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RJ4-25V221MX
Abstract: No abstract text available
Text: l E L P S y _ R J 4 Miniature Aluminum Electrolytic Capacitors S eries RJ4 105 C M iniature C apacito rs • One or two sizes smaller than conventional RJ3 Series. • 105°C, 1000 hours guaranteed. O utline D raw ing P hoto Vent except 65
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OCR Scan
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L16max.
18x31
RJ4-400VR47M
RJ4-400V010M
RJ4-400V2R2M
RJ4-400V3R3M
10x12
RJ4-400V4R7M
10x16
RJ4-400V1OOM
RJ4-25V221MX
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PDF
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Untitled
Abstract: No abstract text available
Text: DESCRIPTION 1-9 10-2'! 25-99 Exclusive Modular and Coaxial Cable Testers with Remote Testing Capability This series utilizes an ABS plastic case design which incorporates an exclusive slide lock method of attaching or detaching the Master and Remote units. The testers can be used stand-alone for bench testing, or in two
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PDF
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