Untitled
Abstract: No abstract text available
Text: R R series Thermal Emission Microscope IAHEAI New High-sensitivity detector thermal detector InSb Motorized turret with objective lenses • Two objective lenses for analyzing thermal emissions • Three objective lenses for probing and laser scanning Thermal Emission Microscope
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B1201
SSMS0012E15
JUN/2015
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Untitled
Abstract: No abstract text available
Text: Thermal Emission Microscope R series Thermal Emission Microscope 5AHEAI The THEMOS series thermal emission microscope is a semiconductor failure analysis system that pinpoints failures by detecting thermal emissions generated within the semiconductor device. The increasing
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SE-164
SSMS0012E10
JAN/2013
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C9215
Abstract: No abstract text available
Text: Inverted Emission Microscope R Tester direct docking type -SD series Tester direct docking type -TD Backside prober type -TP Features Options Multi-camera platform with high-precision stage NanoLens for high-resolution and high-sensitivity observation Flexible system design
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10-lens
SE-164
SSMS0019E14
JAN/2013
C9215
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TWO COLOR DETECTOR
Abstract: ir preamplifier LIDAR detector T05 Package GDDD117 IA-010 T018 two color photodiode
Text: ELECTRO-OPTICAL SYSTEMS S7E ]> • 3n3fl70 OOOOlDb bb2 « E O S INDIUM ARSENIDE 1.0 - 3.6 MICRONS The IA-series photodetectors are state-of-the-art Indium Arsenide photodiodes sensitive between 1 n m and 3.6 jm. These detectors operate at room temperature and thermoelectrically cooled with
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OCR Scan
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HgCdTe
Abstract: cell phone detector circuit roic HgCdTe FPA cdznte focal plane array 0.8um cmos MWIR detector Hall 01E HGCDTE detector
Text: TM 5.0m m Infrared Focal Plane Array High Speed, Low Noise, Low Power 1024 x 1024 HgCdTe/CdZnTe Features • • • • • • • • • • • Uses the same ROIC as SWIR HAWAII TM High Resolution 18.5µm Pixel Pitch <3e- Read Noise with multiple reads
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0E-01
0E-02
HgCdTe
cell phone detector circuit
roic
HgCdTe FPA
cdznte
focal plane array
0.8um cmos
MWIR detector
Hall 01E
HGCDTE detector
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induction furnace circuit diagram
Abstract: INCOMING RAW MATERIAL INSPECTION REPORT FOR COLD FORGING
Text: THE ELECTROMAGNET Visible Micro Gamma Rays Wavelength Frequency, Hz: 0.1Å X-Rays U.V. Infrared EHF 10Å 100Å 0.1µ 1Å 1µ 10µ 100µ 0.1cm 1cm 3x1019 3x1018 3x1017 3x1016 3x1015 3x1014 3x1013 3x1012 3x1011 3x1 cycles per second VISIBLE SHORT WAVELENGTH
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3x1019
3x1018
3x1017
3x1016
3x1015
3x1014
3x1013
3x1012
3x1011
induction furnace circuit diagram
INCOMING RAW MATERIAL INSPECTION REPORT FOR COLD FORGING
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