P22793
Abstract: P22804
Text: RELIABILITY MONITOR DS1225AB-200 NOV '98 MONITOR-DALLAS DEVICE REVISION DATE CODE LOT NUMBER PACKAGE ASSEMBLY SITE DS1225A A1 9826 101045 28 PIN MODULE DALLAS JOB_NO DESCRIPTION CONDITION P22787 SOLDERABILITY MIL-STD-883-2003 TOTAL: 3 1 WEEK P22788 PHYSICAL DIMENSIONS MIL-STD-883-2016
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DS1225AB-200
DS1225A
P22787
P22788
P22789
P22848
MIL-STD-883-2003
MIL-STD-883-2016
P22849
P22793
P22804
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lot code
Abstract: DS1225 date code
Text: RELIABILITY MONITOR DS1225AB-200 MAY '98 MONITOR-DALLAS DEVICE REVISION DATE CODE LOT NUMBER PACKAGE ASSEMBLY SITE DS1225 S 9806 100539 28 PIN MODULE DALLAS JOB_NO DESCRIPTION P22069 P22070 CONDITION SOLDERABILITY MIL-STD-883-2003 TOTAL: PHYSICAL DIMENSIONS MIL-STD-883-2016
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DS1225AB-200
DS1225
P22069
P22070
P22071
P22140
MIL-STD-883-2003
MIL-STD-883-2016
P22141
lot code
DS1225 date code
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P22220
Abstract: MIL-STD-883-2016 p22793 ds1230Y date code P-225-1 P22789 P22070
Text: RELIABILITY MONITOR DS1225AB-200 MAY '98 MONITOR-DALLAS DEVICE REVISION DATE CODE LOT NUMBER PACKAGE ASSEMBLY SITE DS1225 S 9806 100539 28 PIN MODULE DALLAS JOB_NO DESCRIPTION CONDITION P22069 SOLDERABILITY MIL-STD-883-2003 TOTAL: 3 1 WEEK P22070 PHYSICAL DIMENSIONS MIL-STD-883-2016
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DS1225AB-200
DS1225
P22069
P22070
P22071
P22140
MIL-STD-883-2003
MIL-STD-883-2016
P22141
P22220
p22793
ds1230Y date code
P-225-1
P22789
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107D
Abstract: No abstract text available
Text: CHIP LED LAMPS GENERAL INFORMATION QUALITY CONTROL AND ASSURANCE Classification Endurance Test Environmental Test Test Item Reference Standard Test Conditions Operation Life MIL-STD-750 : 1026 MIL-STD-883 : 1005 JIS C 7021 : B-1 High Temperature High Humidity
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MIL-STD-202
MIL-STD-883
JIS-C-7021
MIL-STD-750
107D
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107D
Abstract: HX2040
Text: CHIP LED LAMPS GENERAL INFORMATION QUALITY CONTROL AND ASSURANCE Classification Endurance Test Environmental Test Test Item Reference Standard Test Conditions Result Operation Life MIL-STD-750 : 1026 MIL-STD-883 : 1005 JIS C 7021 : B-1 Connect with a power If = 20mA
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MIL-STD-202
240hrs
MIL-STD-883
000hrs
JIS-C-7021
MIL-STD-750
60min
107D
HX2040
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QL3012
Abstract: QL3025 QL3040 QL3060 QL4016 QL4090 footprint pqfp 208 QuickLogic Military FPGA Introduction
Text: QuickLogic Military FPGA Introduction Military FPGA Combining High Performance and High Density Military FPGA Introduction DEVICE HIGHLIGHTS Device Highlights Military FPGA • Mil Std 883 and Mil Temp Ceramic ■ Mil Temp Plastic Guaranteed -55 to +125oC
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125oC
152-bit
16-bit
-55oC,
QL3012
QL3025
QL3040
QL3060
QL4016
QL4090
footprint pqfp 208
QuickLogic Military FPGA Introduction
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Option Information
Abstract: No abstract text available
Text: Work-In-Progress Option Information www.vishay.com Vishay Siliconix MIL-PRF-38535 Class Level B Process Flow MIL-STD-883/M5004 INTERNAL VISUAL METHOD 2010 CONDITION B TEMP CYCLE METHOD 1010 CONDITION C CONSTANT ACCELERATION METHOD 2001 CONDITION E PRE-BURNIN ELECTRICAL
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MIL-PRF-38535
MIL-STD-883/M5004)
HETD-883/M5004)
28-Apr-15
Option Information
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690b
Abstract: No abstract text available
Text: Miniature Panel Mount Optical Encoder Reliability Data HRPG Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest revision of MIL- STD-883.
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STD-883.
MIL-STD-883C
5965-3479E
5966-2489E
690b
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Untitled
Abstract: No abstract text available
Text: Subminiature Lamps Reliability Data Description The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest revision of MIL- STD-883. Hewlett-Packard tests parts at the
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STD-883.
MIL-STD-883C
5091-8536E,
5962-9790E
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Untitled
Abstract: No abstract text available
Text: Surface Mount Chip LEDs Reliability Data HSMX-C650, C670 HSMF-C655 Description revisions of MIL- STD-883. The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest
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HSMX-C650,
HSMF-C655
STD-883.
5966-1856E
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MTTF
Abstract: MTTF test data ina series
Text: Silicon Bipolar Monolithic Amplifier Reliability Data INA Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the
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MIL-STD-883.
To-883
DOD-HDBK-1686
MIL-STD-202,
MTTF
MTTF test data
ina series
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MIL-STD-883, Method 1010
Abstract: No abstract text available
Text: Surface Mount Flip Chip LEDs Reliability Data Description The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest revisions of MIL- STD-883. HSMX-H630, -H670, -H690,
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HSMX-H630,
-H670,
-H690,
-R661
STD-883.
AlIn20
MIL-STD-883
5966-1354E
MIL-STD-883, Method 1010
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MTTF
Abstract: No abstract text available
Text: Silicon Bipolar Variable Gain Amplifiers Reliability Data IVA Series Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the
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MIL-STD-883.
DOD-HDBK-1686
MIL-STD-202,
MTTF
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MIL-STD-883, Method 1010
Abstract: No abstract text available
Text: High Performance Surface Mount Chip LEDs Reliability Data HSMX-S660, S670, S690 Description revisions of MIL- STD-883. The following cumulative test results have been obtained from testing performed at HewlettPackard Optoelectronics Division in accordance with the latest
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HSMX-S660,
STD-883.
MIL-STD-883
5966-1855E
MIL-STD-883, Method 1010
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ATF-13XXX
Abstract: failure test data
Text: Low Noise Gallium Arsenide FET Reliability Data ATF-10XXX ATF-13XXX Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the
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ATF-10XXX
ATF-13XXX
MIL-STD-883.
10-9/hr)
MIL-STD-883
ATF-13XXX
failure test data
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IAM-8XXXX
Abstract: MTTF
Text: Silicon Bipolar Active Mixer Reliability Data IAM-8XXXX Description The following cumulative test results have been obtained from testing performed at HewlettPackard in accordance with the latest revision of MIL-STD-883. Data was gathered from the product qualification, reliability
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MIL-STD-883.
DOD-HDBK-1686
MIL-STD-202,
IAM-8XXXX
MTTF
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JESD22 A108-B
Abstract: No abstract text available
Text: Agilent HDSM-425G 0.4" Dual Digit Green Surface Mount Seven Segment Display Reliability Data Sheet Description The following cumulative test results have been obtained from testing performed at Agilent Technologies in accordance with the latest revision of MIL-STD-883.
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HDSM-425G
MIL-STD-883.
pac000
5988-8922EN
JESD22 A108-B
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Untitled
Abstract: No abstract text available
Text: P\-oS-o\ a company built on proven reliability MICROWAVE Chip Capacitors Bond Strength — exceeds Mil Std-883, Method 2011 Sheer Strength — exceeds Mil Std-883, Method 2019 Metalization — Gold, Mil-G-45204 Type III Grade A Quality Control System approved to Mil-l-45208
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Std-883,
Mil-G-45204
Mil-l-45208
Mil-C-49464
Mil-Std-883,
2302bb7
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C5586
Abstract: Capacitor ceramic c70 C-30 N1500 N2200 P180 c5587 2302B c50710 c557
Text: f\-0S -0\ a company built on proven reliability MICROWAVE Chip Capacitors Bond Strength — exceeds Mil Std-883, Method 2011 Sheer Strength — exceeds Mil Std-883, Method 2019 Metalization — Gold, Mil-G-45204 Type III Grade A Quality Control System approved to Mil-l-45208
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Std-883,
Mil-G-45204
Mil-l-45208
Mil-C-49464
Mil-Std-883,
2302bb7
D00DD54
C5586
Capacitor ceramic c70
C-30
N1500
N2200
P180
c5587
2302B
c50710
c557
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Untitled
Abstract: No abstract text available
Text: General Information M ilitary Screening Procedures D. HI-REL SCREENING Unitrode offers devices screened to MIL-STD-883, customer requirements, and will perform tests as specified by MIL-M-38510. When ordering MIL-STD-883 Screening, specify: • Prime electrical and military temperature range, generic part number and package type
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MIL-STD-883,
MIL-M-38510.
MIL-STD-883
UC1524J/883B
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MIL-STD-883 Method 2019
Abstract: No abstract text available
Text: Quality Standards and Military Screening Amplifonix is qualified to support both MIL-STD-883 * screening as well as parts that conform to MIL-PRF-38534 Class H. All screening is performed on site, including Groups A, B, C and D. Environmental Screening Test
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MIL-STD-883
MIL-PRF-38534
1x10-7
MIL-STD-202
MIL-STD-883
IL-STD-1772
MIL-STD-883 Method 2019
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Untitled
Abstract: No abstract text available
Text: Military and Aerospace ICs _ Screening and Conformance Testing Lot Screening Tests /3A Screening Level is Compliant to MIL-STD-883, Para. 1.2.1 Total Lot Screening X = 100% Testing Screening Tests Conditions Assembly Precap Visual
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MIL-STD-883,
MIL-STD-883
IL-STD-883
MIL-STD-883.
54AC/ACT
MIL-STO-883C)
CD54ACT00F/3A
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Untitled
Abstract: No abstract text available
Text: C5 The C5 resistor chips on ceramic are designed for higher power applications and user trimmability. These chips are manufactured using state-of-the-art thin-film techniques, are 100% electrically tested and visually inspected to MIL-STD-883. Small single chip size 100 x 100 mil
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MIL-STD-883.
MIL-STD-202,
10ult
MIL-STD-883
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CD4017 smd
Abstract: Ic cd4060 pin configuration 7012 smd ic CD4541 equivalent CD4010 circuit pin configuration cd4541 application CD4050AFB CD4017 equivalent CD4013BFB 4018A
Text: CMOS Logic ICs - CD4000B Series Features Compliance to MIL-STD-883 The Harris High-Reliability C D 400 0B S er es of high-voltage Harris C D 4 0 0 0 Series parts are in full compliance with Para graph 1.2.1 of M IL-S TD -883. Product is provided to m eet the
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CD4000B
MIL-STD-883
CD4000B-JAN
CD4000A-JAN
CD4000A
CD4017 smd
Ic cd4060 pin configuration
7012 smd ic
CD4541 equivalent
CD4010 circuit pin configuration
cd4541 application
CD4050AFB
CD4017 equivalent
CD4013BFB
4018A
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