METASTABILITY Search Results

METASTABILITY Datasheets (1)

Part	ECAD Model	Manufacturer	Description	Curated	Datasheet Type	PDF
Metastability		Altera	Metastability in Altera Devices Application Note 42		Original	PDF

METASTABILITY Datasheets Context Search

Catalog Datasheet	MFG & Type	PDF	Document Tags
xilinx MTBF Abstract: XC9500 XC4000 XC4000E XC5200 XC3042-70 XC4005E test board Text: Metastability Recovery in Xilinx FPGAs Whenever a clocked flip-flop syn- Figure: Mean Time Between Failure for various IOB and CLB flip-flop outputs when synchronizing a 1 MHz asynchronous input with a 10 MHz clock. 30 chronizes an asynchronous input, there is	Original	PDF	XC4005E-3 XC4005-6 XC3142A-09 XC3042-70 XC5200-5 xilinx MTBF XC9500 XC4000 XC4000E XC5200 XC4005E test board
11403A Abstract: GAL16V8 80lj gal k2 GAL22V10B use circuit TI GAL22V10 10MHZ 16R8 GAL22V10 MMI PAL HANDBOOK Text: ispLSI /GAL® Metastability Report state in time t than in time(t-n). In fact, the failure probability distribution follows an exponential curve. Figure 2 shows a typical failure frequency plot. Introduction The dictionary definition of metastability is “a situation	Original	PDF	L16R8-7 PAL16R8-7 TIBPAL16R6-7 TIBPAL16R6-7 SN74AS74 SN74AS74 GAL16V8B-7 PAL16R8-7 11403A GAL16V8 80lj gal k2 GAL22V10B use circuit TI GAL22V10 10MHZ 16R8 GAL22V10 MMI PAL HANDBOOK
altera MTBF Abstract: Metastability in Altera Devices MET D 103 10KFLEX MTBF ZU 107 EPF8452A Text: 1998年 1 月 ver.3 イントロダクション AN 42: Metastability in Altera Devices アルテラ・デバイスのメタスタビリティ Application Note 42 エッジ・トリガ・タイプのフリップフロップはHighとLowの確定した出	Original	PDF	10KFLEX 6000MAX® 9000MAX -AN-042-03/J altera MTBF Metastability in Altera Devices MET D 103 MTBF ZU 107 EPF8452A
CY7C53150 Abstract: CY7C53120E2 CY7C53120E4 Text: Cypress Neuron Sleep Mode Metastability Description Introduction The purpose of this application note is to describe the sleep metastability issue found in the Cypress CY7C53120E2, CY7C53120E4 and CY7C53150 Neuron® Chips. This document provides a description of the Neuron Sleep Mode Metastability issue, the implications of this event, and finally a recommended workaround.	Original	PDF	CY7C53120E2, CY7C53120E4 CY7C53150 CY7C53120E2
AN217 Abstract: 103E2 74F786 03624E-2 63e2 Text: Philips Semiconductors Application note Metastability tests for the 74F786 – 4-input asynchronous bus arbiter AN217 Authors: Charles Dike and Naseer Siddique in this study should be considered a measurement at the edge of the typical range for 74F786 parts.	Original	PDF	74F786 AN217 74F786 10E6hz) 260E2 AN217 103E2 03624E-2 63e2
GAL22V10B use circuit Abstract: PLSI1016-80LJ 10MHZ 16R8 GAL16V8 GAL22V10 plsi101680LJ MMI PAL HANDBOOK Text: Metastability Report state in time t than in time(t-n). In fact, the failure probability distribution follows an exponential curve. Figure 2 shows a typical failure frequency plot. Introduction The dictionary definition of metastability is “a situation	Original	PDF
Metastability in Altera Devices Abstract: No abstract text available Text: Metastability June 1996, ver. 2 Introduction in Altera Devices Application Note 42 The output of an edge-triggered flipflop has two valid states: high and low. To ensure reliable operation, designs must meet the flipflop’s timing requirements. The input to the flipflop must be stable for a minimum time	Original	PDF
transistor comparison data sheet Abstract: 106 20k AN-74 BYTEBLASTER AN-116 virtex 5 data sheet 106 20k 116 data sheet power diode serial vs parallel communication Soldering guidelines Text: APEX 20K Contents March 2000 Application Notes AN 42 Metastability in Altera Devices AN 74 Evaluating Power for Altera Devices AN 80 Selecting Sockets for Altera Devices AN 81 Reflow Soldering Guidelines for Surface-Mount Devices AN 100 In-System Programmability Guidelines	Original	PDF
Altera Programming Hardware Abstract: power diodes catalogs ALTERA altera jtag BYTEBLASTER free download transistor data sheet Text: MAX 9000 Contents March 2000 Application Notes AN 39 IEEE 1149.1 JTAG Boundary-Scan Testing in Altera Devices AN 41 PCI Bus Applications in Altera Devices AN 42 Metastability in Altera Devices AN 43 Designing with MAX 9000 Devices AN 74 Evaluating Power for Altera Devices	Original	PDF
ALTERA MAX 3000 Abstract: BITBLASTER ieee 1149 power selector guide testing of diode ALTERA altera jtag AN-74 BYTEBLASTER JTAG Text: MAX 3000 Contents March 2000 Application Notes AN 39 IEEE 1149.1 JTAG Boundary-Scan Testing in Altera Devices AN 42 Metastability in Altera Devices AN 74 Evaluating Power for Altera Devices AN 80 Selecting Sockets for Altera Devices AN 81 Reflow Soldering Guidelines for Surface-Mount Devices	Original	PDF
BYTEBLASTER Abstract: Altera Programming Hardware Soldering guidelines Text: FLEX 6000 Contents March 2000 Application Notes AN 41 PCI Bus Applications in Altera Devices AN 42 Metastability in Altera Devices AN 51 Using Programmable Logic for Gate Array Designs AN 71 Guidelines for Handling J-Lead & QFP Devices AN 73 Implementing FIR Filters in FLEX Devices	Original	PDF
10MHZ Abstract: 16R8 GAL16V8 GAL22V10 signal path designer using use gal16v8 Text: Metastability Report state in time t than in time(t-n). In fact, the failure probability distribution follows an exponential curve. Figure 2 shows a typical failure frequency plot. Introduction The dictionary definition of metastability is “a situation	Original	PDF	PAL16R8-7 PAL16R8-7 TIBPAL16R6-7 TIBPAL16R6-7 SN74AS74 SN74AS74 GAL16V8B-7 10MHZ 16R8 GAL16V8 GAL22V10 signal path designer using use gal16v8
103e2 Abstract: AN217 03624E-2 74F786 Text: INTEGRATED CIRCUITS AN217 Metastability tests for the 74F786 – a 4-input asynchronous bus arbiter 1988 Jul 18 Philips Semiconductors Philips Semiconductors Application note Metastability tests for the 74F786 – 4-input asynchronous bus arbiter AN217 Authors: Charles Dike and Naseer Siddique	Original	PDF	AN217 74F786 74F786 103e2 AN217 03624E-2
MTBF calculation Abstract: synchronizer mtbf Chapter 3 Synchronization QII51018-10 Text: 7. Managing Metastability with the Quartus II Software QII51018-10.0.0 This chapter describes the industry-leading analysis, reporting, and optimization features that can help you manage metastability in Altera devices. You can use the Quartus® II software to analyze the average mean time between failures MTBF due	Original	PDF	QII51018-10 MTBF calculation synchronizer mtbf Chapter 3 Synchronization

SN74F08 Abstract: SN74F74 Text: FIFO Memories: Solution to Reduce FIFO Metastability First-In, First-Out Technology Tom Jackson Advanced System Logic – Semiconductor Group SCAA011A 1 IMPORTANT NOTICE Texas Instruments TI reserves the right to make changes to its products or to discontinue any semiconductor	Original	PDF	SCAA011A SN74F08 SN74F74
flip-flop Abstract: METASTABILITY Signal Path Designer AN8060 Text: Metastability in MACH Devices December 2000 Application Note Introduction A significant number of digital systems must deal with inputs not synchronized to their own internal clocks. These asynchronous signals can arise from any of the various asynchronous protocols which are often used in bus	Original	PDF	1-800-LATTICE flip-flop METASTABILITY Signal Path Designer AN8060
AN8060 Abstract: flip-flop Signal Path Designer Text: Metastability in MACH Devices February 2002 Application Note AN8060 Introduction A significant number of digital systems must deal with inputs not synchronized to their own internal clocks. These asynchronous signals can arise from any of the various asynchronous protocols which are often used in bus	Original	PDF	AN8060 1-800-LATTICE AN8060 flip-flop Signal Path Designer
CoolRunner Abstract: xilinx MTBF Xilinx counter XAPP302 XCR3032 theXCR3032 0/Xilinx XCR3032 Text: This product has been discontinued. Please see www.xilinx.com/partinfo/notify/pdn0007.htm for details. Application Note: CoolRunner CPLDs R XAPP302 v1.2 October 9, 2000 Introduction Metastability Characteristics for CoolRunner CPLDs When using a latch or flip-flop in normal circumstances (i.e., when the devices setup and hold	Original	PDF	com/partinfo/notify/pdn0007 XAPP302 theXCR3032. CoolRunner xilinx MTBF Xilinx counter XAPP302 XCR3032 theXCR3032 0/Xilinx XCR3032
flip-flop Abstract: SIGNAL PATH designer Text: Metastability INTRODUCTION A significant number of digital systems must deal with inputs not synchronized to their own internal clocks. These asynchronous signals can arise from any of the various asynchronous protocols which are often used in bus designs; they can be the result of trying to share signals	Original	PDF
RTSX32 Abstract: RT54SX72S AC308 A42MX16 A54SX32A A54SX72A MX16 RTSX72-S Signal Path Designer Text: Application Note AC308 Metastability Characterization Report for Actel Antifuse FPGAs Introduction Whenever asynchronous data is registered by a clocked flip-flop, there is a probability of setup or hold time violation on that flip-flop. In applications such as synchronization or data recovery, due to the	Original	PDF	AC308 RTSX32 RT54SX72S AC308 A42MX16 A54SX32A A54SX72A MX16 RTSX72-S Signal Path Designer
RTSX32 Abstract: oscilloscope MTBF Text: Application Note Metastability Characterization Report I n tro du ct i on The setup and hold times of a register may deviate from ideal register behavior in actual applications as a result of finite circuit delays. A synchronization failure may occur if the data and clock do not satisfy the setup- and hold-time	Original	PDF	RTSX32 1240XL RTSX32 oscilloscope MTBF
F5072 Abstract: 74f50729 74F5074 74F74 Text: Philips Components-Signetics Minimize metastability in 50MHz state machines Programmable Logic Devices By Bob Kelly, Senior Field Applications Engineer, Philips Components-Signetics Engineers are excited to discover the PLUS405-55, a PLD state machine 1C rated for a maximum operating	OCR Scan	PDF	50MHz PLUS405-55, 55MHz. PLUS405, 74F5074 74F50728 AN219, December1983, F5072 74f50729 74F74
signetics hand book Abstract: No abstract text available Text: Signetics AN219 A Metastability Primer Application Not» Standard Products Author: Charles Dike INTRODUCTION When using a latch or flip-flop in normal circumstances i.e. when the device’s setup and hold times are not being vio lated the outputs will respond to a latch	OCR Scan	PDF	AN219 signetics hand book
EPX780 Abstract: epx740 altera epx740 Text: Metastability in Altera Devices March 1995, ver. 1 Introduction Application Note 42 The output of an edge-triggered flipflop has two valid states: high and low. To guarantee reliable operation, designs m ust m eet the flipflop's timing requirem ents. The input to the flipflop must be stable for a	OCR Scan	PDF

METASTABILITY Search Results

METASTABILITY Datasheets (1)

METASTABILITY Datasheets Context Search

xilinx MTBF

11403A

altera MTBF

CY7C53150

AN217

GAL22V10B use circuit

Metastability in Altera Devices

transistor comparison data sheet

Altera Programming Hardware

ALTERA MAX 3000

BYTEBLASTER

10MHZ

103e2

MTBF calculation

SN74F08

flip-flop

AN8060

CoolRunner

flip-flop

RTSX32

RTSX32

F5072

signetics hand book

EPX780