9952 H Search Results

dallas date code FOR DS1230Y

Abstract: dallas 25010
Contextual Info: RELIABILITY MONITOR DS1230AB-200 JAN '00 Monitor DEVICE REVISION DATE CODE LOT NUMBER PINS PACKAGE WIDTH ASSEMBLY SITE DS1230A B1 Module w/SMT 720 Fastech 9952 114146 28 QUANTITY READPOINT UNITS NO OF FAILS JOB_NO DESCRIPTION CONDITION 25005 SOLDERABILITY

Contextual Info: Detailed Specifications & Technical Data METRIC MEASUREMENT VERSION 9952 Multi-Conductor - 2 Conductors Cabled-Communication and Instrumentation Cable For more Information please call 1-800-Belden1 Description: 16 AWG stranded 19x29 tinned copper conductors, conductors cabled, nylon skin over insulation, PVC

CCTV SCHEMATIC camera board

Abstract: iris DRIVER CCTV PHILIPS DSP ccd board Circuit Schematic Diagram Electronic SCHEMATIC camera on board DC iris schematic TDA8787A AN97037 ccd camera circuit diagram AN9703
Contextual Info: APPLICATION NOTE TDA9964/52 IMAGING FRONT END BOARD CAMERA CAMDEMO 9952/9964 AN00011 Philips Semiconductors Application Note AN00011 TDA9964/52 Imaging Front End Board for Camera Summary This application note describes an Interface Font End Board formed from a TDA9964/52

LTC1564

Abstract: R420
Contextual Info: RELIABILITY DATA LTC1564 / 1565 / 1566 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP SSOP/TSSOP 154 9952 143 0114 297 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP SSOP/TSSOP

9952

Abstract: R420
Contextual Info: RELIABILITY DATA LTC1565 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SOIC/SOT/MSOP 77 9952 77 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE SOIC/SOT/MSOP 150 150 • TEMP CYCLE FROM -65°C to +150°C

LT1716

Abstract: LT1880 R423
Contextual Info: RELIABILITY DATA LT1490A/91A / LT1678/79 / LT1716 / LT1880 LT1990/91/96 LT6010/11/12/13/14 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE PLASTIC DIP SOIC/SOT/MSOP QFN/DFN 308 9952 1,313 9950 154 0318 1,775 • PRESSURE COOKER TEST AT 15 PSIG, +121°C

Contextual Info: SMA C O N N E C T O R S S M A J A C K FEMALE SO C KET CO N TACT EMI W ITH W ITH W ITH W IT H O U T W IT H O U T W IT H O U T W IT H O U T SM A SM A SMA J A C K J A C K JACK ACCEPTS PIN DIA. GASKET (FEMALE SO C KET CO N TACT) MAX. FREQ. GHz .016/.011 .013/.011X.060 MAX. LG.

Contextual Info: 6 TH IS DRAWING IS U N P U B L IS H E D . COPYRIGHT BY TYCO RELEASED ELECTRONICS CORPORATION. A LL FOR 5 4 2 3 PUBLIC ATIO N RIG HTS R E S ER V ED . R E V IS IO N S 00 EH P LTR D E S C R IP T IO N DATE DWN APVD D ECO —0 6 —0 2 1 8 5 1 14SEP06 JM c c

dallas date code ds1230

Abstract: dallas date code dallas ds1230 code 25807
Contextual Info: RELIABILITY MONITOR STRESS: VAPOR PHASE REFLOW CONDITIONS: 217C MONITOR DATE ASSEMBLY DATE PRODUCT REV JOB NO CODE FACILITY LOT NO. DS5002 C4 PACKAGE READ POINT QTY FAIL APR '00 25428 0004 Carsem DM925587AAF MQFP 3 203 DS87C520 A14 NOV '99 24798 9931 ATK Anam, K

9917

Abstract: 9952
Contextual Info: 09/16/2004 RELIABILITY REPORT FOR DS1244, 28 Pin Module w/SMT Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292

Contextual Info: Pin shroud III Number of contacts 96, 48 I Pin shrouds for types C, 2C, R, 2R Identification Pin shrouds for female connectors type C, R I Pin shrouds for female connectors type 2C, 2R II II Termination pcb-thick- Dimension a length ± 0.3 ness ± 0.4

DS13D14

Abstract: MIL-STD-883-2016
Contextual Info: 09/16/2004 RELIABILITY REPORT FOR DS1245W, 32 Pin Module w/SMT Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292

MIL-STD-883-2016

Abstract: 9933 c MIL-STD-883-2003 1 wire dallas semiconductor
Contextual Info: 09/16/2004 RELIABILITY REPORT FOR DS1230W, 28 Pin Module w/SMT Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292

ds13d12

Abstract: 9933 c
Contextual Info: 09/16/2004 RELIABILITY REPORT FOR DS1230AB, 28 Pin Module w/SMT Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292

W49C65

Abstract: CY62256-SNC CY7C6300 CY7C4385 Hyundai 9944 PALC22V10B-15PC MR001230 9918
Contextual Info: CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 1, 2000 PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION Ed Russell Reliability Director CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 1, 2000

dallas date code ds1230

Abstract: 25091 e8 sot223 24446
Contextual Info: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: 85 C, 7.0 VOLTS MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. DS1621 A7 JUN '99 24325 9915 ATP Anam, PI DK815282AAB SOIC 50 47 DS1869 A3 SEP '99 24445 9907 NSEB DJ824247ABA SOIC

9952

Abstract: 9613 9414 LT1312 LT1313 R364
Contextual Info: RELIABILITY DATA LT1312 / LT1313 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SIDEBRAZE 77 9613 77 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP SOIC/SOT/MSOP 50 504 554 • TEMP CYCLE FROM -65°C to +150°C

9952

Contextual Info: Data downloaded from http://www.angliac.com - the website of Anglia - tel: 01945 474747 DIN 41 612 • Coding systems types H and MH Identification Part No. Coding system with contact loss Code pin Type MH 09 04 000 9908 Drawing Dimensions in mm To avoid accidental and incorrect mating of adjacent connectors a coding

LQFP48

Abstract: 9952 OQ2541 bicmos LQFP-32 CGY2110 pecl clock so8 SO16 package OQ2545 TZA3001
Contextual Info: Philips Semiconductors Fiber optic interface ICs selection guide FIBER OPTIC INTERFACE ICs 155 Mb/s up to 10 GB/s LASER DRIVER MUX LASER TZA3031 TZA3001 TZA3041 OQ2545 CGY2111 OQ2535 DATA PROCESSING DEMUX DCR LIM AMP OQ2536 TZA3004 OQ2541 TZA3034 TZA3024 TZA3044

Contextual Info: THIS DRAWING IS C O P Y R IG H T U N P U B L IS H E D . RELEASED 19 BY AMP INCORPO RA TE D. FOR ALL PUBLICATION RIGHTS , 19 LOC RE SE R VE D . c REVISIONS DI ST 53 L TR DESCRIPTION RELEASED PER PR CM 99-52 DATE DWN 2 4 - AUG-99 KW APVD Js D D m 1. HOUSI NG HAS A UU E U E G T R I G A U

Contextual Info: RELIABILITY MONITOR PROCESS: STRESS: 0.6 µm Double Poly, Single Metal Ti/TiN layers used on all Metals INFANT LIFE MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY READ POINT QTY FAILS LOT NO. PACKAGE DS2502 C3 MAR '00 25253 0005 Carsem S DM941226AA

Contextual Info: W ^ Special situations are served will with the clamps and clips shown here. Other styles or sizes may be obtained in quantity from factory. ► Standard flat cable clamps are made of black self­ extinguishing PVC. ► Routing cable clamps are made of Noryl Type C, and

9418 transistor TO-92

Abstract: 9852 9944 R086 LT1020 LT1120 LT1121 LT1129 OLDEST
Contextual Info: RELIABILITY DATA LT1020 / LT1120 / LT1121 / LT1129 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP PLASTIC DIP SOIC/SOT/MSOP SSOP/TSSOP TO-92 540 8601 1,038 8601 386 9201 162 9901 199 9325 2,325 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH

DS1233 a5

Abstract: e8 sot223 9915 dallas 25010 DN819 densit DS1232L ds1232l datasheet DS1869 DK815282AAB
Contextual Info: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: 85 C, 7.0 VOLTS MONITOR DATE ASSEMBLY DATE PRODUCT REV JOB NO CODE FACILITY LOT NO. DS1621 A7 JUN '99 24325 9915 ATP Anam, PI DK815282AAB SOIC 50 45 DS1621 A7 SEP '99 24466 9930 ATP (Anam, PI) DK906731AAC SOIC