2a92
Abstract: 27C010A 6E9621 6B9637 3A9315 3E0317 5A9516 5C9550 1B9126 2D1150-9
Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
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AT-27C010
AT-27C010
E901-14056
2D1147-12
2a92
27C010A
6E9621
6B9637
3A9315
3E0317
5A9516
5C9550
1B9126
2D1150-9
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5A9516
Abstract: 5H9606 5H9605 7H9744 2A9212 5A9524 7H9747 9d9018 5c112 1B9126
Text: PAGE 1 OF 20 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C010 CMOS EPROM RELIABILITY DATA -125°C OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -HIGH TEMPERATURE REVERSE BIAS (HTRB) -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
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AT-27C010
AT-27C010
E901-14056
2D1147-12
5A9516
5H9606
5H9605
7H9744
2A9212
5A9524
7H9747
9d9018
5c112
1B9126
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TSOP 173 g
Abstract: 5H9602 6c9648 3b1326 5G9551 MIL-M-38535 6F9627 4c19 3C1660 atmel 906
Text: PAGE 1 OF 21 ATMEL COPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-27C040 CMOS EPROM RELIABILITY DATA* -125°C DYNAMIC OPERATING LIFE TEST -200°C RETENTION BAKE -PROGRAM AND ERASE -125°C OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC) -15 PSIG PRESSURE POT
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AT-27C040
MIL-M-38535
AT-27C1024
AT-27C512R
AT-27C010
AT-27C040
12C/TSOP/SOIC/PDIP
6D9702
8B9832
TSOP 173 g
5H9602
6c9648
3b1326
5G9551
6F9627
4c19
3C1660
atmel 906
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29C256
Abstract: 29C257 report on PLCC tsop 6 MIL-M-38535 3A0081
Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT
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AT-29C256
MIL-M-38535
AT-29C257
AT-29C256
2D9303
3A9313
3A9318
3B9324
29C256
29C257
report on PLCC
tsop 6
3A0081
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EEPROM 28C256
Abstract: 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638
Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C256 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -CYCLE TEST -200°C RETENTION BAKE -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)
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AT-28C256
MIL-M38535
AT-28C010
AT-28C040
AT-28C256
1C0302
3E0319
3E0323
3G0338
EEPROM 28C256
7b9729
1C0302
28C040
28C256
82307
28C256 atmel
4b23
6D9708
6C9638
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29C256
Abstract: 29C257 PLCC 64
Text: PAGE 1 OF 8 ATMEL CORPORATION Tel: 408 441-0311 Fax: (408) 436-4200 AT-29C256 PEROM RELIABILITY DATA - 125°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C DYNAMIC LIFE TEST (PLASTIC) - 125°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT
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AT-29C256
MILM-38535
AT-29C257
AT-29C256
2D9303
3A9313
3A9318
3B9324
29C256
29C257
PLCC 64
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