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    tsop 338

    Abstract: 28c010 28C010 Atmel 4C016 4b23 4h5229 4A05 MIL-M-38535 2D93 6F9630
    Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C010 CMOS EEPROM RELIABILITY DATA* - 150°C DYNAMIC OPERATING LIFE TEST - CYCLE TEST - 200°C RETENTION BAKE - 125°C OPERATING LIFE TEST (PLASTIC) - 150°C RETENTION BAKE (PLASTIC) - 15 PSIG PRESSURE POT


    Original     		PDF AT-28C010 MIL-M-38535 AT-28C256 AT-28C040 AT-28C010 7G9822 6H9708 9G9937 9G9939 tsop 338 28c010 28C010 Atmel 4C016 4b23 4h5229 4A05 2D93 6F9630

    EEPROM 28C256

    Abstract: 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638
    Text: PAGE 1 OF 10 ATMEL CORPORATION Tel: 408 441-0311 Fax:(408)436-4200 AT-28C256 CMOS EEPROM RELIABILITY DATA -150°C DYNAMIC OPERATING LIFE TEST -CYCLE TEST -200°C RETENTION BAKE -125°C DYNAMIC OPERATING LIFE TEST (PLASTIC) -150°C RETENTION BAKE (PLASTIC)


    Original     		PDF AT-28C256 MIL-M38535 AT-28C010 AT-28C040 AT-28C256 1C0302 3E0319 3E0323 3G0338 EEPROM 28C256 7b9729 1C0302 28C040 28C256 82307 28C256 atmel 4b23 6D9708 6C9638