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    IDEC Corporation ASW412-1-OCCXXX

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    DigiKey ASW412-1-OCCXXX Bulk 1
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    Mouser Electronics ASW412-1-OCCXXX
    • 1 $37
    • 10 $35.09
    • 100 $32.99
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    Master Electronics ASW412-1-OCCXXX
    • 1 $35.84
    • 10 $31.5
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    Sager ASW412-1-OCCXXX 1
    • 1 $37.77
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    • 100 $31.48
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    IDEC Corporation ASW4L12-1-OCCXXX

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    DigiKey ASW4L12-1-OCCXXX Bulk 1
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    Mouser Electronics ASW4L12-1-OCCXXX
    • 1 $37
    • 10 $35.09
    • 100 $32.99
    • 1000 $32.99
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    Master Electronics ASW4L12-1-OCCXXX
    • 1 $35.84
    • 10 $31.5
    • 100 $28.05
    • 1000 $27.36
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    Sager ASW4L12-1-OCCXXX 1
    • 1 $37.77
    • 10 $34.86
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    Fabco-Air D-121-O-C1

    Cylinder, air, 1-1/8" Bore, 1/2" stroke, dbl act, Original Pancake series | Fabco-Air D-121-O-C1
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    RS D-121-O-C1 Bulk 5 Weeks 1
    • 1 $96.52
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    Fabco-Air E-121-O-C2

    Cylinder, air, 1-1/8" Bore, 1" stroke, dbl act, Original Pancake series | Fabco-Air E-121-O-C2
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    RS E-121-O-C2 Bulk 5 Weeks 1
    • 1 $114.36
    • 10 $114.36
    • 100 $114.36
    • 1000 $114.36
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    121OC Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    3TA200GK03NB

    Abstract: 3TA200GK04NB
    Text: 3TA200GKxxNB Three Phase Half Bridge Dimensions in mm 1mm = 0.0394" Type 3TA200GK03NB 3TA200GK04NB VRSM V 400 500 Symbol IT(AV) IT(RMS) ITSM VRRM V 300 400 Test Conditions Single phase, half wave, 180oC conduction,TC=121oC 1/2cycle, 50Hz/60Hz, peak value, non-repetitive


    Original     		PDF 3TA200GKxxNB 3TA200GK03NB 3TA200GK04NB 180oC 121oC 50Hz/60Hz, 200mA, 150oC, 3TA200GK03NB 3TA200GK04NB

    SBW5089

    Abstract: JESD22-A110 sirenza microdevice sot-89 TRANSISTOR a105 JESD22-A113 JESD22-A114 SBA-4089 SBA-5089 SBF-4089 SBF-5089
    Text: Reliability Qualification Report SBA-5089 Products Qualified by Similarity SBA-4089 SBF-5089 SBF-4089 Initial Qualification 303 S. Technology Ct, Broomfield CO, 80021 SBW-5089 7-2003 Phone: 800 SMI-MMIC http://www.sirenza.com Document RQR-103306- Rev. D


    Original     		PDF SBA-5089 SBA-4089 SBF-5089 SBF-4089 SBW-5089 RQR-103306- SBA-5089 SBA-5089BA-5089, SBW5089 JESD22-A110 sirenza microdevice sot-89 TRANSISTOR a105 JESD22-A113 JESD22-A114 SBA-4089 SBF-4089 SBF-5089

    PPAP level submission requirement table

    Abstract: PPAP MANUAL for automotive industry foundry metals quality MANUALS result of 200 prize bond INCOMING MATERIAL INSPECTION checklist, PCB TSMC 90nm sram SMD a006 ISO 9001 Sony foundry INCOMING MATERIAL INSPECTION procedure INCOMING RAW MATERIAL INSPECTION procedure
    Text: Contents Contents i Chapter 1 Quality Management 1.1 Quality Policy 1.2 Quality Organization 1.3 ISO 9001 Year 2000 Revision 1.4 Quality Systems 1.4.1 Process Map 1.4.2 Advanced Product Quality Planning 1.4.3 Quality Assurance in the Project Approval Stage


    Original     		PDF

    mil-std-883 2015

    Abstract: mil-std-883* 2015 LV500 BOX BUILD FABRICATION PROCESS INCOMING RAW MATERIAL INSPECTION method for Total organic carbon analyzer INCOMING RAW MATERIAL INSPECTION procedure INCOMING RAW MATERIAL INSPECTION report
    Text: Littelfuse Quality and Reliability 11 Transient Voltage Suppression PAGE Littelfuse Quality . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11-3


    Original     		PDF

    ALLOY leadframe C7025 material property

    Abstract: smd code marking 56L 20L SMD SOT-23 9l marking sot23 ALLOY leadframe C7025 lead frame cu C194 marking code 56l 100L C194 C7025
    Text: A Structured Approach To Lead-Free IC Assembly Transitioning L. Nguyen, R. Walberg, Z. Lin*, T. Koh*, YY Bong*, MC Chua*, S. Chuah*, JJ Yeoh* National Semiconductor Corp. P.O. Box 58090 M/S 19-100 Santa Clara, CA 95052-8090 * National Semiconductor, Singapore


    Original     		PDF

    R5F21134FP

    Abstract: R5F21134 failure test report PULSE MODE CURRENT SOURCE IC endurance test report
    Text: Report No. MSR-04-1035 Date:Oct 25, 2004 RENESAS SEMICONDUCTOR RELIABILITY REPORT DEVICE: R5F21134FP APPLICATION: Single chip microcomputer for consumer Reported by Y.Shimizu Confirmed by Y.Iwamoto Approved by T. Matsunaga MCU Quality Assurance Dept. Quality Assurance Div.


    Original     		PDF MSR-04-1035 R5F21134FP R5F21134FP. 16-bit 32-pin R5F21134-001FP. 100pF XOUT/P47 R5F21134FP R5F21134 failure test report PULSE MODE CURRENT SOURCE IC endurance test report

    RUR30100

    Abstract: RURP30100 rurp3090 RURP3070 RURP3080
    Text: RURP3070, RURP3080, RURP3090, RURP30100 200 200 100 100 IR , REVERSE CURRENT µA IF , FORWARD CURRENT (A) Typical Performance Curves TJ = +175oC TJ = +100oC 10 TJ = +25oC 1 TJ = +175oC 10 TJ = +100oC 1.0 0.1 TJ = +25oC 0.01 0.0 0.5 1.0 1.5 2.0 2.5 400 600


    Original     		PDF RURP3070, RURP3080, RURP3090, RURP30100 175oC 100oC 121oC) 20kHz) RUR30100 RURP30100 rurp3090 RURP3070 RURP3080

    HX8340B

    Abstract: HX8340-B mx 362-0
    Text: DATA SHEET DOC No. HX8340-B(N -DS ) HX8340-B(N) 176RGB x 220 dot, 262k color, with internal GRAM, TFT Mobile Single Chip Driver Preliminary version 01 October, 2007 HX8340-B(N) 176RGB x 220 dot, 262K color, with internal GRAM, TFT Mobile Single Chip Driver


    Original     		PDF HX8340-B 176RGB 224October, 225October, HX8340B mx 362-0

    M30624FGAGP

    Abstract: p106
    Text: Report No. MSR-00-0307 RELIABILITY REPORT MITSUBISHI SEMICONDUCTOR DEVICE SINGLE CHIP 16-BIT MICROCOMPUTER TYPE M30624FGAGP Mar. 2000 MITSUBISHI ELECTRIC CORPORATION JAPAN 1/11 M30624FGAGP RELIABILITY TEST REPORT This report presents the reliability test results for the M30624FGAGP.


    Original     		PDF MSR-00-0307 16-BIT M30624FGAGP M30624FGAGP. M30624FGAGP 100-pin p106

    MS3320

    Abstract: BACC18 BACC18AD MS14153 Klixon 2 32-6 ms25244 bacc18z klixon thermal switch klixon Overload Protector 2TC14-5
    Text: I NNOVATIVE S OLUTIONS I N S ENSORS A ND C O N T R O L S Precision Products Aircraft Circuit Breakers Aircraft Circuit Breakers 3TC14 2TC66 2TC14 2TC49 3TC7 5TC50 6752-305 6752-12 6752-100 7277-2 7274-4 7274-2 7277-1 7274-11 and 7274-69 20TC 7271-8 7271-3


    Original     		PDF 3TC14 2TC66 2TC14 2TC49 5TC50 MS3320 BACC18 BACC18AD MS14153 Klixon 2 32-6 ms25244 bacc18z klixon thermal switch klixon Overload Protector 2TC14-5

    tsmc cmos 0.13 um sram

    Abstract: TSMC 90nm sram ford ppap EMMI microscope TSMC 0.13um process specification PPAP MANUAL for automotive industry Kyocera mold compound semiconductors cross index ISO 9001 Sony foundry metals quality MANUALS
    Text: Integrated Silicon Solution Inc 2012 Q Quality y and Reliability Manual Contents Content Page Chapter 1 Quality Management 1.1 Quality Policy 1.2 Quality Organization 1.3 ISO 9001 Year 2008 Revision 1.4 Quality Systems 1.4.1 Process Map 1.4.2 Advanced Product Quality Planning


    Original     		PDF

    marking 1A7 SOT-23

    Abstract: 1a7 sot-23 96x80 SOD123 S32 mark 3p SOT363
    Text: APPROVE SHEET Customer: Customer Part Number: 1A1~1A7 PanJit Part Number: 1A1~1A7 Approver Signature: APPROVED BY: Clock Huang PREPARED BY: Ivy Deng DATE: APR.11.2005 DATE: APR.11.2005 PANJIT INTERNATIONAL INC. TEL:886-7-6213121 FAX:886-7-6213129 NO. 24 , Kang Shan North Rd., Kang Shan Town ,


    Original     		PDF 168HRS 250HRS 500HRS -750D marking 1A7 SOT-23 1a7 sot-23 96x80 SOD123 S32 mark 3p SOT363

    relay 12 volts ras 1210

    Abstract: GE-MOV 275L40B MOV GE V150 LA10 275l40b Disc ceramic capacitor GE 130L20 hahn transformer VDE 0551 ge 130l10 c106d spice HARRIS V481DB40 G1 capacitor 275L20
    Text: $5.00 Technical Assistance Transient Voltage Suppression Technical Assistance Electronic Technical Support Ask our experienced staff of engineers for assistance with: Electronic services from Littelfuse offer you the most current information possible. • Device Selection


    Original     		PDF

    aot 110

    Abstract: 10E6 gong
    Text: APPROVAL SHEET AOT MODEL NAME AOT PART NUMBER CUSTOMER NAME DATE Version MAKER Prepared SMD LED :Yellow Color AOT-1206YL61A-N1-N-3 General Customer 2007/April 1 CUSTOMER Checked Approved AOT HEAD QUARTER No. 13, Gongye 5th. Road, Hsinchu Industrial Park, Hukou Shiang,


    Original     		PDF AOT-1206YL61A-N1-N-3 2007/April aot 110 10E6 gong

    M30624FGAFP

    Abstract: mitsubishi p93 p106 100P6S MSR-00-0308
    Text: Report No. MSR-00-0308 RELIABILITY REPORT MITSUBISHI SEMICONDUCTOR DEVICE SINGLE CHIP 16-BIT MICROCOMPUTER TYPE M30624FGAFP Mar. 2000 MITSUBISHI ELECTRIC CORPORATION JAPAN 1/11 M30624FGAFP RELIABILITY TEST REPORT This report presents the reliability test results for the M30624FGAFP.


    Original     		PDF MSR-00-0308 16-BIT M30624FGAFP M30624FGAFP. M30624FGAFP 100-pin mitsubishi p93 p106 100P6S MSR-00-0308

    OC-106 94V0 C

    Abstract: olin 7025 CDA 194 Tamac4 eftec 7025 alloy lead frame sn 8400 Au Sn eutectic thermal conductivity Eftec 64t
    Text: 2 5 Physical Constants of IC Package Materials 1/16/97 3:41 PM CH05WIP.DOC INTEL CONFIDENTIAL until publication date 2 CHAPTER 5 PHYSICAL CONSTANTS OF IC PACKAGE MATERIALS The Table 5-1 through Table 5-5 list typical values for selected properties of materials used in


    Original     		PDF CH05WIP 300oC OC-106 94V0 C olin 7025 CDA 194 Tamac4 eftec 7025 alloy lead frame sn 8400 Au Sn eutectic thermal conductivity Eftec 64t

    Untitled

    Abstract: No abstract text available
    Text: Heat Shrink Tubing THICKWALL HEAT SHRINK TUBING Max. Rec. I.D. Nom. Rec. Wall Conductor Sizes .400" 10.1 .150" (3.8) .090" (2.3) #12-#6 (4-10) .800" (20.3) .200" (5.1) .11" (2.8) 1.10" (27.9) .370" (9.4) .12" (3.0) 1.50" (38.1) .500" (12.7) .17" (4.3) 2.00"


    Original     		PDF

    HX8369

    Abstract: S1129 Himax 23 PIN TFT MOBILE DISPLAY HX5186-A
    Text: DOC No. HX8369-A00-DS HX8369-A00 480RGB x 864 dot, 16.7M color, with internal GRAM, TFT Mobile Single Chip Driver Version 02 October, 2010 HX8369-A00 480RGB x 864 dot, 16.7M color, with internal GRAM, TFT Mobile Single Chip Driver List of Contents October, 2010


    Original     		PDF HX8369-A00-DS HX8369-A00 480RGB 285October, HX8369 S1129 Himax 23 PIN TFT MOBILE DISPLAY HX5186-A

    MIL-R-55342

    Abstract: MIL-STD-202 Method 103 a 103 g resistor network KOA DATE CODE
    Text: CTX PECL Filter Network Nov. 2000 FEATURES -EMI/RFI attenuation -Reduced board space -Better tracking of electrical parameters -Precision characterisitcs CTX CTX PACKAGE SOT-23 SCHEMATIC (top view) 2 Dim 2 H R1 C 1 3 F R2 1 3 G J C I A A C E F G H I J Spec


    Original     		PDF OT-23) 100ppm/oC 100mW 300mW 150oC MIL-STD-202 121oC, 250pF MIL-R-55342 MIL-STD-202 Method 103 a 103 g resistor network KOA DATE CODE

    JESD22-A-104-A

    Abstract: JESD22-A104-A
    Text: QUALITY AND RELIABILITY INFORMATION QUALITY AND RELIABILITY INFORMATION PROMAX-JOHNTON is highly committed to insure the quality and reliability of all devices. We are committed in all levels of our operation, such as initial product definition, design, fabrication, assembly, testing , qualification and servicing our customers.


    Original     		PDF LTPD15% 60psi JESD22-A-104-A JESD22-A104-A

    M30624FGMGP

    Abstract: p106 PULSE CURRENT SOURCE mitsubishi p91 power supply
    Text: Report No. MSR-00-0513 RELIABILITY REPORT MITSUBISHI SEMICONDUCTOR DEVICE SINGLE CHIP 16-BIT MICROCOMPUTER TYPE M30624FGMGP May. 2000 MITSUBISHI ELECTRIC CORPORATION JAPAN 1/11 MSR-00-0513 M30624FGMGP RELIABILITY TEST REPORT This report presents the reliability test results for the M30624FGMGP.


    Original     		PDF MSR-00-0513 16-BIT M30624FGMGP M30624FGMGP. M30624FGMGP 100-pin p106 PULSE CURRENT SOURCE mitsubishi p91 power supply

    unbonded strain gage

    Abstract: missile accelerometer 4-205-0001 MIL-E-5272 CEC Vibration Products 250OF
    Text: CEC Vibration Products 4-205 Strain Gage Accelerometer 4-205 Applications • Aircraft Flight Test • Missile/Rocket Test • Auto Crash Test • Suspension Test • Deceleration/Brake Test Features • Operates from ±1 g to ±5 g • Wide temperature range: -70oF to +300oF


    Original     		PDF -70oF 300oF -57oC 149oC) MIL-E-5272, unbonded strain gage missile accelerometer 4-205-0001 MIL-E-5272 CEC Vibration Products 250OF

    unbonded strain gage

    Abstract: 4-202-0001 accelerometer 4-202 4-202-0020 4-202-0021 MIL-E-5272 strain gage test missile accelerometer 4-202-0015 CEC Vibration Products
    Text: CEC Vibration Products 4-202 Strain Gage Accelerometer 4-202 Applications • Aircraft Flight Test • Missile/Rocket Test • Auto Crash Test • Suspension Test • Deceleration/Brake Test Features • Operates from ±5 g to ±500 g • Wide temperature range:


    Original     		PDF -65oF 250oF -54oC 121oC) MIL-E-5272, unbonded strain gage 4-202-0001 accelerometer 4-202 4-202-0020 4-202-0021 MIL-E-5272 strain gage test missile accelerometer 4-202-0015 CEC Vibration Products

    ic lg 631

    Abstract: LG 631 IC
    Text: GMM7641210CS/SG-6/7 LG Semicon Co.,Ltd. 1,048,576 W O R D S x 64 B IT CMOS EDO DYNAMIC RAM MODULE Description Features T he G M M 7 6 4 121OCS/SG is an 1M x 64 bits E D O D ynam ic R A M M O D U L E w hich is assem bled 4 pieces o f 1M x 16bit E D O • 168 pins D ual In-L ine Package


    OCR Scan     		PDF 121OCS/SG 16bit 20pin 41210C GMM7641210CS/SG ic lg 631 LG 631 IC