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    FAILURE TEST REPORT Search Results

    FAILURE TEST REPORT Result Highlights (6)

    Part ECAD Model Manufacturer Description Download Buy
    FO-62.5LPBMT0-001 Amphenol Cables on Demand Amphenol FO-62.5LPBMT0-001 MT-RJ Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m Datasheet
    FO-9LPBMTRJ00-001 Amphenol Cables on Demand Amphenol FO-9LPBMTRJ00-001 MT-RJ Connector Loopback Cable: Single-Mode 9/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFP28LPB1W-3DB Amphenol Cables on Demand Amphenol SF-SFP28LPB1W-3DB SFP28 Loopback Adapter Module for SFP28 Port Compliance Testing - 3dB Attenuation & 1W Power Consumption Datasheet
    FO-50LPBMTRJ0-001 Amphenol Cables on Demand Amphenol FO-50LPBMTRJ0-001 MT-RJ Connector Loopback Cable: Multimode 50/125 Fiber Optic Port Testing .1m Datasheet
    SF-SFPPLOOPBK-003.5 Amphenol Cables on Demand Amphenol SF-SFPPLOOPBK-003.5 SFP+ Loopback Adapter Module for SFP+ Port Compliance Testing - 3.5dB Copper/Optical Cable Emulation Datasheet
    FO-62.5LPBLC0-001 Amphenol Cables on Demand Amphenol FO-62.5LPBLC0-001 LC Connector Loopback Cable: Multimode 62.5/125 Fiber Optic Port Testing .1m Datasheet

    FAILURE TEST REPORT Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    13001 s

    Abstract: 13001 datasheet 13001 JL-01 ACTEL 1020B RTSX32 B 13001 RTSX16 42MX09 1280A
    Text: Actel 4th Quarter 2000 Reliability Report 1 Table of Contents Page Reliability Test Matrix • Test Methods and Conditions Failure Rates • Failure Rates FITs Based For Current Process Data • Mean Time Between Failure (MTBF) For Current Process Data 2


    Original     		PDF 1225XL, 1240XL, 1280XL, A1415, A1425, 14100BP, 32140DX, 32200DX 13001 s 13001 datasheet 13001 JL-01 ACTEL 1020B RTSX32 B 13001 RTSX16 42MX09 1280A

    800RPM

    Abstract: KD240
    Text: L10 Life Test Report Model No. KD2408PHS3.H Test Condition Input 24 VDC Failures Elec-SPEC 4,800RPM Observe MTTF 0.19AMP Temp 70 ℃ Fan Vertical Useful Life 50 PCS Condition Test Sample Test Hours/Each 15,288 Hours Total Test Hour 740,544 Hours Failure Definition


    Original     		PDF KD2408PHS3 800RPM 19AMP 800RPM KD240

    6K tantalum capacitors

    Abstract: No abstract text available
    Text: NIC Doc #R-NTC02 Page 1 of 6 70 Maxess Road ! Melville, New York 11747 631 396-7500 ! Fax (631) 396-7575 NTC SERIES TANTALUM CHIP CAPACITORS ! ! ! ! FAILURE RATE ESTIMATION DE-RATED OPERATION LIST OF RELIABILITY TESTS LIFE TEST SUMMARY FAILURE RATE ESTIMATION


    Original     		PDF R-NTC02 4/988E 6K tantalum capacitors

    CBR08C

    Abstract: CBR08C1
    Text: KEMET Ceramic Surface Mount Capacitors Product RF C0G 0201 33pF 10 V Product Family Qualification CBRO2C330J8GAC 114A010282 SS # Fail Test Performed Test Conditions Sample Size per lot Failure Count Reliability and Environmental Tests High Temperature Life


    Original     		PDF CBRO2C330J8GAC 114A010282 30min) CBR08C CBR08C1

    MTTF

    Abstract: No abstract text available
    Text: Life Model No. KD2408PHS3.H Elec-SPEC 4,800RPM Test Sample 50 Pcs Test Hours/Each 2,160 Hours Total Test Hour 108,000 Hours Failure Definition 1.Fan not function 2.RPM Under 15% of original 3.Current Over 15% of original 4.Noise Over 5dB of original Test Condition


    Original     		PDF KD2408PHS3 800RPM 19AMP MTTF

    IRFP460Z

    Abstract: IRF3205 application IRF3205 equivalent power MOSFET IRFP460z irfp4004 IRF3808 equivalent irfz44v equivalent IRF1405 equivalent IRLL014N IRF3205
    Text: Switch and I/O Reliability Report March, 2003 International Rectifier Table Of Contents 1.0 Introduction 2.0 Environmental Stress And Failure Modes 3.0 The Matrix Qualification Philosophy 4.0 Summary Of Long Term Reliability Test 4.1 Transistors 4.1.1 HTRB


    Original     		PDF O-220 IRFP460Z IRF3205 application IRF3205 equivalent power MOSFET IRFP460z irfp4004 IRF3808 equivalent irfz44v equivalent IRF1405 equivalent IRLL014N IRF3205

    JESD22-B104-B

    Abstract: JESD22-b103 JESD22-B104 iP1201 transistor Amp 2054 equivalent C1173 JESD22-B103B JESD22-B103-B
    Text: International Rectifier Reliability Report for iPOWIR Family iP1001, iP1201, iP1202, iP2001, iP2002, iP2003 20-Apr-04 iPOWIR Family Reliability Testing Summary 4/20/2004 1 . HTOL - High Temperature Operating Life Test Failure Rate Device Number Conditon Samples


    Original     		PDF iP1001, iP1201, iP1202, iP2001, iP2002, iP2003 20-Apr-04 iP1001 iP2001 iP2002 JESD22-B104-B JESD22-b103 JESD22-B104 iP1201 transistor Amp 2054 equivalent C1173 JESD22-B103B JESD22-B103-B

    ID32

    Abstract: HTGB JA113
    Text: GEN-V SOT-223 HEXFET RELIABILITY REPORT page 1 Table of Contents Section I. II. III. IV. V. VI. VII. VIII. IX. X. Page Executive Summary Introduction Procedure Reliability Tests - Table I Electrical Tests - Table II Test Purposes & Common Failure Mechanisms


    Original     		PDF OT-223 ID32 HTGB JA113

    irlml2404

    Abstract: transistor 9529 IRF7603 IRF7389 IRF7103 irlml2402 Small-Outline SMD Reliability Report 704618 HEXFET SO-8 irf7404 datasheet
    Text: Small-Outline SMD Reliability Report Page 1 Table of Contents Section I. II. III. IV. V. VI. VII. VIII. IX. X. Page Executive Summary Introduction Procedure Reliability Tests - Table I Electrical Tests - Table II Test Purposes & Common Failure Mechanisms Reliability Data


    Original     		PDF

    EIA-625A

    Abstract: SSYA010 EIA-541
    Text: Application Report SSYA010 - January 2001 Electrostatic Discharge ESD Tom Diep and Charvaka Durvury Standard Linear & Logic ABSTRACT This application report provides an overview of electrostatic-discharge (ESD) test models, failure modes, protection strategies, and Texas Instruments (TI) procedures to guard against


    Original     		PDF SSYA010 EIA-625A EIA-541

    transistor 9752

    Abstract: RECTIFIER 8212 ID09 HTGB
    Text: GEN-III SOT-223 HEXFET RELIABILITY REPORT page 1 Table of Contents Section I. II. III. IV. V. VI. VII. VIII. IX. X. XI. Page Executive Summary Introduction Procedure Reliability Tests - Table I Electrical Tests - Table II Test Purposes & Common Failure Mechanisms


    Original     		PDF OT-223 transistor 9752 RECTIFIER 8212 ID09 HTGB

    2005 Z

    Abstract: R 753 tcr-125 TCR55 S10K 22-315
    Text: CHINA 752 & 753 SERIES QUALIFICATION DATA FOR THE YEAR 2005 RES TEST BL# LET VALUE MIN MAX AVG RES QTY PARTS TOTAL PER PART TESTED FAILURE RESISTORS REPORT QTR PARTS RES FAILED FAILED PART SERIES YEAR NUMBER IN RES 19747 D 100/1K - - - 12 80 - 1 752


    Original     		PDF 100/1K 753091331G 22316S 753091103G 752QA1 2005 Z R 753 tcr-125 TCR55 S10K 22-315

    DD-03201FP-200

    Abstract: CH85 capacitor ARINC429 arinc429 104 DD-03201 DO-160C CH52 CH-1701 TAE 1102
    Text: Make sure the next Card you purchase has. DD-03201 32- OR 96-CHANNEL DISCRETE-TODIGITAL INTERFACE “RXD3” FEATURES • Universal Inputs - Configurable As: • 28 V/Gnd • Open/Gnd • 28 V/Open • Input Resistor Usage • Built-In Self-Test • Soft Failure Reporting


    Original     		PDF DD-03201 96-CHANNEL DD-03201 1-800-DDC-5757 A5976 E-03/04-0 DD-03201FP-200 CH85 capacitor ARINC429 arinc429 104 DO-160C CH52 CH-1701 TAE 1102

    Untitled

    Abstract: No abstract text available
    Text: Make sure the next Card you purchase has. DD-03201 32- OR 96-CHANNEL DISCRETE-TODIGITAL INTERFACE “RXD3” FEATURES • Universal Inputs - Configurable As: • 28 V/Gnd • Open/Gnd • 28 V/Open • Input Resistor Usage • Built-In Self-Test • Soft Failure Reporting


    Original     		PDF DD-03201 96-CHANNEL DD-03201 1-800-DDC-5757 A5976 F-11/06-0

    CH85 capacitor

    Abstract: No abstract text available
    Text: Make sure the next Card you purchase has. DD-03201 32- OR 96-CHANNEL DISCRETE-TODIGITAL INTERFACE “RXD3” FEATURES • Universal Inputs - Configurable As: • 28 V/Gnd • Open/Gnd • 28 V/Open • Input Resistor Usage • Built-In Self-Test • Soft Failure Reporting


    Original     		PDF DD-03201 96-CHANNEL DD-03201 1-800-DDC-5757 A5976 J-3/08-0 CH85 capacitor

    DD-03201FP-200

    Abstract: 8065 microprocessor
    Text: Make sure the next Card you purchase has. DD-03201 32- or 96-Channel discrete-ToDigital Interface “RXD3” FEATURES • Universal Inputs - Configurable As: • 28 V/Gnd • Open/Gnd • 28 V/Open • Input Resistor Usage • Built-In Self-Test • Soft Failure Reporting


    Original     		PDF DD-03201 96-Channel DD-03201 1-800-DDC-5757 A5976 L-10/08-0 DD-03201FP-200 8065 microprocessor

    CH89 diode

    Abstract: 74CH74 DIODE CH71 DD-03182PP 96-channel diode gp 429
    Text: Make sure the next Card you purchase has. DD-03296 96-CHANNEL DISCRETE-TO-DIGITAL INTERFACE FEATURES • HIRF Layer • Universal Inputs • 28V/Gnd • Open/Gnd • 28V/Open • Built-in Self-Test • Soft Failure Reporting • Higher MTBUR • ARINC 429 Output Port


    Original     		PDF DD-03296 96-CHANNEL DD-03296 16-bit 1-800-DDC-5757 A5976 F-3/08-0 CH89 diode 74CH74 DIODE CH71 DD-03182PP diode gp 429

    Untitled

    Abstract: No abstract text available
    Text: Make sure the next Card you purchase has. DD-03296 96-CHANNEL DISCRETE-TO-DIGITAL INTERFACE FEATURES • HIRF Layer • Universal Inputs • 28V/Gnd • Open/Gnd • 28V/Open • Built-in Self-Test • Soft Failure Reporting • Higher MTBUR • ARINC 429 Output Port


    Original     		PDF DD-03296 96-CHANNEL DD-03296 16-bit 1-800-DDC-5757 A5976 E-7/07-0 F-11/06-0

    Untitled

    Abstract: No abstract text available
    Text: PD - 91396B IRHNA7160 IRHNA8160 REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR N-CHANNEL MEGA RAD HARD Ω, RAD HARD HEXFET 100Volt, 0.040Ω International Rectifier’s RAD HARD technology HEXFETs demonstrate immunity to SEE failure. Additionally, under identical pre- and post-irradiation test


    Original     		PDF 91396B IRHNA7160 IRHNA8160 100Volt,

    IRHNA7Z60

    Abstract: IRHNA8Z60
    Text: PD - 91701B IRHNA7Z60 IRHNA8Z60 REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR N-CHANNEL MEGA RAD HARD W , RAD HARD HEXFET 30 Volt, 0.009W International Rectifier’s RAD HARD technology HEXFETs demonstrate immunity to SEE failure. Additionally, under identical pre- and post-irradiation test


    Original     		PDF 91701B IRHNA7Z60 IRHNA8Z60 patente10) IRHNA7Z60 IRHNA8Z60

    IRHNA7160

    Abstract: IRHNA8160 JANSH2N7432U JANSR2N7432U
    Text: REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR IRHNA7160 IRHNA8160 JANSR2N7432U JANSH2N7432U N-CHANNEL MEGA RAD HARD Ω , RAD HARD HEXFET 100Volt, 0.040Ω International Rectifier’s RAD HARD technology HEXFETs demonstrate immunity to SEE failure. Additionally, under identical pre- and post-irradiation test


    Original     		PDF IRHNA7160 IRHNA8160 JANSR2N7432U JANSH2N7432U 100Volt, IRHNA7160 IRHNA8160 JANSH2N7432U JANSR2N7432U

    SMD 43A

    Abstract: IRHNB7260 IRHNB8260
    Text: PD - 91798 IRHNB7260 IRHNB8260 REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR N-CHANNEL MEGA RAD HARD Ω, MEGA RAD HARD HEXFET 200Volt, 0.070Ω International Rectifier’s RAD HARD technology HEXFETs demonstrate immunity to SEE failure. Additionally, under identical pre- and post-irradiation test


    Original     		PDF IRHNB7260 IRHNB8260 200Volt, Rectifie10) SMD 43A IRHNB7260 IRHNB8260

    smd 43a

    Abstract: No abstract text available
    Text: PD - 91798 IRHNB7260 IRHNB8260 REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR N-CHANNEL MEGA RAD HARD Ω , MEGA RAD HARD HEXFET 200Volt, 0.070Ω International Rectifier’s RAD HARD technology HEXFETs demonstrate immunity to SEE failure. Additionally, under identical pre- and post-irradiation test


    Original     		PDF IRHNB7260 IRHNB8260 200Volt, smd 43a

    Untitled

    Abstract: No abstract text available
    Text: PD - 91397A IRHNA7260 IRHNA8260 REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR N-CHANNEL MEGA RAD HARD Ω, MEGA RAD HARD HEXFET 200Volt, 0.070Ω International Rectifier’s RAD HARD technology HEXFETs demonstrate immunity to SEE failure. Additionally, under identical pre- and post-irradiation test


    Original     		PDF 1397A IRHNA7260 IRHNA8260 200Volt, HEXF90245,