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    XC95XXXL

    Abstract: XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices
    Text: The Reliability Data Program Expanded Version July 1, 2000 Cover P1 TABLE OF CONTENTS Introduction .…4 The Reliability Program. .…4


    Original     		PDF XC4005XL PQFP-160 PLCC-84, HQFP-304, VQFP-100 XC4044XL XC4013XLA XC95XXXL XC95XXX XC1765D PQFP240 C17S xc9536 A9903 XCV1000E FG HT 12E APPLICATION Reliability Test Methods for Packaged Devices

    Untitled

    Abstract: No abstract text available
    Text: Features • EE Programmable 262,144 x 1-, 524,288 x 1-, 1,048,576 x 1-, 2,097,152 x 1-, and • • • • • • • • 4,194,304 x 1-bit Serial Memories Designed to Store Configuration Programs for Field Programmable Gate Arrays FPGAs Available as a 3.3V (±10%) Commercial and Industrial Version


    Original     		PDF XC17SXXXA XC17SXXXXL 20-lead 44-lead 20motive XC3000 XC4000â XC5200â 3020Câ

    AT17N512

    Abstract: ATMEL Packaging information JEDEC SOIC AT17N002 AT17N010 AT17N040 AT17N256 ATDH2200E ATDH2225 atmel 144 soic
    Text: Features • EE Programmable 262,144 x 1-, 524,288 x 1-, 1,048,576 x 1-, 2,097,152 x 1-, and • • • • • • • • 4,194,304 x 1-bit Serial Memories Designed to Store Configuration Programs for Field Programmable Gate Arrays FPGAs Available as a 3.3V (±10%) Commercial and Industrial Version


    Original     		PDF XC17SXXXA XC17SXXXXL 20-lead 44-lead XC3000 XC4000TM XC5200TM 3020C AT17N512 ATMEL Packaging information JEDEC SOIC AT17N002 AT17N010 AT17N040 AT17N256 ATDH2200E ATDH2225 atmel 144 soic

    3020B

    Abstract: JEDEC Drawing Ms-013
    Text: Features • EE Programmable 262,144 x 1-, 524,288 x 1-, 1,048,576 x 1-, 2,097,152 x 1-, and • • • • • • • • 4,194,304 x 1-bit Serial Memories Designed to Store Configuration Programs for Field Programmable Gate Arrays FPGAs Available as a 3.3V (±10%) Commercial and Industrial Version


    Original     		PDF XC17SXXXA XC17SXXXXL 20-lead 44-lead AT17ot XC3000 XC4000TM XC5200TM 3020B JEDEC Drawing Ms-013

    ORCAT

    Abstract: JEDEC Drawing Ms-013 AT17N002 AT17N010 AT17N040 AT17N256 AT17N512 ATDH2200E ATDH2225 footprint jedec MS-026 TQFP
    Text: Features • EE Programmable 262,144 x 1-, 524,288 x 1-, 1,048,576 x 1-, 2,097,152 x 1-, and • • • • • • • • 4,194,304 x 1-bit Serial Memories Designed to Store Configuration Programs for Field Programmable Gate Arrays FPGAs Available as a 3.3V (±10%) Commercial and Industrial Version


    Original     		PDF XC17SXXXA XC17SXXXXL 20-lead 44-lead XC3000 XC4000 XC5200 ORCAT JEDEC Drawing Ms-013 AT17N002 AT17N010 AT17N040 AT17N256 AT17N512 ATDH2200E ATDH2225 footprint jedec MS-026 TQFP