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    X00010 Search Results

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    Arduino ASX00010

    ARDUINO MKR RGB
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    Amphenol ProLabs VX_00010-C

    VSS Monitoring VX_00010 Compatib
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    ATGBICS VX_00010-C

    Compatible SFP+ 10G
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    Honeywell Sensing and Control 3150UX-00010330

    THERMOSTAT CYLINDER SOLDER LUG
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    GEFRAN spa F013669 (ALTERNATE: TC5-V-2-J-3-Q-J-B-3 020A000X00010XX)

    Plastics industry | Gefran F013669
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    RS F013669 (ALTERNATE: TC5-V-2-J-3-Q-J-B-3 020A000X00010XX) Bulk 2 1
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    X00010 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    BCT8373A

    Abstract: No abstract text available
    Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


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    PDF SN54BCT8373A, SN74BCT8373A SCBS044F BCT373 SCBA004C SDYA010 SDYA012 SSYA002C, SZZU001B, SDYU001N, BCT8373A

    ATMEGA32U4

    Abstract: 7766D atmega16 assembly IC ATMEGA16 power supply schematic ATmega16 IR remote control 7766E SP12 SP13 SP14 SP15
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF 16/32K ATmega16U4/ATmega32U4) 512Bytes/1K Flash/100 7766F ATMEGA32U4 7766D atmega16 assembly IC ATMEGA16 power supply schematic ATmega16 IR remote control 7766E SP12 SP13 SP14 SP15

    BCT245

    Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
    Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


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    PDF SN54BCT8245A, SN74BCT8245A SCBS043E BCT8245A SN54BCT8245A BCT245 F245 SN54BCT8245A SN74BCT8245A

    V5050

    Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


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    PDF SN54BCT8244A, SN74BCT8244A SCBS042E BCT8244A SN54BCT8244A 17customer V5050 BCT244 F244 SN54BCT8244A SN74BCT8244A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


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    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


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    PDF SN54BCT8245A, SN74BCT8245A SCBS043E BCT8245A SN54BCT8245A

    ATMEL 649v

    Abstract: 6490V ATMEGA329 TWI avr adc
    Text: Features • High Performance, Low Power Atmel AVR® 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF 16MHz 32KBytes ATmega329/ATmega3290) 64KBytes ATmega649/ATmega6490) 2552K ATMEL 649v 6490V ATMEGA329 TWI avr adc

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE


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    PDF SN54BCT8245A, SN74BCT8245A SCBS043E BCT245

    ATmega32H

    Abstract: PV15100 PCIE10 atmel 718 ac chopper ATMEGA64HVE2
    Text: Atmel ATmega32HVE2/ATmega64HVE2 8-bit AVR Microcontroller with Precise Analog Frontend for very Accurate Voltage and Current Measurement PRELIMINARY DATASHEET Features ● Single-package fully-integrated ● High precision analog frontend ● 17bit single-ended voltage-ADC


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    PDF ATmega32HVE2/ATmega64HVE2 17bit SAEJ2602-2 ATmega32H PV15100 PCIE10 atmel 718 ac chopper ATMEGA64HVE2

    PFC 5kw

    Abstract: principle block diagram 115v 400hz power schematic diagram 10kw bldc motor speed controller 1242 qfn32 P320 AVR AT90PWM81
    Text: Features • High performance, low power Atmel AVR® 8-bit Microcontroller • Advanced RISC architecture • • • • – 131 powerful instructions - most single clock cycle execution – 32 x 8 general purpose working registers – Fully static operation


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    PDF 8/16Kbytes 7734Q PFC 5kw principle block diagram 115v 400hz power schematic diagram 10kw bldc motor speed controller 1242 qfn32 P320 AVR AT90PWM81

    bct8240a

    Abstract: No abstract text available
    Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This


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    PDF SN54BCT8240A, SN74BCT8240A SCBS067E BCT240 SNJ54BCT8240AFK 5962View 9174601Q3A SNJ54BCT8240AJT 9174601QLA bct8240a

    SS 1091 asn

    Abstract: atmel sine wave pwm circuit atmega 128 atmel atmega 382 SM200 DSAQ00265166. ATMEGA USART programming example ATMEGA 326
    Text: Features • • • • • • • • • • • High Performance, Low Power Atmel AVR® 8-Bit Microcontroller Advanced RISC Architecture – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers


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    PDF 16MIPS 16MHz ATmega165PA/645P) 20MIPS 20MHz /325A/325PA/645A/3250A/3250PA/6450A/6450P 16KBytes ATmega165A/ATmega165PA) 32KBytes 325A/ATmega325PA/ATmega3250A/ATmega3250PA SS 1091 asn atmel sine wave pwm circuit atmega 128 atmel atmega 382 SM200 DSAQ00265166. ATMEGA USART programming example ATMEGA 326

    mega32u4

    Abstract: at90usb164 AT90USB324 Atmega32u4 SP10 SP11 SP12 SP13 SP14 SP15
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • – 135 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF

    3290

    Abstract: 3290PV rele 12V 10A RELE 12V 5 pines
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF 1149he 3290 3290PV rele 12V 10A RELE 12V 5 pines

    ATMEGA324PA-PU

    Abstract: DRQFN 168T 1610t VATMEGA324PA 25810 oc 192 modulator atmel 1010
    Text: Features • High-performance, Low-power AVR 8-bit Microcontroller • Advanced RISC Architecture • • • • • – 131 Powerful Instructions – Most Single-clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF

    mega169

    Abstract: atmega169v-8ai
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF 2514P mega169 atmega169v-8ai

    atmega169pv-8au

    Abstract: avr adc
    Text: Features • High Performance, Low Power AVR 8-Bit Microcontroller • Advanced RISC Architecture • • • • • • • • – 130 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers – Fully Static Operation


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    PDF 8018I atmega169pv-8au avr adc

    RAMDE

    Abstract: IN5820 OP44 74als541 AB-097 DDC101 fdrd dxo 1100 C16BARD m31 crt
    Text: APPLICATION BULLETIN Mailing Address: PO Box 11400 • Tucson, AZ 85734 • Street Address: 6730 S. Tucson Blvd. • Tucson, AZ 85706 Tel: 602 746-1111 • Twx: 910-952-111 • Telex: 066-6491 • FAX (602) 889-1510 • Immediate Product Info: (800) 548-6132


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    PDF DDC101 DDC101s DDC101 RAMDE IN5820 OP44 74als541 AB-097 fdrd dxo 1100 C16BARD m31 crt

    SN74BCT373

    Abstract: SN74BCT8373 SN74F373
    Text: SN74BCT8373 SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES SCBS471 – JUNE 1990 – REVISED JUNE 1994 • • • • • • • • Member of the Texas Instruments SCOPE  Family of Testability Products Octal Test-Integrated Circuit Functionally Equivalent to SN74F373 and


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    PDF SN74BCT8373 SCBS471 SN74F373 SN74BCT373 SN74BCT8373

    car battery charger

    Abstract: No abstract text available
    Text: PI3USB9281 |


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    PDF PI3USB9281 PI3USB9281 PI3USB9281GEE 15-Pin PT0502-1 car battery charger

    at90can32-16au

    Abstract: MOB2 module AT90CAN128 AT90CAN32 AT90CAN64 SP12 SP13 SP14 SP15 ni 400 le
    Text: Features • High-performance, Low-power AVR 8-bit Microcontroller • Advanced RISC Architecture • • • • • • • • • – 133 Powerful Instructions – Most Single Clock Cycle Execution – 32 x 8 General Purpose Working Registers + Peripheral Control Registers


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    PDF 32K/64K/128K AT90CAN32/64/128) at90can32-16au MOB2 module AT90CAN128 AT90CAN32 AT90CAN64 SP12 SP13 SP14 SP15 ni 400 le

    ic laf 0001

    Abstract: laf 0001 M3161 laf 0001 power 95a313 DNA 1001 DL laf 001 testing motherboards using multi meter au mac he nrc IEEE-48
    Text: CS8920 A Cirrus Logic Company ISA Plug-and-Play Ethernet Controller Features Description • Single-Chip IEEE 802.3 Ethernet Controller with Direct ISA-Bus Interface • • • • Implements Industry-Standard Plug and Play Full Duplex Operation Auto-Negotiation of Full and Half duplex Modes


    OCR Scan
    PDF CS8920 10BASE-T 10BASE2, 10BASE5 10BASE-F 0146h) CS8920 DS150PP1 ES4b324 0010E05 ic laf 0001 laf 0001 M3161 laf 0001 power 95a313 DNA 1001 DL laf 001 testing motherboards using multi meter au mac he nrc IEEE-48

    SN54BCT8244A

    Abstract: SN74BCT8244A
    Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal­


    OCR Scan
    PDF SN54BCT8244A, SN74BCT8244A SCBS042D SN54/74F244 SN54/74BCT244 752S5 SN54BCT8244A

    74BCT8374

    Abstract: D3641 TEX-E wire
    Text: SN54BCT8374, SN74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— 0 3 6 4 1 , JUNE 1990 SN54BCT8374 IT PACKAGE SN74BCT8374 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE Family of Testability Products TOP VIEW


    OCR Scan
    PDF SN54BCT8374, SN74BCT8374 TI0223-- SN54BCT8374 SN74BCT8374 SN54/74F374 SN54/74BCT374 74BCT8374 D3641 TEX-E wire