BCT8373A
Abstract: No abstract text available
Text: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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SN54BCT8373A,
SN74BCT8373A
SCBS044F
BCT373
SCBA004C
SDYA010
SDYA012
SSYA002C,
SZZU001B,
SDYU001N,
BCT8373A
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micro usb ID resistance values
Abstract: No abstract text available
Text: LP8727 www.ti.com SNVS898 – OCTOBER 2012 LP8727 Micro/Mini USB Interface with Integrated 28V Charger Check for Samples: LP8727 FEATURES 1 • 2 • • • USB Multiplexing Switches – High-speed USB on USB and UART inputs – Negative voltage rail on Audio inputs
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LP8727
SNVS898
LP8727
micro usb ID resistance values
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BCT245
Abstract: BCT8245A F245 SN54BCT8245A SN74BCT8245A
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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SN54BCT8245A,
SN74BCT8245A
SCBS043E
BCT8245A
SN54BCT8245A
BCT245
F245
SN54BCT8245A
SN74BCT8245A
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V5050
Abstract: BCT244 F244 SN54BCT8244A SN74BCT8244A
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042E – FEBRUARY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8244A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8244A,
SN74BCT8244A
SCBS042E
BCT8244A
SN54BCT8244A
17customer
V5050
BCT244
F244
SN54BCT8244A
SN74BCT8244A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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SN54BCT8245A,
SN74BCT8245A
SCBS043E
BCT8245A
SN54BCT8245A
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TLV990
Abstract: TLV990-21 TLV990-21PFB
Text: TLV990Ć21 3ĆV, 10ĆBIT, 21ĆMSPS AREA CCD ANALOG FRONT END SLAS299A − AUGUST 2000 − REVISED MARCH 2004 features application D Single-Chip CCD Analog Front-End D 10-Bit, 21-MSPS, Single 3-V Supply D D D D D D D 48-Pin TQFP Package STBY RESET CS SDIN SCLK
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TLV99021
10BIT,
21MSPS
SLAS299A
10-Bit,
21-MSPS,
48-Pin
150-mW
36-dB
TLV990
TLV990-21
TLV990-21PFB
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Untitled
Abstract: No abstract text available
Text: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E – MAY 1990 – REVISED JULY 1996 D D D D D description The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE
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SN54BCT8245A,
SN74BCT8245A
SCBS043E
BCT245
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ATmega32H
Abstract: PV15100 PCIE10 atmel 718 ac chopper ATMEGA64HVE2
Text: Atmel ATmega32HVE2/ATmega64HVE2 8-bit AVR Microcontroller with Precise Analog Frontend for very Accurate Voltage and Current Measurement PRELIMINARY DATASHEET Features ● Single-package fully-integrated ● High precision analog frontend ● 17bit single-ended voltage-ADC
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ATmega32HVE2/ATmega64HVE2
17bit
SAEJ2602-2
ATmega32H
PV15100
PCIE10
atmel 718
ac chopper
ATMEGA64HVE2
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bct8240a
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT240
SNJ54BCT8240AFK
5962View
9174601Q3A
SNJ54BCT8240AJT
9174601QLA
bct8240a
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Untitled
Abstract: No abstract text available
Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid
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16-BIT
M16C/29
REJ09B0101-0112
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NEC asu
Abstract: 13E3h 1442H
Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid
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R8C/22
R8C/23
REJ09B0251-0200
NEC asu
13E3h
1442H
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SN74BCT373
Abstract: SN74BCT8373 SN74F373
Text: SN74BCT8373 SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES SCBS471 – JUNE 1990 – REVISED JUNE 1994 • • • • • • • • Member of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuit Functionally Equivalent to SN74F373 and
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SN74BCT8373
SCBS471
SN74F373
SN74BCT373
SN74BCT8373
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M306N5FCTFP circuit
Abstract: m306n5mcv 014e1
Text: REJ09B0011-0100Z M16C/6N5 Group 16 Hardware Manual RENESAS 16-BIT SINGLE-CHIP MICROCOMPUTER M16C FAMILY / M16C/60 SERIES Before using this material, please visit our website to confirm that this is the most current document available. Rev. 1.00 Revision date: May 30, 2003
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REJ09B0011-0100Z
M16C/6N5
16-BIT
M16C/60
M306N5FCTFP circuit
m306n5mcv
014e1
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f0208
Abstract: ad495 MBM27C512-20
Text: FUJITSU SEMICONDUCTOR DATA SHEET DS07-12555-1E 8-bit Proprietary Microcontroller CMOS F2MC-8L MB89560A Series MB89567A/567AC/P568/PV560 • DESCRIPTION The MB89560A series has been developed as a general-purpose version of the F2MC*1-8L family consisting of
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DS07-12555-1E
MB89560A
MB89567A/567AC/P568/PV560
8/16-bit
21-bit
17-bit
F0208
f0208
ad495
MBM27C512-20
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ta2119
Abstract: diode S31C REJ09B0287-0110 fb p67 SMD CODE MARKING DIODE GOC 97
Text: To our customers, Old Company Name in Catalogs and Other Documents On April 1st, 2010, NEC Electronics Corporation merged with Renesas Technology Corporation, and Renesas Electronics Corporation took over all the business of both companies. Therefore, although the old company name remains in this document, it is a valid
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M16C/28
M16C/29
16-BIT
REJ09B0287-0110
ta2119
diode S31C
REJ09B0287-0110
fb p67 SMD CODE MARKING
DIODE GOC 97
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F504
Abstract: PDIP28 ST52F500 ic 4060 internal circuit afb3
Text: ST52F500/F503/F504 ST52F500/F503/F504 8-BIT INTELLIGENT CONTROLLER UNIT ICU Two Timer/PWMs, I2C, SPI TARGET SPECIFICATION Memories • Up to 8 Kbytes Single Voltage Flash Memory ■ Up to 512 bytes of RAM ■ Up to 4 Kbytes Data EEPROM ■ In Situ Programming in Flash devices (ISP)
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ST52F500/F503/F504
F504
PDIP28
ST52F500
ic 4060 internal circuit
afb3
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Untitled
Abstract: No abstract text available
Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This
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SN54BCT8240A,
SN74BCT8240A
SCBS067E
BCT8240A
SN54BCT8240A
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Untitled
Abstract: No abstract text available
Text: TLC5930 SLLS528 – MARCH 2002 12-CHANNEL LED DRIVER DESCRIPTION FEATURES D 0.2-mA to 40-mA Constant-Current Sink D D D D D Drive Capability x 12 Bits Output Count into 24-Pin HTSSOP Package 1024 Gray-Scale Display (PWM Control 1024 Steps) with Max 25-MHz Clock Frequency
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TLC5930
SLLS528
12-CHANNEL
40-mA
24-Pin
25-MHz
TLC5930
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TLC5930
Abstract: TLC5930PWP
Text: TLC5930 SLLS528 – MARCH 2002 12-CHANNEL LED DRIVER FEATURES D 0.2-mA to 40-mA Constant-Current Sink D D D D D DESCRIPTION Drive Capability x 12 Bits Output Count into 24-Pin HTSSOP Package 1024 Gray-Scale Display (PWM Control 1024 Steps) with Max 25-MHz Clock Frequency
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TLC5930
SLLS528
12-CHANNEL
40-mA
24-Pin
25-MHz
TLC5930
TLC5930PWP
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Untitled
Abstract: No abstract text available
Text: TLV990Ć21 3ĆV, 10ĆBIT, 21ĆMSPS AREA CCD ANALOG FRONT END SLAS299A − AUGUST 2000 − REVISED MARCH 2004 features application D Single-Chip CCD Analog Front-End D 10-Bit, 21-MSPS, Single 3-V Supply D D D D D D D 48-Pin TQFP Package STBY RESET CS SDIN SCLK
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TLV99021
10BIT,
21MSPS
SLAS299A
10-Bit,
21-MSPS,
150-mW
36-dB
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Untitled
Abstract: No abstract text available
Text: TLV990Ć21 3ĆV, 10ĆBIT, 21ĆMSPS AREA CCD ANALOG FRONT END SLAS299A − AUGUST 2000 − REVISED MARCH 2004 application features D Digital Still Camera D Video Camcorder D Single-Chip CCD Analog Front-End D 10-Bit, 21-MSPS, Single 3-V Supply D D D D D D D 48-Pin TQFP Package
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TLV990Ä
SLAS299A
10-Bit,
21-MSPS,
48-Pin
150-mW
36-dB
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SN54BCT8244A
Abstract: SN74BCT8244A
Text: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits Functionally Equivalent to SN54/74F244 and SN54/74BCT244 in the Normal
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SN54BCT8244A,
SN74BCT8244A
SCBS042D
SN54/74F244
SN54/74BCT244
752S5
SN54BCT8244A
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74BCT8374
Abstract: D3641 TEX-E wire
Text: SN54BCT8374, SN74BCT8374 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS TI0223— 0 3 6 4 1 , JUNE 1990 SN54BCT8374 IT PACKAGE SN74BCT8374 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE Family of Testability Products TOP VIEW
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SN54BCT8374,
SN74BCT8374
TI0223--
SN54BCT8374
SN74BCT8374
SN54/74F374
SN54/74BCT374
74BCT8374
D3641
TEX-E wire
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