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    STA101 Search Results

    STA101 Result Highlights (2)

    Part ECAD Model Manufacturer Description Download Buy
    SCANSTA101SM/NOPB Texas Instruments Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 Visit Texas Instruments Buy
    SCANSTA101SMX/NOPB Texas Instruments Low Voltage IEEE 1149.1 System Test Access (STA) Master 49-NFBGA -40 to 85 Visit Texas Instruments Buy
    SF Impression Pixel

    STA101 Price and Stock

    Rochester Electronics LLC SCANSTA101SMX-NS

    MICROPROCESSOR CIRCUIT, PBGA49
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    DigiKey SCANSTA101SMX-NS Bulk 6,000 20
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    Rochester Electronics LLC SCANSTA101SM

    MPU CIRCUIT, CMOS, PBGA49
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    DigiKey SCANSTA101SM Tray 2,812 26
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    SCANSTA101SM Bulk 26
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    Texas Instruments SCANSTA101SM

    IC INTERFACE SPECIALIZED 49BGA
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    DigiKey SCANSTA101SM Tray 416
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    Rochester Electronics SCANSTA101SM 2,812 1
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    Texas Instruments SCANSTA101SMX

    IC INTERFACE SPECIALIZED 49BGA
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    DigiKey SCANSTA101SMX Reel 2,000
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    Rochester Electronics SCANSTA101SMX 4,000 1
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    Rochester Electronics LLC SCANSTA101SMX

    MPU CIRCUIT, CMOS, PBGA49
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    DigiKey SCANSTA101SMX Bulk 20
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    STA101 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    Untitled

    Abstract: No abstract text available
    Text: STA101 Low Voltage IEEE 1149.1 STA Master General Description Features The STA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.


    Original     		PDF SCANSTA101 STA101. SCANPSC100. STA101 P1532. ds101215

    LFSR COUNTER

    Abstract: SCANSTA101
    Text: STA101 Low Voltage IEEE 1149.1 STA Master General Description Features The STA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.


    Original     		PDF SCANSTA101 SCANSTA101 STA101. SCANPSC100. STA101 P1532. P1532 80031e09 LFSR COUNTER

    SCANSTA101

    Abstract: SCANSTA101SM SCANSTA101SMX
    Text: STA101 Low Voltage IEEE 1149.1 STA Master General Description Features The STA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.


    Original     		PDF SCANSTA101 SCANSTA101 STA101. SCANPSC100. STA101 SCANSTA101SM SCANSTA101SMX

    SCANSTA101

    Abstract: SCANSTA101SM SCANSTA101SMX
    Text: STA101 Low Voltage IEEE 1149.1 STA Master General Description Features The STA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.


    Original     		PDF SCANSTA101 SCANSTA101 STA101. SCANPSC100. STA101 SCANSTA101SM SCANSTA101SMX

    SCANSTA101

    Abstract: SCANSTA101SM SCANSTA101SMX dual H bridge driver
    Text: STA101 Low Voltage IEEE 1149.1 STA Master General Description Features The STA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.


    Original     		PDF SCANSTA101 SCANSTA101 STA101. SCANPSC100. STA101 SCANSTA101SM SCANSTA101SMX dual H bridge driver

    SCANSTA101

    Abstract: SCANSTA101SM SCANSTA101SMX
    Text: STA101 Low Voltage IEEE 1149.1 STA Master General Description Features The STA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.


    Original     		PDF SCANSTA101 SCANSTA101 STA101. SCANPSC100. STA101 CSP-9-111C2) CSP-9-111S2) CSP-9-111S2. SCANSTA101SM SCANSTA101SMX

    SCANSTA101

    Abstract: SCANSTA101SM SCANSTA101SMX
    Text: STA101 Low Voltage IEEE 1149.1 STA Master General Description Features The STA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.


    Original     		PDF SCANSTA101 SCANSTA101 STA101. SCANPSC100. STA101 SCANSTA101SM SCANSTA101SMX

    BGA package tray 40 x 40

    Abstract: NATIONAL SEMICONDUCTOR MARKING CODE
    Text: STA101 Low Voltage IEEE 1149.1 STA Master General Description Features The STA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.


    Original     		PDF SCANSTA101 STA101. SCANPSC100. STA101 32-bit 9-Aug-2002] BGA package tray 40 x 40 NATIONAL SEMICONDUCTOR MARKING CODE

    Untitled

    Abstract: No abstract text available
    Text: STA101 Low Voltage IEEE 1149.1 STA Master General Description Features The STA101 is designed to function as a test master for a IEEE 1149.1 test system. The minimal requirements to create a tester are a microcomputer uP, RAM/ROM, clock, etc. , SCANEASE r2.0 software, and a STA101.


    Original     		PDF SCANSTA101 STA101. SCANPSC100. STA101

    STA1060

    Abstract: STA0676A SSN1090C STA0798A STA0528A STA0759A STA0761A STA0426A STA0763A STA0970A
    Text: Overview | RF SAW Filters : 139 ~ 999MHz | 1.0 ~ 2.7 GHz | IF SAW Filters : 10 ~ 99 MHz | 100 ~ 999 MHz RF SAW Filters Center Frequency : 1.0 ~ 2.7 Ghz if you want data sheet, please contact Karl (karl@sawtron.com) Product No. Center Freq. Bandwidth Insertion Loss


    Original     		PDF 999MHz STA0477A STA0177A STA0690A STA1014A STA0696A STA0839A STA0404A STA0227A SSN1090C STA1060 STA0676A SSN1090C STA0798A STA0528A STA0759A STA0761A STA0426A STA0763A STA0970A

    GHW Connectors

    Abstract: TDQ38 BTA60 bta61 bta80 bta11 BTA100 BTA32 bta50 bta81
    Text: Version 1.2 December 1999 2975 Stender Way, Santa Clara, California 95054 Telephone: 800 345-7015 • TWX: 910-338-2070 • FAX: (408) 492-8674 Printed in U.S.A. 1999 Integrated Device Technology, Inc. Integrated Device Technology, Inc. reserves the right to make changes to its products or specifications at any time, without notice, in order to improve design or performance


    Original     		PDF

    SCANSTA101

    Abstract: SN74ACT8990 SN74LVT8980 FIRECRON
    Text: National News June 2002 STA101 www.national.com/pf/SC/STA101.html Low Voltage IEEE 1149.1 STA Master STA101 Architecture ADDRESS 4.0 DATA (15:0) CE R/W STB DTACK INT Parallel Processor Interface (PPI) BIST DATA (31:16)* Dual Port Memory OE RST


    Original     		PDF SCANSTA101 com/pf/SC/SCANSTA101 SCANSTA101 BGA-49 SN74ACT8990 SN74LVT8980 FIRECRON

    TDQ38

    Abstract: LTA201 LTA230 a1633 BTA32 B32315 LTA123 LTA143 LTA150 SDQ57
    Text: 7 8 VCC3.3 SYNCOUT tied to SYNCIN through series resistor. Trace length matched to SYSCLK[0:7]/TITAN_CLK 1,14 1,12,14 6,7,12,13,14 1,12,14 1 16 2 15 3 14 4 13 5 12 6 11 7 10 9 8 S2 1 1 1 1 1 1 1 1 BLK_WR1 BLK_WR0 CLK_FREQ2 CLK_FREQ1 CLK_FREQ0 CLKMULT2 CLKMULT1


    Original     		PDF 10KOHM SDQM02 SDQM12 SDQM22 SDQM32 22DQM03 22OHM 17DEVCS31 16DEVCS30 SDQM41 TDQ38 LTA201 LTA230 a1633 BTA32 B32315 LTA123 LTA143 LTA150 SDQ57

    bta61

    Abstract: bta60 TDQ38 GHW Connectors BTA100 LTA201 bta80 bta81 bta40 circuit bta42
    Text: IDT79S145 Evaluation Board Manual Version 1.1 October 1999 2975 Stender Way, Santa Clara, California 95054 Telephone: 800 345-7015 • TWX: 910-338-2070 • FAX: (408) 492-8674 Printed in U.S.A. 1999 Integrated Device Technology, Inc. Integrated Device Technology, Inc. reserves the right to make changes to its products or specifications at any time, without notice, in order to improve design or performance


    Original     		PDF IDT79S145 bta61 bta60 TDQ38 GHW Connectors BTA100 LTA201 bta80 bta81 bta40 circuit bta42

    SCANSTA476

    Abstract: N1 ASIC SCANSTA112 SCANSTA101 SCANSTA111 STA112 CPLD STA101 SIGNAL PATH designer
    Text: SIGNAL PATH designer Tips, tricks, and techniques from the analog signal-path experts No. 117 Feature Article . 1-6 Comms Applications .2 JTAG Advanced Capabilities and System Design — By David Morrill, Principal Applications Engineer


    Original     		PDF

    simple LFSR in built in self test

    Abstract: SCANSTAEVK verilog code 8 bit LFSR vhdl code 16 bit LFSR SCANSTA101 SCANSTA111 SCANSTA112 SCANSTA476 jtag cable Schematic corelis PADS-POWERPCB-V2007
    Text: STA101 STA Master Design Guide 2010 Revision 1.0 Developing a System with Embedded IEEE 1149.1 Boundary-Scan Self-Test national.com/scan Table of Contents Acknowledgements. 4


    Original     		PDF SCANSTA101 simple LFSR in built in self test SCANSTAEVK verilog code 8 bit LFSR vhdl code 16 bit LFSR SCANSTA111 SCANSTA112 SCANSTA476 jtag cable Schematic corelis PADS-POWERPCB-V2007