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    cdf-aec-q100 STRESS TEST QUALIFICATION SPEC

    Abstract: JESD22-A114A A114A AN1181 CDF-AEC-Q100-002
    Text: AN1181 APPLICATION NOTE ELECTROSTATIC DISCHARGE SENSITIVITY MEASUREMENT by Microcontroller Division Applications This application note describes a procedure for determining the susceptibility of microcontroller devices to ESD damage. 1 REFERENCE DOCUMENTS


    Original     		PDF AN1181 OP2614 CDF-AEC-Q100-002 CDF-AEC-Q100-003 cdf-aec-q100 STRESS TEST QUALIFICATION SPEC JESD22-A114A A114A AN1181 CDF-AEC-Q100-002

    CDF-AEC-Q100-003

    Abstract: cdf-aec-q100 STRESS TEST QUALIFICATION SPEC JESD22-A114A cdf-aec-q100-002 STRESS TEST QUALIFICATION SPEC A114A AN1181 CDF-AEC-Q100-002 EDX4702 electrostatic high voltage generator SOP2614
    Text: AN1181 APPLICATION NOTE ELECTROSTATIC DISCHARGE SENSITIVITY MEASUREMENT by Microcontroller Division Applications This application note describes a procedure for determining the susceptibility of microcontroller devices to ESD damage. 1 REFERENCE DOCUMENTS


    Original     		PDF AN1181 OP2614 CDF-AEC-Q100-002 CDF-AEC-Q100-003 CDF-AEC-Q100-003 cdf-aec-q100 STRESS TEST QUALIFICATION SPEC JESD22-A114A cdf-aec-q100-002 STRESS TEST QUALIFICATION SPEC A114A AN1181 CDF-AEC-Q100-002 EDX4702 electrostatic high voltage generator SOP2614