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SCTA056 Abstract: SN74LVT8986 Text: Application Report SCTA056 - November 2002 Cascading Multiple-Linking Addressable-Scan-Port Devices Rakesh N. Joshi and Kenneth L. Williams MPD Digital Products ABSTRACT This application report is intended to illustrate the capability of cascading multiple Texas	Original	PDF	SCTA056 SN74LVT8986
identification trace code texas Abstract: No abstract text available Text: SN54ACT8997, SN74ACT8997 SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 JTAG TAP CONCATENATORS SCAS157D – APRIL 1990 – REVISED DECEMBER 1996 D D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products	Original	PDF	SN54ACT8997, SN74ACT8997 SCAS157D SNJ54ACT8997JT 5962View 9323901QXA identification trace code texas
Untitled Abstract: No abstract text available Text: SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS SCBS164E – AUGUST 1993 – REVISED DECEMBER 1996 D D D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products	Original	PDF	SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A 18-BIT SCBS164E ABTH182502A 5962-9561401QXA SNJ54ABTH18502AHV 5962View
bct8240a Abstract: No abstract text available Text: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This	Original	PDF	SN54BCT8240A, SN74BCT8240A SCBS067E BCT240 SNJ54BCT8240AFK 5962View 9174601Q3A SNJ54BCT8240AJT 9174601QLA bct8240a
Untitled Abstract: No abstract text available Text: SN54ABT8996, SN74ABT8996 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS SCBS489C – AUGUST 1994 – REVISED APRIL 1999 D D D D D D D D 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 A5 A6 A7 A8	Original	PDF	SN54ABT8996, SN74ABT8996 10-BIT SCBS489C
Untitled Abstract: No abstract text available Text: SN74LVT8980AĆEP EMBEDDED TESTĆBUS CONTROLLER IEEE STD 1149.1 JTAG TAP MASTERS WITH 8ĆBIT GENERIC HOST INTERFACES SCBS761A − JUNE 2003 − REVISED OCTOBER 2003 D Controlled Baseline D D D D D D D D D D Flexible TCK Generator Provides − One Assembly/Test Site, One Fabrication	Original	PDF	SN74LVT8980AEP SCBS761A
ABT8996 Abstract: No abstract text available Text: SN74LVT8996ĆEP 3.3ĆV 10ĆBIT ADDRESSABLE SCAN PORT MULTIDROPĆADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVER SCBS764 − SEPTEMBER 2003 D Controlled Baseline D D D D D D D D D D D Simple Addressing (Shadow) Protocol Is − One Assembly/Test Site, One Fabrication	Original	PDF	SN74LVT8996EP 10BIT SCBS764 ABT8996
tms 1035 Abstract: No abstract text available Text: SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999 D D D D D D Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments Widebus Family	Original	PDF	SN54ABT18245A, SN74ABT18245A 18-BIT SCBS110H SNJ54ABT18245AWD 5962View 9460102QXA tms 1035