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    S292P Datasheets Context Search

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    TEMIC K153P

    Abstract: TSHF5471 tfmw5380 dn1328 tdsr5156 dn904 TDSR5153 HS0038 IR sensor TLVD4900 TCDF1910
    Text: Quality and Reliability Report 1997 TEMIC Semiconductors 07.97 Table of Contents TEMIC Quality Policy .1 Quality System .2


    Original     		PDF WN1053 WN1087-18R WN1087-TR1 WN1090 WN1125 WN1142 WN1158-TA WN1165-TR1 WN1170 WN934 TEMIC K153P TSHF5471 tfmw5380 dn1328 tdsr5156 dn904 TDSR5153 HS0038 IR sensor TLVD4900 TCDF1910

    26H4911

    Abstract: S292P 51366SP
    Text: VISHAY Vishay Telefunken Wafer Process Qualification Photo Detector Operating Life Test Description Device Type Duration Sample Size Failures Tamb = 25°C, V R = 5 V, IRA = 1.0 nA S292P 3 lots 2,000 h 150 Tamb = 100°C, V R = 5 V, IRA = 1.0 nA S292P 2,000 h


    OCR Scan     		PDF S292P S292P H4898 26H4911 51366SP

    soundfusion cs4614

    Abstract: 2ch DAC Cirrus CS4297 CS461 CS4614 CS4614-CM MPU-401 sound card Creative sound blaster 4 channel CrystalClear Reference Design
    Text: CS4614 LOGIC P relim inary Product Bulletin CrystalClear SoundFusion ™ PCI Audio Accelerator FEATURES • 255 M IPs SLIMD™ DSP Architecture ■ DirectX™ 5.0 3D Positional A udio ■ Fat Labs A pproved 64-Voice W avetable Synthesis with Effects ■


    OCR Scan     		PDF CS4614 64-Voice ACP11 MPU-401 100-pin DS292PP3 soundfusion cs4614 2ch DAC Cirrus CS4297 CS461 CS4614 CS4614-CM sound card Creative sound blaster 4 channel CrystalClear Reference Design