EEPROM retention testing
Abstract: flash "high temperature data retention" mechanism ANH005 P1005 flash Activation Energy
Text: Hybrid Memory Products Ltd Floating Gate Memory Arrays Retention Issues Introduction This document reviews the nature of Data Retention, and presents approaches to its specification and verification based upon procedures defined in the following IEEE publication:
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P1005
150oC
32LCC)
EEPROM retention testing
flash "high temperature data retention" mechanism
ANH005
flash Activation Energy
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RAMTRON
Abstract: No abstract text available
Text: Application Note Data Retention through Soldering Data retention at very high temperature Overview It is often desirable to program a nonvolatile memory device prior to soldering it onto a circuit board. This requirement may occur when the nonvolatile memory
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256Kb
545-FRAM,
RAMTRON
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Untitled
Abstract: No abstract text available
Text: PRELIMINARY FM25H20 2-Mbit 256 K x 8 Serial (SPI) F-RAM Features Functional Overview • 2-Mbit ferroelectric random access memory (F-RAM) logically organized as 256 K × 8 14 ❐ High-endurance 100 trillion (10 ) read/writes ❐ 151-year data retention (See the Data Retention and
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FM25H20
151-year
FM25H20
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agp connector
Abstract: atx connector agp card atx add-in card mounting bracket pci
Text: ECR #: 48 Title: AGP Card Retention Feature Release Date: 12/14/98 Impact: Change Spec Version: A.G.P. 2.0 Summary: AGP cards require retention in addition to the I/O mounting bracket, which is currently the sole method of retaining the cards. Using only the I/O mounting bracket as the retainer results in
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5-12B:
5-13B:
5-14B:
agp connector
atx connector
agp card
atx add-in card
mounting bracket pci
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Untitled
Abstract: No abstract text available
Text: PRELIMINARY FM25H20 2-Mbit 256 K x 8 Serial (SPI) F-RAM Features Functional Overview • 2-Mbit ferroelectric random access memory (F-RAM) logically organized as 256 K × 8 14 ❐ High-endurance 100 trillion (10 ) read/writes ❐ 151-year data retention (See the Data Retention and Endurance table)
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FM25H20
151-year
FM25H20
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Untitled
Abstract: No abstract text available
Text: FM25CL64B 64-Kbit 8 K x 8 Serial (SPI) F-RAM 64-Kbit (8 K × 8) Serial (SPI) F-RAM Features Functional Overview • 64-Kbit ferroelectric random access memory (F-RAM) logically organized as 8 K × 8 14 ❐ High-endurance 100 trillion (10 ) read/writes ❐ 151-year data retention (See the Data Retention and
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FM25CL64B
64-Kbit
64-Kbit
151-year
FM25CL64B
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Untitled
Abstract: No abstract text available
Text: FM25C160B 16-Kbit 2 K x 8 Serial (SPI) F-RAM 64-Kbit (8 K × 8) Serial (SPI) F-RAM Features Functional Overview • 16-Kbit ferroelectric random access memory (F-RAM) logically organized as 2 K × 8 14 ❐ High-endurance 100 trillion (10 ) read/writes ❐ 151-year data retention (See the Data Retention and
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FM25C160B
16-Kbit
64-Kbit
16-Kbit
151-year
FM25C160B
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Untitled
Abstract: No abstract text available
Text: FM25040B 4-Kbit 512 x 8 Serial (SPI) F-RAM 64-Kbit (8 K × 8) Serial (SPI) F-RAM Features Functional Overview • 4-Kbit ferroelectric random access memory (F-RAM) logically organized as 512 × 8 14 ❐ High-endurance 100 trillion (10 ) read/writes ❐ 151-year data retention (See the Data Retention and
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FM25040B
64-Kbit
151-year
FM25040B
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Untitled
Abstract: No abstract text available
Text: FM25640B 64-Kbit 8 K x 8 Serial (SPI) F-RAM 64-Kbit (8 K × 8) Serial (SPI) F-RAM Features Functional Overview • 64-Kbit ferroelectric random access memory (F-RAM) logically organized as 8 K × 8 14 ❐ High-endurance 100 trillion (10 ) read/writes ❐ 151-year data retention (See the Data Retention and
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FM25640B
64-Kbit
64-Kbit
151-year
FM25640B
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Untitled
Abstract: No abstract text available
Text: FM25040B 4-Kbit 512 x 8 Serial (SPI) F-RAM 64-Kbit (8 K × 8) Serial (SPI) F-RAM Features Functional Overview • 4-Kbit ferroelectric random access memory (F-RAM) logically organized as 512 × 8 14 ❐ High-endurance 100 trillion (10 ) read/writes ❐ 151-year data retention (See the Data Retention and
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FM25040B
64-Kbit
151-year
FM25040B
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Untitled
Abstract: No abstract text available
Text: FM25L04B 4-Kbit 512 x 8 Serial (SPI) F-RAM 64-Kbit (8 K × 8) Serial (SPI) F-RAM Features Functional Overview • 4-Kbit ferroelectric random access memory (F-RAM) logically organized as 512 × 8 14 ❐ High-endurance 100 trillion (10 ) read/writes ❐ 151-year data retention (See the Data Retention and
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FM25L04B
64-Kbit
151-year
FM25L04B
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Untitled
Abstract: No abstract text available
Text: FM25L16B 16-Kbit 2 K x 8 Serial (SPI) F-RAM 16-Kbit (2 K × 8) Serial (SPI) F-RAM Features Functional Overview • 16-Kbit ferroelectric random access memory (F-RAM) logically organized as 2 K × 8 14 ❐ High-endurance 100 trillion (10 ) read/writes ❐ 151-year data retention (See the Data Retention and
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FM25L16B
16-Kbit
16-Kbit
151-year
FM25L16B
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BD3X
Abstract: ST1305 ST1331 ST1333 ST1335 ST1336
Text: ST1331 ST1333 ST1335 ST1336 HIGH ENDURANCE CMOS 272 Bit EEPROM WITH STATE OF THE ART SECURITY MECHANISMS BRIEF DATA • ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ SINGLE 5 VOLTS POWER SUPPLY HIGHLY RELIABLE CMOS EEPROM TECHNOLOGY: • 10 years data retention
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ST1331
ST1333
ST1335
ST1336
ST1333/
ST1331/36)
3276cs.
BD3X
ST1305
ST1333
ST1336
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BD3X
Abstract: sk 192
Text: ST1331 ST1333 ST1335 ST1336 HIGH ENDURANCE CMOS 272 Bit EEPROM WITH STATE OF THE ART SECURITY MECHANISMS BRIEF DATA • ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ SINGLE 5 VOLTS POWER SUPPLY HIGHLY RELIABLE CMOS EEPROM TECHNOLOGY: • 10 years data retention
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ST1331
ST1333
ST1335
ST1336
ST1333/
ST1331/36)
BD3X
sk 192
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Gunn Diode symbol
Abstract: cy202 CY7C190 WSP-109BMP3 pal22V10D cy7b166 cy7c291 CY7C371 EV film cap calculation gunn diode datasheet
Text: CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY APPENDIX A: FAILURE RATE CALCULATION Thermal Acceleration Factors Acceleration factors AF for thermal stresses (High Temperature Operating Life, Data Retention and High Temperature Steady State Life) are calculated from the Arrhenius equation.
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62x10-5
Gunn Diode symbol
cy202
CY7C190
WSP-109BMP3
pal22V10D
cy7b166
cy7c291
CY7C371
EV film cap calculation
gunn diode datasheet
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FM25640-GTR
Abstract: AEC-Q100 FM25040 FM25640 FM25640-G FM25640-S
Text: FM25640 64Kb FRAM Serial Memory Features 64K bit Ferroelectric Nonvolatile RAM • Organized as 8,192 x 8 bits • High Endurance 1 Trillion 1012 Read/Writes • 45 Year Data Retention • NoDelay Writes • Advanced high-reliability ferroelectric process
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FM25640
FM25640
64-kilobit
AEC-Q100
FM25640B.
FM25640-GTR
AEC-Q100
FM25040
FM25640-G
FM25640-S
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FM25160
Abstract: FM25C160 FM25C160-S
Text: FM25C160 16Kb FRAM Serial Memory Features 16K bit Ferroelectric Nonvolatile RAM • Organized as 2,048 x 8 bits • High Endurance 1 Trillion 1012 Read/Writes • 10 year Data Retention • NoDelay Writes • Advanced High-Reliability Ferroelectric Process
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FM25C160
FM25C160
16-kilobit
MS-012
FM25160
FM25C160-S
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FM25W256
Abstract: FM25W256-G FM25W256-S
Text: Preliminary FM25W256 256Kb FRAM Wide Voltage Serial Memory Features 256K bit Ferroelectric Nonvolatile RAM • Organized as 32,768 x 8 bits • Unlimited Read/Write Cycles • 10 Year Data Retention • NoDelay Writes • Advanced High-Reliability Ferroelectric Process
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FM25W256
256Kb
FM25W256
256-kilobit
FM25W256,
FM25W256-S
A40003S
RIC0439
150uA.
FM25W256-G
FM25W256-S
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FM25640-S
Abstract: FM25040 FM25640 FM25640-G
Text: FM25640 64Kb FRAM Serial Memory Features 64K bit Ferroelectric Nonvolatile RAM • Organized as 8,192 x 8 bits • High Endurance 1 Trillion 1012 Read/Writes • 45 Year Data Retention • NoDelay Writes • Advanced high-reliability ferroelectric process
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FM25640
FM25640
64-kilobit
FM25640-S
A40003S
RIC0439
FM25640-S
FM25040
FM25640-G
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FM25256B-G
Abstract: FM25256B
Text: FM25256B 256Kb FRAM Serial 5V Memory Features 256K bit Ferroelectric Nonvolatile RAM • Organized as 32,768 x 8 bits • Virtually Unlimited Endurance 1014 Cycles • 10 Year Data Retention • NoDelay Writes • Advanced High-Reliability Ferroelectric Process
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FM25256B
256Kb
FM25256B
256-kilobit
MS-012
FM25256B,
FM25256B-G
B70003G
RIC0639
FM25256B-G
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Untitled
Abstract: No abstract text available
Text: Preliminary FM25L512 512Kb FRAM Serial 3V Memory Features 512K bit Ferroelectric Nonvolatile RAM • Organized as 65,536 x 8 bits • Unlimited Read/Write Cycles • 10 Year Data Retention • NoDelay Writes • Advanced High-Reliability Ferroelectric Process
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FM25L512
512Kb
FM25L512,
RG5L51
40MHz
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Untitled
Abstract: No abstract text available
Text: Pre-Production FM25L16 16Kb FRAM Serial 3V Memory Features 16K bit Ferroelectric Nonvolatile RAM • Organized as 2,048 x 8 bits • Unlimited Read/Write Cycles • 45 Year Data Retention • NoDelay Writes • Advanced High-Reliability Ferroelectric Process
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FM25L16
FM25L16,
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FM25CL64BG
Abstract: r5l64B FM25L64B fm25cl64b-g FM25CL64B-GTR fm25l64
Text: FM25CL64B 64Kb Serial 3V F-RAM Memory Features 64K bit Ferroelectric Nonvolatile RAM Organized as 8,192 x 8 bits High Endurance 100 Trillion 1014 Read/Writes 38 Year Data Retention (@ +75ºC) NoDelay Writes Advanced High-Reliability Ferroelectric Process
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FM25CL64B
FM25CL64B
64-kilobit
FM25CL64BG
r5l64B
FM25L64B
fm25cl64b-g
FM25CL64B-GTR
fm25l64
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Untitled
Abstract: No abstract text available
Text: ST1331 ST1333 ST1335 ST1336 SGS-THOMSON m HIGH ENDURANCE CMOS 272 Bit EEPROM WITH STATE OF THE ART SECURITY MECHANISMS BRIEF DATA Figure 1 Delivery forms SINGLE 5 VOLTS POWER SUPPLY HIGHLY RELIABLE CMOS EEPROM TECHNOLOGY: • 10 years data retention • 1 Million Erase/Write cycles endurance
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OCR Scan
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ST1331
ST1333
ST1335
ST1336
ST1333/
ST1331/36)
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