Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    RESEARCH PAPER AND GATE Search Results

    RESEARCH PAPER AND GATE Result Highlights (6)

    Part ECAD Model Manufacturer Description Download Buy
    TB67H481FTG Toshiba Electronic Devices & Storage Corporation Stepping and Brushed Motor Driver /Bipolar Type / Vout(V)=50 / Iout(A)=3.0 / IN input type / VQFN32 Visit Toshiba Electronic Devices & Storage Corporation
    TLP5702H Toshiba Electronic Devices & Storage Corporation Photocoupler (Gate Driver Coupler), High-Topr / IGBT driver, 5000 Vrms, SO6L Visit Toshiba Electronic Devices & Storage Corporation
    TLP5705H Toshiba Electronic Devices & Storage Corporation Photocoupler (Gate Driver Coupler), High-Topr / IGBT driver, 5000 Vrms, SO6L Visit Toshiba Electronic Devices & Storage Corporation
    7UL2T125FK Toshiba Electronic Devices & Storage Corporation One-Gate Logic(L-MOS), Buffer, SOT-765 (US8), -40 to 85 degC Visit Toshiba Electronic Devices & Storage Corporation
    7UL2T126FK Toshiba Electronic Devices & Storage Corporation One-Gate Logic(L-MOS), Buffer, SOT-765 (US8), -40 to 85 degC Visit Toshiba Electronic Devices & Storage Corporation
    7UL1G07FU Toshiba Electronic Devices & Storage Corporation One-Gate Logic(L-MOS), Non-Inverter Buffer (Open Drain), USV, -40 to 85 degC Visit Toshiba Electronic Devices & Storage Corporation

    RESEARCH PAPER AND GATE Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    Application of dsp in military science

    Abstract: TILE64 radar sensor specification Raytheon Company
    Text: White Paper Assessing FPGA DSP Benchmarks at 40 nm Introduction Benchmarking the performance of algorithms, devices, and programming methodologies is a well-worn topic among developers and research of high-performance computing appliances. Independent and partisan benchmark results are


    Original     		PDF

    LIN VHDL source code

    Abstract: leon3 AC97 SD-Card holders leon3 processor vhdl vhdl code 7 segment display fpga
    Text: White Paper SEmulation: Turbocharging the FPGA Development Process Introduction With the SEmulator , Gleichmann Electronics Research introduces a new method of FPGA/ASIC design, which promise shorter development times and higher design security at a lower cost. With complex processor systems,


    Original     		PDF

    SGCT

    Abstract: mitsubishi SGCT sGCT function WESTINGHOUSE ELECTRIC scr topologies pulse transformer driver IGBT APPLICATION westinghouse power rectifiers international rectifier GTO WESTINGHOUSE RECTIFIERS GTO thyristor 3000V 800A GTO thyristor driver
    Text: 896 IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, VOL. 37, NO. 3, MAY/JUNE 2001 A New Current-Source Converter Using a Symmetric Gate-Commutated Thyristor SGCT Navid R. Zargari, Member, IEEE, Steven C. Rizzo, Member, IEEE, Yuan Xiao, Associate Member, IEEE,


    Original     		PDF

    JR 200 RF TRANSMITTER

    Abstract: IRIG modulator 2 Watt S-Band Power Amplifier ballistic sensor research paper on wireless peak detector s-band datasheet 100 watt fm transmitter l-band 60 watt transistor 5 Watt S-Band Power Amplifier 300 watts amplifier s-band
    Text: A TRANSMITTER CHIP SET FOR WIRELESS TELEMETRY APPLICATIONS 2001 International Telemetry Conference Karina Osgood Lawrence W. Burke Jr. Andy Moysenko Amy Webb M/A-COM, Inc. Dennis Schneider Ronald Colangelo U.S. Army Simulation, Training & Instrumentation Command (STRICOM)


    Original     		PDF ARL-TR-1206, JR 200 RF TRANSMITTER IRIG modulator 2 Watt S-Band Power Amplifier ballistic sensor research paper on wireless peak detector s-band datasheet 100 watt fm transmitter l-band 60 watt transistor 5 Watt S-Band Power Amplifier 300 watts amplifier s-band

    IRIG modulator

    Abstract: ballistic sensor 100 watt fm transmitter Wireless telemetry s-band 50 Watt power amplifier 1 transistor fm transmitter 5 watt abstract for fm transmitter two stage IRIG block diagram of telemetry system JR 200 RF TRANSMITTER
    Text: A TRANSMITTER CHIP SET FOR WIRELESS TELEMETRY APPLICATIONS Karina Osgood Lawrence W. Burke Jr. Andy Moysenko Amy Webb M/A-COM, Inc. Dennis Schneider Ronald Colangelo U.S. Army Simulation, Training & Instrumentation Command STRICOM Kenneth McMullen Robert Wert


    Original     		PDF ARL-TR-1206, IRIG modulator ballistic sensor 100 watt fm transmitter Wireless telemetry s-band 50 Watt power amplifier 1 transistor fm transmitter 5 watt abstract for fm transmitter two stage IRIG block diagram of telemetry system JR 200 RF TRANSMITTER

    BSI CMOS image sensor

    Abstract: FillFactory cmos transistor 0.35 um FillFactory cmos sensor KTC AL cmos sensor abstract 3E-07 2P3M
    Text: Brain slice imaging A 100x100 pixel CIS combining 40K frames per second and 14 bit dynamic range Tom Walschap * , Danny Scheffer * , F. Kubo * and M. Ichikawa * * FillFactory, Schaliënhoevedreef 20B, 2800 Mechelen, Belgium Tel: +32 – 0 15-446353, fax: +32 – (0)15-446344


    Original     		PDF 100x100 BSI CMOS image sensor FillFactory cmos transistor 0.35 um FillFactory cmos sensor KTC AL cmos sensor abstract 3E-07 2P3M

    hot electron devices

    Abstract: igfet sonos SST superflash Dual-Gate Mosfet electric field permittivity DSASW0037374 superflash sst
    Text: IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 50, NO. 3, MARCH 2003 809 An Analytical Model for Optimization of Programming Efficiency and Uniformity of Split Gate Source-Side Injection Superflash Memory Huinan Guan, Member, IEEE, Dana Lee, Member, IEEE, and G. P. Li


    Original     		PDF

    IRIG 106

    Abstract: Wireless telemetry IRIG MMIC POWER AMPLIFIER S-BAND 2W rf transmiter circuit image ARL-TR-1206 MMIC AMPLIFIER S-BAND 2W IRIG amplitude "silicon on sapphire" block diagram telemetry
    Text: OPTIMIZATION OF A MINATURE TRANSMITTER MODULE FOR WIRELESS TELEMETRY APPLICATIONS Karina Osgood Larry Burke Amy Webb John Muir Christina Dearstine Anthony Quaglietta M/A-COM, Inc. ABSTRACT M/A-COM, Inc. has previously developed a highly integrated transmitter chip set for wireless telemetry


    Original     		PDF ARL-TR-1206, IRIG 106 Wireless telemetry IRIG MMIC POWER AMPLIFIER S-BAND 2W rf transmiter circuit image ARL-TR-1206 MMIC AMPLIFIER S-BAND 2W IRIG amplitude "silicon on sapphire" block diagram telemetry

    LQ9D011

    Abstract: LQ9D01 red and blue stripe diode HCFT V by one sharp TFT LQ9D sharp TFT LCD tv driver
    Text: Liquid Crystal Displays LCD Application Note AN EXAMINATION OF ACTIVE MATRIX TECHNOLOGIES AND COMPONENTS Harry Miller, Field Applications Engineer OBJECTIVE The purpose of this paper is to examine the different active matrix technologies and review the theory behind the different technologies because breakthroughs in the different technologies are happening


    Original     		PDF 2613-banchi, J63428 SMT92021 LQ9D011 LQ9D01 red and blue stripe diode HCFT V by one sharp TFT LQ9D sharp TFT LCD tv driver

    Untitled

    Abstract: No abstract text available
    Text: OFFLINE GATE DRIVE TRANSFORMERS UL and C-UL recognized, TÜV approved components 3000 Vrms gate to drive winding test Useful operating frequency from 50 kHz to 500 kHz Most popular winding configurations Electrical Specifications @ 25°C — Operating Temperature -40°C to 130°C


    Original     		PDF P0584 P0585

    C227p

    Abstract: C227
    Text: RF TRANSFORMER For Wideband RF Applications For single-ended to balanced applications Value-oriented construction Miniature surface mount package Excellent insertion loss Designed for CATV Distribution/Drop Amplifiers, Set Top Boxes and Home Gateways Electrical Specifications @ 25°C — Operating Temperature -40°C to +85°C


    Original     		PDF CX2072 C227p C227

    P507A

    Abstract: pe-63387
    Text: MOSFET GATE DRIVE TRANSFORMERS International safety construction, VDE approved 3750 VRMS gate to drive winding test V DE Useful operating frequency from 20 kHz to 100 kHz Electrical Specifications @ 25°C — Operating Temperature 0°C to 70°C Part Number


    Original     		PDF PE-63385 PE-63387* PE-63386 PE-63388 1446C) P507A pe-63387

    Untitled

    Abstract: No abstract text available
    Text: 8818.102SAG.WP.MM05 2/18/99 11:12 AM Page 2 Table 1. Network Server Appliances Sample uses File serving, caching, proxy serving, gateways, load balancing, firewalls, e-mail Memory Fostering Innovation and Growth Typically large, such as 64MB with addressability of 4GB or greater


    Original     		PDF 100MB

    Untitled

    Abstract: No abstract text available
    Text: OFFLINE GATE DRIVE TRANSFORMERS UL and C-UL recognized, TÜV approved components 3000 Vrms gate to drive winding test Useful operating frequency from 50 kHz to 500 kHz Most popular winding configurations Electrical Specifications @ 25°C — Operating Temperature -40°C to 130°C


    Original     		PDF P0584 P0585

    PE-68386

    Abstract: p0544 transformer P0544 p0926 KT 926 PE68386 drive transformers KT 100 tube
    Text: DC/DC SURFACE MOUNT GATE DRIVE TRANSFORMERS For SELV Operation Low profile, small footprint 1500 Vdc isolation between gate and drive Designed to operate between 50 KHz and 500 KHz Electrical Specifications @ 25°C — Operating Temperature -30°C to 130°C


    Original     		PDF PE-68386 P0926 P0544 PE-68386 p0544 transformer P0544 p0926 KT 926 PE68386 drive transformers KT 100 tube

    13b1 zener

    Abstract: laptop display cross reference LQ9D011 sharp crt HCFT nAN YA LCD Sharp Memory LCDs 13B1 V by one sharp TFT sharp lcd cross reference
    Text: LCD Application Note Liquid Crystal Displays AN EXAMINATION OF ACTIVE MATRIX TECHNOLOGIES AND COMPONENTS OBJECTIVE The purpose of this paper is to examine the different active matrix technologies and review the theory behind the different technologies because breakthroughs in the different technologies are happening


    Original     		PDF SMT92021 13b1 zener laptop display cross reference LQ9D011 sharp crt HCFT nAN YA LCD Sharp Memory LCDs 13B1 V by one sharp TFT sharp lcd cross reference

    Untitled

    Abstract: No abstract text available
    Text: THT CURRENT SENSE TRANSFORMERS UL/C-UL recognized components 3000 Vrms gate to drive winding test Useful operating frequency from 50 kHz to 500 kHz Most popular winding configurations Electrical Specifications @ 25°C — Operating Temperature -40°C to 130°C


    Original     		PDF P0581 P0582 P0583

    usb flash drive circuit diagram sandisk

    Abstract: research paper on wireless usb 3.0 vhdl code for ECC encryption SAMSUNG NAND FLASH TRANSLATION LAYER FTL SAMSUNG NAND FLASH TRANSLATION LAYER suyin camera SUYIN Connector usb USB, Card Reader Audio player circuit sandisk mmc 16MB Micron 32MB NOR FLASH
    Text: SmartMedia White Paper Technology and Market Forecast January, 2000 For more information Young Ju KANG Email : JUDY@sec.samsung.com SmartMedia™ White Paper 2000 (c) Samsung Electronics Co.Ltd. I.


    Original     		PDF 15-micron 256Mb 512Mb usb flash drive circuit diagram sandisk research paper on wireless usb 3.0 vhdl code for ECC encryption SAMSUNG NAND FLASH TRANSLATION LAYER FTL SAMSUNG NAND FLASH TRANSLATION LAYER suyin camera SUYIN Connector usb USB, Card Reader Audio player circuit sandisk mmc 16MB Micron 32MB NOR FLASH

    westinghouse transistors

    Abstract: No abstract text available
    Text: IEEE TRANSACTIONS ON ELECTRON DEVICES, VOL. 55, NO. 8, AUGUST 2008 1807 A 10-kV Large-Area 4H-SiC Power DMOSFET With Stable Subthreshold Behavior Independent of Temperature Robert S. Howell, Member, IEEE, Steven Buchoff, Stephen Van Campen, Member, IEEE, Ty R. McNutt, Member, IEEE, Andris Ezis, Senior Member, IEEE, Bettina Nechay, Member, IEEE,


    Original     		PDF 10-kV westinghouse transistors

    lm328

    Abstract: lm328 datasheet cmos testing abstract 8 pin LM328 ic HS9-139RH SMD 5962-98613 pin out of lm328 LM139 user acceptance DIELECTRICALLY ISOLATED INTERSIL BIPOLAR
    Text: Low Dose Rate Testing of the Intersil HS9-139RH quad comparator April 2006 Nick van Vonno Intersil Corporation Abstract: This document provides a brief introduction to low dose rate effects including discussion of Intersil’s approach to testing and qualification issues. We then report


    Original     		PDF HS9-139RH 100krad Cobalt-60 lm328 lm328 datasheet cmos testing abstract 8 pin LM328 ic SMD 5962-98613 pin out of lm328 LM139 user acceptance DIELECTRICALLY ISOLATED INTERSIL BIPOLAR

    reliability

    Abstract: symposium research paper and gate
    Text: a ADI Reliability Handbook Analog Devices presents many papers on quality and reliability at technical conferences, and publishes articles in many technical journals. Following is a list of some of the papers presented at these conferences. At the 1995 IEEE


    Original     		PDF

    papers

    Abstract: conference system hyundai panel 10 Ronics Ronics Technology springer TOSHIBA flash memory yoshikawa national semiconductor "flash memory" ATM machine
    Text: NVSMW 2000 General Chairman Mike Fliesler Advanced Micro Devices, USA Technical Chairman Financial Chairman Arthur Wang Krishna Parat Hyundai Microelectronics, USA Intel, USA Workshop Administrators Tonya Johnson Hyundai Microelectronics, USA Sunday, February 13 ‘2000


    Original     		PDF 9-11AM, 30-2PM 30-10PM, 30-12PM, 12noon-2PM papers conference system hyundai panel 10 Ronics Ronics Technology springer TOSHIBA flash memory yoshikawa national semiconductor "flash memory" ATM machine

    Mextram

    Abstract: GP 004 DIODE 101C 220H 320H PNP TRANSISTor experiments transistor XM
    Text: Paper 9.3 Experience with the New Com pact M E X T R A M M odel for Bipolar Transistors H.C. de GraafF, W.J. Kloosterman, J.A.M. Geelen and M.C.A.M. Koolen Philips Research Laboratories P.O. Box 80000 5600 JA Eindhoven, The Netherlands A bstract Here Qte and Qtc are the emitter and collector de­


    OCR Scan     		PDF ED-32, Mextram GP 004 DIODE 101C 220H 320H PNP TRANSISTor experiments transistor XM

    lm 7803

    Abstract: BT 815 transistor 32nm matching p735 AL 5052 MD8253A bsim3 model BSIM
    Text: Gate current: Modeling, AL extraction and impact on RF performance R. van Langevelde, A.J. Schölten, R. Duffy*, F.N. Cubaynes*, M.J. Knitel and D.B.M. Klaassen Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands Phone: +31-40-2742418; Fax: +31-40-2744113; E-mail: ronald.van.langevelde@philips.com


    OCR Scan     		PDF B-3001 net/1999 292-IEDM lm 7803 BT 815 transistor 32nm matching p735 AL 5052 MD8253A bsim3 model BSIM