REPORT Search Results

REPORT Result Highlights (5)

Part	Manufacturer	Description
DRV8872DDARQ1	Texas Instruments	Automotive 3.6A Brushed DC Motor Driver With Fault Reporting 8-SO PowerPAD -40 to 125
DRV8872DDAR	Texas Instruments	3.6A Brushed DC Motor Driver With Fault Reporting (PWM Ctrl) 8-SO PowerPAD -40 to 125
DRV8872DDA	Texas Instruments	3.6A Brushed DC Motor Driver With Fault Reporting (PWM Ctrl) 8-SO PowerPAD -40 to 125
TPS2013APWP	Texas Instruments	2.6A, 2.7 to 5.5V Single High-Side MOSFET Switch IC, No Fault Reporting, Active-Low Enable 14-HTSSOP -40 to 85
TPS2015D	Texas Instruments	1.1A, 4-5.5V Single Hi-Side MOSFET, Fault Report, Act-Low Enable 8-SOIC

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Fluke Corporation IEEE519-REPORT SOFTWARE LICENSE FOR IEEE519 REP
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REPORT Datasheets (1)

Part	ECAD Model	Manufacturer	Description	Curated	Datasheet Type	PDF
Report		Advanced Micro Devices	Lead (Pb)-Free Packaging Strategy 2000-2003		Original	PDF

REPORT Datasheets Context Search

Catalog Datasheet	MFG & Type	PDF	Document Tags
Untitled Abstract: No abstract text available Text: TPS2330, TPS2331 SINGLE HOT SWAP POWER CONTROLLER WITH CIRCUIT BREAKER AND POWER-GOOD REPORTING SLVS277 – MARCH 2000 features D D D D D D D D D D D OR PW PACKAGE TOP VIEW Single-Channel High-Side MOSFET Driver Input Voltage: 3 V to 13 V Inrush Current Limiting With dv/dt Control	Original	PDF	TPS2330, TPS2331 SLVS277 14-Pin
HTGB Abstract: No abstract text available Text: AOS Semiconductor Product Reliability Report AO3404/AO3404L, rev C Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: 408 830-9742 www.aosmd.com Feb 16, 2006 1 This AOS product reliability report summarizes the qualification result for AO3404. Accelerated	Original	PDF	AO3404/AO3404L, AO3404. AO3404 10-5eV/ Mil-Std-105D HTGB
AO3404AL Abstract: No abstract text available Text: AOS Semiconductor Product Reliability Report AO3404A/AO3404AL, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: 408 830-9742 www.aosmd.com May 28, 2008 1 This AOS product reliability report summarizes the qualification result for AO3404A. Accelerated	Original	PDF	AO3404A/AO3404AL, AO3404A. AO3404A Mil-Std-105D AO3404AL
DS2788 Abstract: Maxim DS2745 Text: 1/9/2008 PRODUCT RELIABILITY REPORT FOR DS2745, Rev A2 Maxim Integrated Products 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Maxim Integrated Products 4401 South Beltwood Pkwy. Dallas, TX 75244-3292	Original	PDF	DS2745, DS2784 QJ714637A QJ738201B DS2788 Maxim DS2745
LT8582 Abstract: 1210 QFN LT3571 SOT 1122 LT3742 Text: Reliability Data Report Product Family R530 LT1912/13/38/39 LT3480/81/82/87/89 LT3493/94/95 LT3500/02/03/04/05/07/08/09 LT3511/12/13 LT3571/72/73/74/75/79/80/81/85/87 LT3645/53/63/80/81/82/84/85/86/88/89 LT3690/92/93/94/95 LT3742/45/48/51/57/58/59 LT3798/99	Original	PDF	LT1912/13/38/39 LT3480/81/82/87/89 LT3493/94/95 LT3500/02/03/04/05/07/08/09 LT3511/12/13 LT3571/72/73/74/75/79/80/81/85/87 LT3645/53/63/80/81/82/84/85/86/88/89 LT3690/92/93/94/95 LT3742/45/48/51/57/58/59 LT3798/99 LT8582 1210 QFN LT3571 SOT 1122 LT3742
AO4800B Abstract: No abstract text available Text: AOS Semiconductor Product Reliability Report AO4800B/AO4800BL, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: 408 830-9742 www.aosmd.com Oct 15, 2007 1 This AOS product reliability report summarizes the qualification result for AO4800B. Accelerated	Original	PDF	AO4800B/AO4800BL, AO4800B. AO4800B 10-5eV Mil-Std-105D
QMI519 Abstract: JESD 85 Text: AOS Semiconductor Product Reliability Report AOZ8211DI-03, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com 1 This AOS product reliability report summarizes the qualification result for AOZ8211DI-03. Review of the electrical test results confirm that AOZ8211DI-03 pass AOS quality and reliability	Original	PDF	AOZ8211DI-03, AOZ8211DI-03. AOZ8211DI-03 17x77x168 16x77x500) 10-5eV QMI519 JESD 85
quality and reliability report Abstract: No abstract text available Text: MAX1231 RELIABILITY REPORT FOR MAX1231BEEG+ PLASTIC ENCAPSULATED DEVICES July 8, 2011 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Sokhom Chum Quality Assurance Reliability Engineer Maxim Integrated Products. All rights reserved.	Original	PDF	MAX1231 MAX1231BEEG+ MAX1231 SMP1DA052W AC19-1 /-2500V JESD22-A114. /-250mA JESD78. quality and reliability report
SEC540 Abstract: No abstract text available Text: AOS Semiconductor Product Reliability Report AO3435/AO3435L, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: 408 830-9742 www.aosmd.com 1 This AOS product reliability report summarizes the qualification result for AO3435. Accelerated	Original	PDF	AO3435/AO3435L, AO3435. AO3435 108hrs 3x164) SEC540
TSMC 0.18um Abstract: No abstract text available Text: 11/15/2010 PRODUCT RELIABILITY REPORT FOR MAXQ613, Rev B1 Maxim Integrated Products 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Don Lipps Manager, Reliability Engineering Maxim Integrated Products 4401 South Beltwood Pkwy. Dallas, TX 75244-3292	Original	PDF	MAXQ613, DS34S132 DS26514 MAXQ61C QX108235A QZ106781AB QJ101861CH TSMC 0.18um
56800E Abstract: 56F8300 56F8347 MC56F8347E Text: Freescale Semiconductor MC56F8347E Rev. 8, 07/2010 56F8347 Preliminary Chip Errata 56F8347 Digital Signal Controller This document reports errata information on chip revision C. Errata numbers are in the form n.m, where n is the number of the errata item and m identifies the document revision number.	Original	PDF	MC56F8347E 56F8347 56F8347 56800E 56F8300 MC56F8347E
MC9S08QB8 Abstract: 0M80N Text: Freescale Semiconductor Mask Set Errata MSE9S08QB8_0M80N Rev. 1, 5/2010 Mask Set Errata for Mask 0M80N Introduction This report applies to mask 0M80N for these products: • MC9S08QB8 • MC9S08QB4 SE184-FLVD-STOP3: False low voltage detect when exiting stop3	Original	PDF	MSE9S08QB8 0M80N 0M80N MC9S08QB8 MC9S08QB4 SE184-FLVD-STOP3: MC9S08QB8
6948 Abstract: MAX3950 MAX3950EGK Text: MAX3950EGK Rev. A RELIABILITY REPORT FOR MAX3950EGK PLASTIC ENCAPSULATED DEVICES October 14, 2003 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Written by Reviewed by Jim Pedicord Quality Assurance Reliability Lab Manager Bryan J. Preeshl	Original	PDF	MAX3950EGK MAX3950 100pf 6948 MAX3950EGK
dyna image Abstract: cisco 2901 Vishay quality iso certificate 2901 cisco power supply cisco 891 smd 504 diod "dyna image" melf 777 ISO 9001 Sony oracle Text: United States SECURITIES AND EXCHANGE COMMISSION Washington, D.C. 20549 FORM 10-K [ X ] ANNUAL REPORT PURSUANT TO SECTION 13 OR 15 d OF THE SECURITIES EXCHANGE ACT OF 1934 [FEE REQUIRED] For the fiscal year ended December 31, 2000. Or [ ] TRANSITION REPORT PURSUANT TO SECTION 13 OR 15(d) OF	Original	PDF

TPS2300 Abstract: TPS2300IPW TPS2301 TPS2301IPW TPS2310IPW TPS2311IPW TPS2320IPW TPS2330IPW Text: TPS2300, TPS2301 DUAL HOT SWAP POWER CONTROLLERS WITH INDEPENDENT CIRCUIT BREAKER AND POWER-GOOD REPORTING SLVS265D – FEBRUARY 2000 – REVISED MARCH 2001 PW PACKAGE TOP VIEW features D D D D D D D D D D Dual-Channel High-Side MOSFET Drivers 1 20 DISCH1	Original	PDF	TPS2300, TPS2301 SLVS265D TPS2300 TPS2300IPW TPS2301 TPS2301IPW TPS2310IPW TPS2311IPW TPS2320IPW TPS2330IPW
TPS2300IPW Abstract: TPS2301IPW TPS2310 TPS2310IPW TPS2311 TPS2311IPW TPS2320IPW TPS2330IPW Text: TPS2310, TPS2311 DUAL HOT SWAP POWER CONTROLLERS WITH INTERDEPENDENT CIRCUIT BREAKER AND POWER-GOOD REPORTING SLVS275D – FEBRUARY 2000 – REVISED MARCH 2001 PW PACKAGE TOP VIEW features D D D D D D D D D D Dual-Channel High-Side MOSFET Drivers 1 20 DISCH1	Original	PDF	TPS2310, TPS2311 SLVS275D TPS2300IPW TPS2301IPW TPS2310 TPS2310IPW TPS2311 TPS2311IPW TPS2320IPW TPS2330IPW
TMS320 Abstract: TMS320C17 TMS370 Text: TMS320C17 and TMS370C010 Serial Interface APPLICATION REPORT: SPRA391 Wallace Anderson Computer Science Center Dallas, TX Peter Robinson Regional Technology Center Waltham, Massachusette Tim Settle Automotive Applications Carmel, Indiana Texas Instruments	Original	PDF	TMS320C17 TMS370C010 SPRA391 TMS320 TMS370
SEMKO Abstract: No abstract text available Text: MINIA TURE FUSEHOLDERS INIATURE Holder / No. 862 WICKMANN PC Mount, Shocksafe 5x20mm / 6.3x32mm Fuses 45 + 0,5 12,4 + 0,2 max. 5 6,35 min. 11,5 5 6,2 17,8 15,24 VDE Horizontal / 2-Pin Mounting Stud 1,3 +0,1 IEC 60127-6 UL 512 CSA C22.2. No.39 VDE: Report No. 136720 ÜG	Original	PDF	5x20mm 3x32mm E70164 com/products/862 5x20mm 3x32mm SEMKO
Architecture of TMS320C54XX Abstract: data addressing modes of TMS320C54xx digital TLV2772 STK 3 channel amp STK 5 channel amp STK power amplifier module overview C5402 TLV2272 TLV2544 TLV2548 Text: Application Report SLAA093A - October 2000 Interfacing the TLV2544/TLV2548 ADC to the TMS320C5402 DSP Lijoy Philipose AAP Data Conversion ABSTRACT This application report presents a hardware and software solution for interfacing the TLV2544/TLV2548 12-bit, 200-ksps, 4/8-channel, low-power, serial analog-to-digital converters to the	Original	PDF	SLAA093A TLV2544/TLV2548 TMS320C5402 12-bit, 200-ksps, 16-bit Architecture of TMS320C54XX data addressing modes of TMS320C54xx digital TLV2772 STK 3 channel amp STK 5 channel amp STK power amplifier module overview C5402 TLV2272 TLV2544 TLV2548
QMI 509 epoxy Abstract: SUMITOMO eme-6600hr 6600HR SOJ package MSL QMI 509 epoxy datasheet CY7C63001A-SC JESD22 EME6600HR mold compound EME 6600HR Text: Cypress Semiconductor Package Qualification Report QTP# 023401 VERSION 2.0 GI July, 2004 32-lead SOIC package using Sumitomo EME 6600HR Mold Compound, MSL1 Cypress Philippines CML-R CYPRESS TECHNICAL CONTACT FOR QUALIFICATION DATA: Mira Ben-Tzur Principal Reliability Engineer	Original	PDF	32-lead 6600HR 28-44lead 635mils 01BLL-SI 610221877M CY62128BLL-SI QMI 509 epoxy SUMITOMO eme-6600hr SOJ package MSL QMI 509 epoxy datasheet CY7C63001A-SC JESD22 EME6600HR mold compound EME 6600HR
jesd22-a108B Abstract: JESD22-A108-B JESD22-A104B S510067 JESD22-A114 JESD78 Text: Reliability Qualification Report S510065-55Z - RoHS Compliant Products Qualified by Similarity S510067-55Z The information provided herein is believed to be reliable at press time. Sirenza Microdevices assumes no responsibility for inaccuracies or omissions. Sirenza Microdevices assumes no responsibility for the use of this information, and all such information shall	Original	PDF	S510065-55Z S510067-55Z RQR-104850 S510065-55Z JESD22-A108B JESD22-A102C JESD22-A104B JESD22-A103B JESD22-B102C jesd22-a108B JESD22-A108-B JESD22-A104B S510067 JESD22-A114 JESD78
JESD22-B102-C Abstract: SOT-86 sot86 transistor c 5586 q404 transistor SGA-6486Z SGA-6286 JESD22-B102C q402 transistor transistor 5586 Text: Reliability Report SGA/SGC Series in SOT-86 Package SnPb Plated SGA-2186 SGA-2286 SGA-2386 SGA-2486 SGA-3286 SGA-3386 SGA-3486 SGA-3586 SGA-4186 SGA-4286 SGA-4386 SGA-4486 SGA-4586 SGA-5286 SGA-5386 SGA-5486 SGA-5586 SGA-6286 SGA-6386 SGA-6486 Matte Sn, RoHS Compliant	Original	PDF	OT-86 SGA-2186 SGA-2286 SGA-2386 SGA-2486 SGA-3286 SGA-3386 SGA-3486 SGA-3586 SGA-4186 JESD22-B102-C SOT-86 sot86 transistor c 5586 q404 transistor SGA-6486Z SGA-6286 JESD22-B102C q402 transistor transistor 5586
ESD test plan Abstract: CGA-0116 0116 led JESD22-A103 1100C JESD22-A114 RQR-103796 1500C Text: Reliability Conditional Qualification Report CGA-0116 303 S. Technology Ct, Broomfield CO, 80021 Phone: 800 SMI-MMIC http://www.sirenza.com Document RQR-103796 Rev A 1 CGA-0116 Reliability Qualification Report I. Qualification Overview The CGA-0116 family of products has demonstrated reliable operation by passing all	Original	PDF	CGA-0116 RQR-103796 CGA-0116 195oC. CGA-0116. ESD test plan 0116 led JESD22-A103 1100C JESD22-A114 1500C
JEDEC J-STD-020 Abstract: j-std-020 JESD22-B102 RF5722 JESD22-A102 Qualification C101 JESD22 JESD22-A101 JESD22-A108 Text: RF5722 Qualification Report Page 1 of 2 Confidential QLT-01487 Revision A.1 Qualification Description Qualification of RF5722 for production. Package Type QFN Process Technology HBT5D PA Qualification # 07-QUAL‐891 Date Issued 2/5/2009	Original	PDF	RF5722 QLT-01487 07QUAL891 JESD22-A108 JESD22-A102 ENG-5722680 JEDEC J-STD-020 j-std-020 JESD22-B102 JESD22-A102 Qualification C101 JESD22 JESD22-A101 JESD22-A108

REPORT Search Results

REPORT Result Highlights (5)

REPORT Price and Stock

Fluke Corporation IEEE519-REPORT

ITT Interconnect Solutions GDFCR111660ADEH/TEST REPORT

ITT Interconnect Solutions GDD111631-38ACEG/TEST REPORT

Glenair Inc FUNCTIONAL/TEST/REPORT

Tri-Star Electronics International 2A018-013V-001 TEST REPORT

REPORT Datasheets (1)

REPORT Datasheets Context Search

Untitled

HTGB

AO3404AL

DS2788

LT8582

AO4800B

QMI519

quality and reliability report

SEC540

TSMC 0.18um

56800E

MC9S08QB8

6948

dyna image

TPS2300

TPS2300IPW

TMS320

SEMKO

Architecture of TMS320C54XX

QMI 509 epoxy

jesd22-a108B

JESD22-B102-C

ESD test plan

JEDEC J-STD-020