WO7430
Abstract: 13KHZ 25KHZ ANTIFUSE
Text: Standard Products Reliability Analysis of Programmed UTMC PROMs following Post-Program Conditioning July 1998 Summary—Life test data were obtained on the UTMC Microelectronic Systems 64K and 256KBit programmable read-only memories PROMs following post-program conditioning (PPC). PPC is used to enhance the reliability
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256KBit
WO7430
13KHZ
25KHZ
ANTIFUSE
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receiving inspection procedure
Abstract: reliability report QA procedure failure analysis research data reliability data analysis report
Text: Quality and Reliability Report 4. Customer Return Handling Flow and Failure Analysis Procedures Customer Return Handling Flow Failure Analysis Procedures To ensure that customers receive prompt and ef- A successful failure analysis should indicate the ficient service, Winbond has developed a detailed
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Heraeus SOLDER PASTE F645
Abstract: heraeus f816 heraeus F645 SA30C5-89M30 Heraeus paste profile SN63-90 Heraeus paste profile F645 heraeus heraeus f816 SN63-90 Heraeus pb free paste profile
Text: SLVA333 Application Report May 2009 BGA Package Component Reliability After Long-Term Storage R. Key, B. Lange, R. Madsen ABSTRACT The white paper Component Reliability After Long Term Storage Texas Instruments application report SLVA304, http://focus.ti.com/lit/wp/slva304/slva304.pdf detailed a risk analysis with
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SLVA333
SLVA304,
com/lit/wp/slva304/slva304
Heraeus SOLDER PASTE F645
heraeus f816
heraeus F645
SA30C5-89M30
Heraeus paste profile
SN63-90
Heraeus paste profile F645
heraeus
heraeus f816 SN63-90
Heraeus pb free paste profile
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ALTERA EPM7128SLC84
Abstract: FLUKE 8840a FLUKE 8840a specification EPM7128SLC84-7 atmel 160 pin EPM7128SLC84-7 part number atmel programming in c altera altera Date Code Formats ATMEL 340 EPM7128S
Text: White Paper ATF1500AS Analysis Report Introduction ® The Altera MAX 7000 family has many features that make it a leader in the programmable logic industry. MAX 7000 devices consume minimal power and are reliable at high frequencies. Additionally, these devices were designed for optimum timing characteristics and to support in-system programmability
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ATF1500AS
EPM7128S,
ALTERA EPM7128SLC84
FLUKE 8840a
FLUKE 8840a specification
EPM7128SLC84-7
atmel 160 pin
EPM7128SLC84-7 part number
atmel programming in c altera
altera Date Code Formats
ATMEL 340
EPM7128S
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L504XXX
Abstract: transistor 9427 m507xxx 9437 transistor CLCC 100 1550371 9434 8 pin integrated circuit
Text: March 1996 RR-B1A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and July 1,
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12GHz
27GHz
L504XXX
transistor 9427
m507xxx
9437 transistor
CLCC 100
1550371
9434 8 pin integrated circuit
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MAX635
Abstract: MAX635ACJA MAX635AEJA MAX635BCJA MAX635BEJA MAX636 MAX636ACSA MAX636AESA MAX636AESA-T MAX637
Text: Maxim > Products > [Power and Battery Management] MAX635, MAX636, MAX637 Preset/Adjustable Output CMOS Inverting Switching Regulators Evaluation Kits none Reliability Reports Show FIT data for: Request Reliability Report for: Software/Models none Ordering Information
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MAX635,
MAX636,
MAX637
MAX637AESA
MAX637AESA+
MAX637AESA-T
MAX637BESA
MAX635)
MAX636)
MAX637)
MAX635
MAX635ACJA
MAX635AEJA
MAX635BCJA
MAX635BEJA
MAX636
MAX636ACSA
MAX636AESA
MAX636AESA-T
MAX637
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Reliability Test Methods for Packaged Devices
Abstract: Surface mount NPN/PNP complementary transistor Thermal Test-Element-Group transistors mos ISSN-0018-9529 Harris catalogue
Text: S E M I C O N D U C T O R RR002 Intelligent Power Products Reliability Report April 1992 CONCURRENT DESIGN, TEST AND RELIABILITY ENGINEERING OF POWER ASICs By Erwin A. Herr Introduction A program was initiated in July 1987 to develop a new Intelligent Power ASIC chip technology using state-of-the-art type
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RR002
AFMLTR-67-147,
ISSN-0018-9529,
Reliability Test Methods for Packaged Devices
Surface mount NPN/PNP complementary transistor
Thermal Test-Element-Group
transistors mos
ISSN-0018-9529
Harris catalogue
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visual inspection of raw materials
Abstract: quality control procedure reliability test raw data quality and reliability report reliability test data analysis
Text: Quality and Reliability Report 3. Quality Management tain high standards and rigid specification control Quality Policy To become a world class company offering prod- throughout all the steps in the manufactur- ucts/services that best satisfy our customers, by
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Transistor morocco 9740
Abstract: Ablebond 8360 con hdr hrs ablebond 8086 interfacing with 8254 peripheral Date Code Formats diodes St Microelectronics formatter board Canon interfacing of 8237 with 8086 ST tOP MaRKinGS 388BGA
Text: RELIABILITY REPORT Q98001 SICL BUSINESS UNIT REPORT NUMBER : Q98001 QUALIFICATION TYPE : NEW DEVICE - NEW PACKAGE DEVICE : STPC Client SIP101 SALES TYPES : STPCD0166BTC3 - STPCD0175BTC3 TECHNICAL CODE : MDBT*CHDT1BR PROCESS : HCMOS6 - CROLLES FAB LOCATION
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Q98001
SIP101)
STPCD0166BTC3
STPCD0175BTC3
388BGA
Transistor morocco 9740
Ablebond 8360
con hdr hrs
ablebond
8086 interfacing with 8254 peripheral
Date Code Formats diodes St Microelectronics
formatter board Canon
interfacing of 8237 with 8086
ST tOP MaRKinGS
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2002 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 8/17/02 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2003 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 06/18/03 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2002 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/17/02 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 2002 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 01/20/03 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2003 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 11/20/03 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
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ST 9427
Abstract: 155-0241 155-0241-02 M726* TRANSISTOR st 9635 1550371 74935 M605030 806-0300 transistor 9427
Text: December 1997 RR-B2A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and
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12GHz
27GHz
ST 9427
155-0241
155-0241-02
M726* TRANSISTOR
st 9635
1550371
74935
M605030
806-0300
transistor 9427
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quality acceptance plan
Abstract: in-coming quality control TR-TSY-000357
Text: RELIABILITY MONITOR PROGRAM FOURTH QUARTER 1998 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 1/29/98 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
quality acceptance plan
in-coming quality control
TR-TSY-000357
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reliability testing report
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2001 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/30/01 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
reliability testing report
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM SECOND QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 07/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 2000 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 010/20/00 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM FIRST QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 4/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: RELIABILITY MONITOR PROGRAM THIRD QUARTER 1999 REPORT This report has been prepared by: Dallas Semiconductor Quality Assurance Department 10/20/99 RELIABILITY MONITOR PROGRAM Overview Dallas Semiconductor monitors the reliability of devices representative of those
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JESD22
MIL-STD-883,
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Untitled
Abstract: No abstract text available
Text: QUALITY ASSURANCE PROGRAMS AND FACILITIES At Dale Electronics, Inc., quality assurance is an independent organization which reports directly to the president. The infrastructure represented above has been in operation for more than 20 years. It symbolizes a commitment to excellence which has been steadily growing in terms of people,
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OCR Scan
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RR-63
Abstract: No abstract text available
Text: inteT RELIABILITY REPORT RR-63 August 1989 4 Static RAM Reliability Report MADHU NIMGAONKAR COMPONENTS CONTRACTING DIVISION QUALITY AND RELIABILITY ENGINEERING Order Number: 240544-001 4-63 SRAM RELIABILITY DATA SUMMARY CONTENTS PAGE 1.0 IN T R O D U C T IO N .4-65
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RR-63
RR-63
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