74ABT273A
Abstract: 74ABT273AD 74ABT273AN 74ABT373 74ABT374 74ABT377
Text: Philips Semiconductors Product specification Octal D-type flip-flop 74ABT273A FEATURES DESCRIPTION • Eight edge-triggered D-type flip-flops The 74ABT273A has eight edge-triggered D-type flip-flops with individual D inputs and Q outputs. The comm on buffered Clock CP
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OCR Scan
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74ABT273A
74ABT377
74ABT373
74ABT374
OT36Q-1
SQT360-1
MO-153AC
74ABT273AD
74ABT273AN
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PDF
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LV374A
Abstract: SN54LV374A SN74LV374A
Text: SN54LV374A, SN74LV374A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS408B – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV374A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation.
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Original
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SN54LV374A,
SN74LV374A
SCLS408B
LV374A
SN54LV374A
SN54LV374A
SN74LV374A
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PDF
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SA00052
Abstract: No abstract text available
Text: Philips Semiconductors Product specification Octal D-type flip-flop 74ABT273A FEATURES DESCRIPTION • Eight edge-triggered D-type flip-flops The 74ABT273A has eight edge-triggered D-type flip-flops with individual D inputs and Q outputs. The common buffered Clock CP
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OCR Scan
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74ABT273A
74ABT377
74ABT373
74ABT374
74ABT273A
74ABT
500ns
SA00057
SA00052
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PDF
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Untitled
Abstract: No abstract text available
Text: Product specification Philips Semiconductors 74ABT273A Octal D-type flip-flop FEATURES DESCRIPTION • Eight edge-triggered D-type flip-flops The 74ABT273A has eight edge-triggered D-type flip-flops with individual D inputs and Q outputs. The common buffered Clock CP
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OCR Scan
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74ABT273A
74ABT273A
74ABT377
74ABT373
74ABT
500ns
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54LV374A, SN74LV374A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS408B – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV374A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation.
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Original
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SN54LV374A,
SN74LV374A
SCLS408B
MIL-STD-883,
Flat/05/1999)
SCAA029,
SN74LV374A,
////roarer/root/data13/imaging/BIT.
/08032000/TXII/08022000/sn74lv374a
SZZU001B,
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54LV574A, SN74LV574A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS412C – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV574A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation.
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Original
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SN54LV574A,
SN74LV574A
SCLS412C
MIL-STD-883,
SN74LV574ADBR
SN74LV574ADGVR
SN74LV574ADW
SN74LV574ADWR
SN74LV574APWR
SCEM146,
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54LV374A, SN74LV374A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS408B – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV374A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation.
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Original
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SN54LV374A,
SN74LV374A
SCLS408B
MIL-STD-883,
SCEM142,
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54LV574A, SN74LV574A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS412C – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV574A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation.
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Original
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SN54LV574A,
SN74LV574A
SCLS412C
MIL-STD-883,
SCBA004C
SDYA010
SDYA012
SCAA029,
SZZU001B,
SDYU001M,
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PDF
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SN54LV574A
Abstract: SN74LV574A
Text: SN54LV574A, SN74LV574A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS412C – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV574A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation.
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Original
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SN54LV574A,
SN74LV574A
SCLS412C
LV574A
SN54LV574A
SN54LV574A
SN74LV574A
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PDF
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LS273
Abstract: DM74ALS273N DM54ALS273J DM74ALS DM74ALS273WM J20A 11-CLEAR TTL 74ALS
Text: DM54ALS273/DM74ALS273 National Semiconductor Corporation DM54ALS273/DM74ALS273 Octal D-Type Edge-Triggered Flip-Flops with Clear General Description Features These monolithic, positive-edge-triggered flip-flops utilize TTL circuitry to implement D-type flip-flop logic with a direct
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OCR Scan
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DM54ALS273/DM74ALS273
TL/F/6216-2
LS273
DM74ALS273N
DM54ALS273J
DM74ALS
DM74ALS273WM
J20A
11-CLEAR
TTL 74ALS
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PDF
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033S
Abstract: No abstract text available
Text: March 1996 Semiconductor DM64ALS273/DM74ALS273 Octal D-Type Edge-Triggered Flip-Flop with Clear General Description Features These monolithic, positive-edge-triggered flip-flops utilize TTL circuitry to implement D-type flip-flop logic with a direct clear input.
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OCR Scan
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DM64ALS273/DM74ALS273
DM64ALS273
DM74ALS273
bSD1122
033S
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PDF
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Untitled
Abstract: No abstract text available
Text: ZWÀ National ÆjA Semiconductor DM54ALS273/DM74ALS273 Octal D-Type Edge-Triggered Flip-Flop with Clear General Description Features These monolithic, positive-edge-triggered flip-flops utilize TTL circuitry to implement D-type flip-flop logic with a direct
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OCR Scan
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DM54ALS273/DM74ALS273
DM54ALS273
DM74ALS273
TL/F/6216-2
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
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PDF
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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PDF
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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PDF
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F374
Abstract: SN54BCT8374A SN74BCT8374A SN74BCT8374
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
SN74BCT8374
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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PDF
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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PDF
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BCT8374A
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
SCBA004C
SDYA010
SDYA012
SZZU001B,
SDYU001N,
SCET004,
BCT8374A
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PDF
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shift register by using D flip-flop
Abstract: F374 SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
|
Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
shift register by using D flip-flop
F374
SN54BCT8374A
SN74BCT8374A
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PDF
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
|
Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
|
Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
|
PDF
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
|
Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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PDF
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F374
Abstract: SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
|
Original
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
SCBS045e
SN74BCT8374
bct8374
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PDF
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