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    OCTAL D TYPE EDGE TRIGGERED FLIP FLOPS Search Results

    OCTAL D TYPE EDGE TRIGGERED FLIP FLOPS Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    HD74LS273RP Renesas Electronics Corporation Octal D-Type Positive-edge-triggered Flip-Flops (with Clear), , / Visit Renesas Electronics Corporation
    HD74LS374RP Renesas Electronics Corporation Octal D-Type Edge-triggered Flip-Flops (with three-state outputs), , / Visit Renesas Electronics Corporation
    TB67H480FNG Toshiba Electronic Devices & Storage Corporation Stepping Motor Driver/Unipolar Type/Vout(V)=50/Iout(A)=2.5/ PHASE input type Visit Toshiba Electronic Devices & Storage Corporation
    TB67H481FNG Toshiba Electronic Devices & Storage Corporation Stepping Motor Driver/Unipolar Type/Vout(V)=50/Iout(A)=2.5/ IN input type Visit Toshiba Electronic Devices & Storage Corporation
    TB67S580FNG Toshiba Electronic Devices & Storage Corporation Stepping Motor Driver/Unipolar Type/Vout(V)=50/Iout(A)=1.6 Visit Toshiba Electronic Devices & Storage Corporation

    OCTAL D TYPE EDGE TRIGGERED FLIP FLOPS Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    LV374A

    Abstract: SN54LV374A SN74LV374A
    Text: SN54LV374A, SN74LV374A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS408B – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV374A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation.


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    PDF SN54LV374A, SN74LV374A SCLS408B LV374A SN54LV374A SN54LV374A SN74LV374A

    Untitled

    Abstract: No abstract text available
    Text: SN54LV374A, SN74LV374A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS408B – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV374A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation.


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    PDF SN54LV374A, SN74LV374A SCLS408B MIL-STD-883, Flat/05/1999) SCAA029, SN74LV374A, ////roarer/root/data13/imaging/BIT. /08032000/TXII/08022000/sn74lv374a SZZU001B,

    Untitled

    Abstract: No abstract text available
    Text: SN54LV574A, SN74LV574A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS412C – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV574A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation.


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    PDF SN54LV574A, SN74LV574A SCLS412C MIL-STD-883, SN74LV574ADBR SN74LV574ADGVR SN74LV574ADW SN74LV574ADWR SN74LV574APWR SCEM146,

    Untitled

    Abstract: No abstract text available
    Text: SN54LV374A, SN74LV374A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS408B – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV374A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation.


    Original
    PDF SN54LV374A, SN74LV374A SCLS408B MIL-STD-883, SCEM142,

    Untitled

    Abstract: No abstract text available
    Text: SN54LV574A, SN74LV574A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS412C – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV574A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation.


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    PDF SN54LV574A, SN74LV574A SCLS412C MIL-STD-883, SCBA004C SDYA010 SDYA012 SCAA029, SZZU001B, SDYU001M,

    SN54LV574A

    Abstract: SN74LV574A
    Text: SN54LV574A, SN74LV574A OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS SCLS412C – APRIL 1998 – REVISED MAY 2000 D D D D D description The ’LV574A devices are octal edge-triggered D-type flip-flops designed for 2-V to 5.5-V VCC operation.


    Original
    PDF SN54LV574A, SN74LV574A SCLS412C LV574A SN54LV574A SN54LV574A SN74LV574A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


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    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A

    F374

    Abstract: SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original
    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original
    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    F374

    Abstract: SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


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    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A

    F374

    Abstract: SN54BCT8374A SN74BCT8374A SN74BCT8374
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original
    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A SN74BCT8374

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original
    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    F374

    Abstract: SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


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    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A

    BCT8374A

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


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    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374 SCBA004C SDYA010 SDYA012 SZZU001B, SDYU001N, SCET004, BCT8374A

    F374

    Abstract: SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original
    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original
    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original
    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    F374

    Abstract: SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original
    PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374

    74ABT273A

    Abstract: 74ABT273AD 74ABT273AN 74ABT373 74ABT374 74ABT377
    Text: Philips Semiconductors Product specification Octal D-type flip-flop 74ABT273A FEATURES DESCRIPTION • Eight edge-triggered D-type flip-flops The 74ABT273A has eight edge-triggered D-type flip-flops with individual D inputs and Q outputs. The comm on buffered Clock CP


    OCR Scan
    PDF 74ABT273A 74ABT377 74ABT373 74ABT374 OT36Q-1 SQT360-1 MO-153AC 74ABT273AD 74ABT273AN

    SA00052

    Abstract: No abstract text available
    Text: Philips Semiconductors Product specification Octal D-type flip-flop 74ABT273A FEATURES DESCRIPTION • Eight edge-triggered D-type flip-flops The 74ABT273A has eight edge-triggered D-type flip-flops with individual D inputs and Q outputs. The common buffered Clock CP


    OCR Scan
    PDF 74ABT273A 74ABT377 74ABT373 74ABT374 74ABT273A 74ABT 500ns SA00057 SA00052

    Untitled

    Abstract: No abstract text available
    Text: Product specification Philips Semiconductors 74ABT273A Octal D-type flip-flop FEATURES DESCRIPTION • Eight edge-triggered D-type flip-flops The 74ABT273A has eight edge-triggered D-type flip-flops with individual D inputs and Q outputs. The common buffered Clock CP


    OCR Scan
    PDF 74ABT273A 74ABT273A 74ABT377 74ABT373 74ABT 500ns

    LS273

    Abstract: DM74ALS273N DM54ALS273J DM74ALS DM74ALS273WM J20A 11-CLEAR TTL 74ALS
    Text: DM54ALS273/DM74ALS273 National Semiconductor Corporation DM54ALS273/DM74ALS273 Octal D-Type Edge-Triggered Flip-Flops with Clear General Description Features These monolithic, positive-edge-triggered flip-flops utilize TTL circuitry to implement D-type flip-flop logic with a direct


    OCR Scan
    PDF DM54ALS273/DM74ALS273 TL/F/6216-2 LS273 DM74ALS273N DM54ALS273J DM74ALS DM74ALS273WM J20A 11-CLEAR TTL 74ALS

    033S

    Abstract: No abstract text available
    Text: March 1996 Semiconductor DM64ALS273/DM74ALS273 Octal D-Type Edge-Triggered Flip-Flop with Clear General Description Features These monolithic, positive-edge-triggered flip-flops utilize TTL circuitry to implement D-type flip-flop logic with a direct clear input.


    OCR Scan
    PDF DM64ALS273/DM74ALS273 DM64ALS273 DM74ALS273 bSD1122 033S

    Untitled

    Abstract: No abstract text available
    Text: ZWÀ National ÆjA Semiconductor DM54ALS273/DM74ALS273 Octal D-Type Edge-Triggered Flip-Flop with Clear General Description Features These monolithic, positive-edge-triggered flip-flops utilize TTL circuitry to implement D-type flip-flop logic with a direct


    OCR Scan
    PDF DM54ALS273/DM74ALS273 DM54ALS273 DM74ALS273 TL/F/6216-2