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    MIL-STD-883-METHOD 2016 Search Results

    MIL-STD-883-METHOD 2016 Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    DFE2016CKA-1R0M=P2 Murata Manufacturing Co Ltd Fixed IND 1uH 1800mA NONAUTO Visit Murata Manufacturing Co Ltd
    DFE2016CKA-2R2M=P2 Murata Manufacturing Co Ltd Fixed IND 2.2uH 1400mA NONAUTO Visit Murata Manufacturing Co Ltd
    DE6B3KJ151KA4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6B3KJ471KB4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6E3KJ152MN4A Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd

    MIL-STD-883-METHOD 2016 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    INCOMING RAW MATERIAL INSPECTIONs

    Abstract: INCOMING RAW MATERIAL INSPECTION in-process quality inspections mil-std-883 INCOMING RAW MATERIAL INSPECTION method MIL-STD-883 method 2003 in-coming quality control INCOMING RAW MATERIAL process flow
    Text: QUALITY AND RELIABILITY QUALITY SYSTEM Product quality at Dallas Semiconductor results from a combination of design techniques, vendor controls, manufacturing methods, process monitors, and quality control inspections. SPC monitors placed at strategic points ensure that potential defects are detected


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    INCOMING RAW MATERIAL INSPECTION method

    Abstract: INCOMING RAW MATERIAL INSPECTION INCOMING RAW MATERIAL INSPECTIONs in-process quality inspections in-coming quality control quality acceptance plan MIL-STD-883 method 2003
    Text: QUALITY AND RELIABILITY QUALITY SYSTEM Product quality at Dallas Semiconductor results from a combination of design techniques, vendor controls, manufacturing methods, process monitors, and quality control inspections. SPC monitors placed at strategic points ensure that potential defects are detected


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    JESD22-A108-A

    Abstract: JESD22-A104-A JESD22*108 EIA-671 JEDS22-C101-A doc-70 ISO14000 J-STD-035 8110014 Distributors and Sales Partners
    Text: Reliability and Quality Assurance February 2002 Introduction Lattice Semiconductor Corporation LSC designs, develops and markets high performance programmable logic devices (PLDs) and related development system software. Lattice Semiconductor is the inventor and world's leading supplier of in-system programmable (ISPtm) CPLDs. PLDs are standard semiconductor components that can


    Original     		PDF MIL-STD-883, MIL-STD-883E, J-STD-035 JESD22-A108-A JESD22-A104-A JESD22*108 EIA-671 JEDS22-C101-A doc-70 ISO14000 J-STD-035 8110014 Distributors and Sales Partners

    68LC060

    Abstract: F98S Motorola Mil Std. 883 xpc860 A113 J24A XPC850
    Text: Reliability Report for Networking Communication Microprocessors XPC850 Rev 0.3 XPC860 XPC860T 0.42m Single Poly Wafer Fabrication Process Revision: 5/99 1.0 Purpose and Description This report summarizes the reliability data for Motorola communication microprocessors fabricated on the 0.42m single polysilicon process in our wafer


    Original     		PDF XPC850 XPC860 XPC860T 68LC060 F98S Motorola Mil Std. 883 xpc860 A113 J24A XPC850

    F98S

    Abstract: xpc860 68LC060 A113 J24A XPC850 Motorola, HBM, 1kv
    Text: Freescale Semiconductor, Inc. Reliability Report for Freescale Semiconductor, Inc. Networking Communication Microprocessors XPC850 Rev 0.3 XPC860 XPC860T 0.42m Single Poly Wafer Fabrication Process Revision: 5/99 For More Information On This Product, Go to: www.freescale.com


    Original     		PDF XPC850 XPC860 XPC860T F98S xpc860 68LC060 A113 J24A XPC850 Motorola, HBM, 1kv

    MH1RT

    Abstract: 65609E AT56K sn17
    Text: MH1RT QualPack Qualification Package MH1RT Sea of Gates Radiation Tolerant 0.35 µm CMOS MH1RT Sea of Gates 0.35 µm CMOS for Space Environment QualPack Rev.2 – Jan. 2002 1 MH1RT QualPack 1. Table of Contents 1. Table of Contents . 2


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    51V019S-33WN

    Abstract: APP001 APP003 C5533 MIL-STD-202F-208F ISR071008 app-003
    Text: Initial Sample Release FREEPORT TITLE NO:RDD042 ISR071008 Part Name HDMI Receptacle with wing vertical SMT type Document No FREEPORT Part No./Rev 51V019S-33WN-B-FEC Customer Part No. Reason for Initial Sample: Initial Submission Change Subcontractor Source


    Original     		PDF RDD042 ISR071008 51V019S-33WN-B-FEC CE/2006/C5533 CE/2006/C5533* 51V019S-33WN APP001 APP003 C5533 MIL-STD-202F-208F ISR071008 app-003

    atmel MSL 1

    Abstract: AT24C1024 k 355k M3015 atmel Reflow soldering 8 lead SOIC AT17LV002 AT17LV002A AT17LV010A AT17LV040 AT17LV128A
    Text: 35.5K Configurator Qualification Package Date: June 20, 2002 From: 35.5K Configurator Product Engineering Subj.: Qualification By 35.5K Devices Dear Valued Customer, The following Configurator devices are all fabricated using Atmel’s 35.5K processes. For Qualification


    Original     		PDF AT17LV010 AT17LV010A AT17LV040 AT17LV002 AT17LV002A AT17LV512 AT17LV512A AT17LV256 AT17LV256A AT17LV128 atmel MSL 1 AT24C1024 k 355k M3015 atmel Reflow soldering 8 lead SOIC AT17LV040 AT17LV128A

    4n54txvb

    Abstract: No abstract text available
    Text: Select Products Here Go 4N51 4N52 4N54 Hermetic Hexadecimal Display With Logic DESCRIPTION The 4N51 ia a hermetically sealed solid-state numeric display that decodes positive 8421 BCD logic inputs into characters 0-9, a "-" sign, a test pattern, and four blanks in the invalid BCD states. The display has a right-hand decimal


    Original     		PDF MIL-STD-883 com/catalog/4n51 4/4n51 4n54txvb

    40F-701-1-15

    Abstract: nikon STEPPER 71007 MIL-STD-883 method 5003 INCOMING MATERIAL INSPECTION procedure harris top marking product change notification
    Text: Status of Document is:RELEASED Effective from: 19-SEP-1997 14:23:42 to Date Printed: 09/24/97 7:46 AM SECTION 2.0 Controlled Document QML GENERAL NON-TECHNOLOGY SPECIFIC GENERAL Section 2.0 of this manual is written to describe the general (non-technology specific)


    Original     		PDF 19-SEP-1997 210XXX 710-010-XX 40F-400-0-0 40F-701-1-15 nikon STEPPER 71007 MIL-STD-883 method 5003 INCOMING MATERIAL INSPECTION procedure harris top marking product change notification

    TM2004

    Abstract: MIL-STD-883 method 5003 TM1011 ACT-R01 54XXXX 40F-701-1-15 marking 25b harris top marking product change notification Harris top marking
    Text: Status of Document is:RELEASED Effective from: 02-JUN-1997 08:18:36 to Date Printed: 06/09/97 6:39 AM SECTION 2.0 Controlled Document QML GENERAL NON-TECHNOLOGY SPECIFIC GENERAL Section 2.0 of this manual is written to describe the general (non-technology specific)


    Original     		PDF 02-JUN-1997 210XXX 710-010-XX 40F-400-0-0 TM2004 MIL-STD-883 method 5003 TM1011 ACT-R01 54XXXX 40F-701-1-15 marking 25b harris top marking product change notification Harris top marking

    Elmwood Sensors 3100

    Abstract: Elmwood Sensors 3001 rcr07G Elmwood Sensors raychem mtc 100 connector catalog 1308940 raychem specification PPS 3010 CTA-0022 emi rfi filter raychem ce-1605900
    Text: Pin and Socket Connectors Table of Contents NANONICS Nanominiature Connectors Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5004, 5005 Strip Connectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5006


    Original     		PDF 50oses Elmwood Sensors 3100 Elmwood Sensors 3001 rcr07G Elmwood Sensors raychem mtc 100 connector catalog 1308940 raychem specification PPS 3010 CTA-0022 emi rfi filter raychem ce-1605900

    rcr07G

    Abstract: M24308/4-11f mil spec M81714 311P407 M24308/4-12F Elmwood Sensors 3100 mil spec M81714 splice M24308/2-12F 311P409 311P407-6S-B-12
    Text: Pin and Socket Connectors Table of Contents NANONICS Nanominiature Connectors Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5004, 5005 Strip Connectors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5006


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    Z0840004PSC

    Abstract: Z0853006PSC sumitomo crm1033b Sumitomo CRM 1033B Z84C008 z0840004 Z0847004PSC Z0843006PSC Z0843004PSC Z84C3006PEC
    Text: ZiLOG, Inc. 2H - Year 2002 Quality And Reliability Report ZAC03-0004 ZiLOG 2002Quality and Reliability Report Chapter Title and Subsection TABLE OF CONTENTS Chapter Title and Subsection Chapter 1 - ZiLOG’s Quality Culture Reliability And Quality Assurance Policy Statement………………………………. 1 - 1


    Original     		PDF ZAC03-0004 2002Quality Z0840004PSC Z0853006PSC sumitomo crm1033b Sumitomo CRM 1033B Z84C008 z0840004 Z0847004PSC Z0843006PSC Z0843004PSC Z84C3006PEC

    tsmc 0.35um 2p4m cmos

    Abstract: K2411 specification of scr 2p4m teradyne j750 tester manual 2p4m equivalent Z0853006PSC SCR 2P4M Z84C1510FEC DC04 display Z0853006VSC
    Text: Quality And Reliability Report 2004 Period Covered: 2003


    Original     		PDF DC04-0001 tsmc 0.35um 2p4m cmos K2411 specification of scr 2p4m teradyne j750 tester manual 2p4m equivalent Z0853006PSC SCR 2P4M Z84C1510FEC DC04 display Z0853006VSC

    HMXR-5001

    Abstract: 13001 YF 09 TRANSISTOR HP 5082 7000 5082-0825 33150A 2N6838 Hxtr 3101 Hxtr 3101 transistor 5082-2815 hsch-1001
    Text: For Complete . Application &Sales . '. Information ' ,.' • Call ' Joseph Masarich Sales Representative HEWLETT PACKARD . NEELY "Sales Region 3003 scon BLVD. SANTA CLARA, CA 95050 408 988-7234 Microwave Semiconductor Diode and Transistor Designers Catalog


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    LTC MTBF

    Abstract: transistor A110 transistor j-fet 245c transistor A113 MIL-STD-690 transistor mark code 3015 up board exam date sheet 2012 in-process quality inspections 690B A113
    Text: RELIABILITY ASSURANCE RELIABILITY ASSURANCE PROGRAM INTRODUCTION In 1981 Linear Technology Corporation was founded with the intention of becoming a world leader in high performance analog semiconductors. To achieve this goal Linear Technology Corporation committed itself


    Original     		PDF MIL-STD-883 5000ppm LTC MTBF transistor A110 transistor j-fet 245c transistor A113 MIL-STD-690 transistor mark code 3015 up board exam date sheet 2012 in-process quality inspections 690B A113

    transistor A113

    Abstract: 400X 690B A102-B A110 A113 INCOMING RAW MATERIAL INSPECTION procedure INCOMING RAW MATERIAL INSPECTION report transistor a110 DATAPACK/RHFLVDS31AD2V
    Text: RELIABILITY ASSURANCE PROGRAM RELIABILITY ASSURANCE PROGRAM INTRODUCTION In 1981 Linear Technology Corporation was founded with the intention of becoming a world leader in high performance analog semiconductors. To achieve this goal Linear Technology Corporation committed itself


    Original     		PDF MIL-STD-883 5000ppm transistor A113 400X 690B A102-B A110 A113 INCOMING RAW MATERIAL INSPECTION procedure INCOMING RAW MATERIAL INSPECTION report transistor a110 DATAPACK/RHFLVDS31AD2V

    method 2010 checklist

    Abstract: 88C681 68C681 L-567 88C681 equivalent L567
    Text: MILITARY PRODUCTS DOCUMENTATION SYSTEMS Documentation System s also reviews customer specifications and purchase orders and generates customized internal travelers to assure compliance to customer requirements. Documentation Systems maintains a program to


    OCR Scan     		PDF 68C681, 88C681, 82C684 method 2010 checklist 88C681 68C681 L-567 88C681 equivalent L567

    TRANSISTOR si 6822

    Abstract: LM 3140 si 6822 transistor transistor 6822 si transistors Si 6822 lm3140 SN-72500 transistors br 6822 Siemens technische transistor 6823
    Text: Technische Erläuterungen SIEMENS Allgem eines O ptoelektronische Bauelem ente haben in der m odernen Elektronik und dam it in fast allen Bereichen unseres Lebens weiten Eingang gefunden. Sie sind in hohem Maße an dem Um stellungsprozeß von Mechanik auf Elektronik beteiligt und haben, aufgrund ihrer Funktion als


    OCR Scan     		PDF

    MP 1009 es

    Abstract: BS-00001
    Text: ^EDI B c e tro n lc D e s ig n i Inc. Reliability Program Quality Assurance Policy The Quality Standard at Electronic Designs Incorpo­ rated EDI is defect free work. No other standard is acceptable. This policy is reflected in the attention given to the


    OCR Scan     		PDF MIL-STD-883. MIL-STD-883 MP 1009 es BS-00001

    Untitled

    Abstract: No abstract text available
    Text: *7 0 / 4N54 Hermetic Hexadecimal Display With Logic Texas Optoelectronics, Inc. DESCRIPTION A hermetically sealed solid-state hexadecimal display with on-board memory latch, decoder and driver. The 4N54 decodes positive 8421 BCD logic inputs and displays the appropriate hexadecimal character


    OCR Scan     		PDF MIL-D-87157 000D524

    4N54TXV

    Abstract: 4N54TXVB 4x7 DISPLAY 4N54 PM 1027 MIL-D-87157 MSI MS-5 hexadecimal display method d 1071 4N54TX
    Text: TEXAS OP TO E L E C T R O N I C S INC IDE D | 3 ^ 3 ^ 3 4 OOOOlt,? S I 1 4N54 Hermetic Hexadecimal Display With Logic L -m f // * Te*asaptoe/ectron/cS, inc. F - n ' 3 & 7 - y / - 3 7 A hermetically sealed solid-state hexadecimal display with on-board memory latch, decoder and ariver.


    OCR Scan     		PDF MIL-D-87157 MIL-STD-883 4N54TXV 4N54TXVB 4x7 DISPLAY 4N54 PM 1027 MSI MS-5 hexadecimal display method d 1071 4N54TX

    MSD2353

    Abstract: 0D570 mpc 21-37 MSD2353TXV DIODE 2141
    Text: SIEMENS AKT IEN GESELLSCHAF SIEMENS 4?E D ñP3ShDS 0GE70ED 1 ISIEG MSD2351TXV/TXVB high EFF. RED MSD2352TXV/TXVB HIGH EFF. GREEN MSD2353TXV/TXVB YELLOW Sunlight Viewable .200" 4-Character 5x7 Dot Matrix Serial Input Alphanumeric Military Display Package Dimensions in Inches mm


    OCR Scan     		PDF 0GE70ED MSD2351TXV/TXVB MSD2352TXV/TXVB MSD2353TXV/TXVB P4\-37 MSD235X MSD2351 MSD2353 0D570 mpc 21-37 MSD2353TXV DIODE 2141