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    MIL-STD-883 METHOD 2010 Search Results

    MIL-STD-883 METHOD 2010 Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    DE6B3KJ151KA4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6B3KJ471KB4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6E3KJ152MN4A Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6B3KJ101KA4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd
    DE6B3KJ331KB4BE01J Murata Manufacturing Co Ltd Safety Standard Certified Lead Type Disc Ceramic Capacitors for Automotive Visit Murata Manufacturing Co Ltd

    MIL-STD-883 METHOD 2010 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    Option Information

    Abstract: No abstract text available
    Text: Work-In-Progress Option Information www.vishay.com Vishay Siliconix MIL-PRF-38535 Class Level B Process Flow MIL-STD-883/M5004 INTERNAL VISUAL METHOD 2010 CONDITION B TEMP CYCLE METHOD 1010 CONDITION C CONSTANT ACCELERATION METHOD 2001 CONDITION E PRE-BURNIN ELECTRICAL


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    PDF MIL-PRF-38535 MIL-STD-883/M5004) HETD-883/M5004) 28-Apr-15 Option Information

    no-go

    Abstract: No abstract text available
    Text: HVCMOS IC Process Option Flows RB PRODUCT FLOW 1 (SIMILAR TO MIL-STD-883 CLASS B) RC PRODUCT FLOW COMMERICAL PRODUCT FLOW Preseal Visual Method 2010, Condition B Preseal Visual Method 2010, Condition B Temperature Cycle (2) Method 1010, Condition C, 10 Cycles, -65°C to + 150°C


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    PDF MIL-STD-883 MIL-STD-883. MIL-STD-883 no-go

    method d 1071

    Abstract: LTPD
    Text: DMOS Process Option Flow Chart DMOS ARRAY RB FLOW 1 (SIMILAR TO MIL-STD-883 CLASS B) Preseal Visual Method 2010, Condition B Temperature Cycle Method 1010, Condition C, 10 Cycles, -65°C to +150°C 10 minutes minimum @ each temperature extreme Constant Acceleration


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    PDF MIL-STD-883 MIL-STD-750 MIL-STD-750 method d 1071 LTPD

    MSK PRODUCT COMPARISON CHART

    Abstract: No abstract text available
    Text: MSK PRODUCT COMPARISON CHART Test Flow or Requirement MIL-STD-883 Test Method Certification Qualification QML Listing No Element Evaluation Clean Room Processing Ultrasonic Inspection, TM 2030 Wirebond Process Control No Yes A/R Yes Hermetic Class H Yes


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    PDF MIL-STD-883 MSK PRODUCT COMPARISON CHART

    M1000

    Abstract: M1000/SUPER5-KIT/SCC
    Text: 32.0-46.0 GHz GaAs MMIC Balanced Mixer April 2005 - Rev 30-Apr-05 M1000 Features Chip Device Layout Fundamental Balanced Mixer 7.0 dB Conversion Loss +24 dBm Input Third Order Intercept 100% On-Wafer RF Testing 100% Visual Inspection to MIL-STD-883 Method 2010


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    PDF 30-Apr-05 M1000 MIL-STD-883 M1000 M1000/SUPER5-KIT/SCC

    TEXAS 7697

    Abstract: CMM1100 CMM1100-BD DM6030HK PB-CMM1100-BD-0000 TS3332LD
    Text: 2.0-18.0 GHz GaAs MMIC Low Noise Amplifier CMM1100-BD February 2010 - Rev-05-Feb-10 Features Self Bias Architecture 17.0 dB Small Signal Gain 3.5 dB Noise Figure +16.0 dBm P1dB Compression Point 100% Commercial-Level Visual Inspection Using Mil-Std-883 Method 2010


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    PDF CMM1100-BD Rev-05-Feb-10 Mil-Std-883 CMM1100-BD-000W PB-CMM1100-BD-0000 CMM1100-BD TEXAS 7697 CMM1100 DM6030HK PB-CMM1100-BD-0000 TS3332LD

    M1000

    Abstract: 40BRFM0058 mmic MIXER 210 84-1LMI XM1000
    Text: 32.0-46.0 GHz GaAs MMIC Balanced Mixer November 2005 - Rev 21-Nov-05 M1000 Features Chip Device Layout Fundamental Balanced Mixer 7.0 dB Conversion Loss +24 dBm Input Third Order Intercept 100% On-Wafer RF Testing 100% Visual Inspection to MIL-STD-883 Method 2010


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    PDF 21-Nov-05 M1000 MIL-STD-883 M1000 40BRFM0058 mmic MIXER 210 84-1LMI XM1000

    CMM1100

    Abstract: CMM1100-BD PB-CMM1100-BD TS3332LD
    Text: 2.0-18.0 GHz GaAs MMIC Low Noise Amplifier CMM1100 May 2006 - Rev 01-May-06 Features Self Bias Architecture 18.0 dB Small Signal Gain 3.5 dB Noise Figure +11.0 dBm P1dB Compression Point 100% Visual Inspection to MIL-STD-883 Method 2010 Chip Device Layout


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    PDF CMM1100 01-May-06 MIL-STD-883 CMM1100-BD PB-CMM1100-BD CMM1100-BD CMM1100 PB-CMM1100-BD TS3332LD

    Untitled

    Abstract: No abstract text available
    Text: 2.0-18.0 GHz GaAs MMIC Low Noise Amplifier CMM1100-BD September 2009 - Rev 22-Sep-09 Features Self Bias Architecture 17.0 dB Small Signal Gain 3.5 dB Noise Figure +16.0 dBm P1dB Compression Point 100% Commercial-Level Visual Inspection Using Mil-Std-883 Method 2010


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    PDF CMM1100-BD 22-Sep-09 Mil-Std-883 metalD-000V PB-CMM1100-BD-0000 CMM1100-BD

    CELSIUS M420

    Abstract: 10358 microstrip CMM1110 CMM1110-BD M420 PB-CMM1110-BD TS3332LD MA1916
    Text: 2.0-18.0 GHz GaAs MMIC Low Noise Amplifier CMM1110 May 2006 - Rev 01-May-06 Features Self Bias Architecture 16.0 dB Small Signal Gain 2.5 dB Noise Figure +13.0 dBm P1dB Compression Point 100% Visual Inspection to MIL-STD-883 Method 2010 Chip Device Layout


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    PDF CMM1110 01-May-06 MIL-STD-883 CMM1110-BD PB-CMM1110-BD CMM1110-BD CELSIUS M420 10358 microstrip CMM1110 M420 PB-CMM1110-BD TS3332LD MA1916

    M1000

    Abstract: No abstract text available
    Text: 32.0-46.0 GHz GaAs MMIC Balanced Mixer November 2005 - Rev 21-Nov-05 M1000 Features Chip Device Layout Fundamental Balanced Mixer 7.0 dB Conversion Loss +24 dBm Input Third Order Intercept 100% On-Wafer RF Testing 100% Visual Inspection to MIL-STD-883 Method 2010


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    PDF 21-Nov-05 M1000 MIL-STD-883

    M1000

    Abstract: No abstract text available
    Text: 32.0-46.0 GHz GaAs MMIC Balanced Mixer August 2005 - Rev 04-Aug-05 M1000 Features Chip Device Layout Fundamental Balanced Mixer 7.0 dB Conversion Loss +24 dBm Input Third Order Intercept 100% On-Wafer RF Testing 100% Visual Inspection to MIL-STD-883 Method 2010


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    PDF 04-Aug-05 M1000 MIL-STD-883

    PB-CMM1100-BD-0000

    Abstract: tanaka epoxy tanaka TS3332LD epoxy transistor BD 140 CMM1100-BD CMM1100-BD-000V DM6030HK TS3332LD
    Text: 2.0-18.0 GHz GaAs MMIC Low Noise Amplifier CMM1100-BD September 2008 - Rev 28-Sep-08 Features Self Bias Architecture 16.0 dB Small Signal Gain 3.8 dB Noise Figure +15.0 dBm P1dB Compression Point 100% Commercial-Level Visual Inspection Using Mil-Std-883 Method 2010


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    PDF CMM1100-BD 28-Sep-08 Mil-Std-883 metallizaD-000V PB-CMM1100-BD-0000 CMM1100-BD PB-CMM1100-BD-0000 tanaka epoxy tanaka TS3332LD epoxy transistor BD 140 CMM1100-BD-000V DM6030HK TS3332LD

    3011-75

    Abstract: B103B B110 JESD22 LMZ14203EXT lmz12003ext switching regulator 12v 3A
    Text: LMZ12003EXT 3A SIMPLE SWITCHER Power Module with 20V Maximum Input Voltage for Military and Rugged Applications Easy to use 7 pin package Performance Benefits • Low radiated emissions / High radiated immunity ■ Passes vibration standard MIL-STD-883 Method 2007.2 Condition A


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    PDF LMZ12003EXT MIL-STD-883 JESD22 B103B 3011-75 B110 LMZ14203EXT lmz12003ext switching regulator 12v 3A

    B103B

    Abstract: B110 JESD22
    Text: LMZ14202EXT 2A SIMPLE SWITCHER Power Module with 42V Maximum Input Voltage for Military and Rugged Applications Easy to use 7 pin package Performance Benefits • Low radiated emissions / High radiated immunity ■ Passes vibration standard MIL-STD-883 Method 2007.2 Condition A


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    PDF LMZ14202EXT MIL-STD-883 JESD22 B103B B110

    30117

    Abstract: B103B B110 JESD22 JESD22-B110 lmz12001ext
    Text: LMZ12001EXT 1A SIMPLE SWITCHER Power Module with 20V Maximum Input Voltage for Military and Rugged Applications Easy to use 7 pin package Performance Benefits • Low radiated emissions / High radiated immunity ■ Passes vibration standard MIL-STD-883 Method 2007.2 Condition A


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    PDF LMZ12001EXT MIL-STD-883 JESD22 B103B 30117 B110 JESD22-B110 lmz12001ext

    Untitled

    Abstract: No abstract text available
    Text: SN74LVC14A-Q1 HEX SCHMITT-TRIGGER INVERTER www.ti.com SCAS705B – SEPTEMBER 2003 – REVISED FEBRUARY 2008 FEATURES 1 • • • • • • • • Qualified for Automotive Applications ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V


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    PDF SN74LVC14A-Q1 SCAS705B MIL-STD-883, SN74LVC14p

    Untitled

    Abstract: No abstract text available
    Text: LMZ14203EXT 3A SIMPLE SWITCHER Power Module with 42V Maximum Input Voltage for Military and Rugged Applications Easy to use 7 pin package Performance Benefits • Low radiated emissions / High radiated immunity ■ Passes vibration standard MIL-STD-883 Method 2007.2 Condition A


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    PDF LMZ14203EXT MIL-STD-883 JESD22 B103B

    XM1003-BD

    Abstract: No abstract text available
    Text: 32.0-42.0 GHz GaAs MMIC Image Reject Mixer M1003-BD February 2007 - Rev 16-Feb-07 Features Sub-harmonic Image Reject Mixer GaAs HBT Technology 9.0 dB Conversion Loss 18.0 dB Image Rejection 100% On-Wafer RF Testing 100% Visual Inspection to MIL-STD-883 Method 2010


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    PDF M1003-BD 16-Feb-07 MIL-STD-883 XM1003-BD XM1003-BD-000V XM1003-BD-EV1 XM1003-BD

    CMM1100

    Abstract: CMM1100-BD CMM1100-BD-000X DM6030HK PB-CMM1100-BD TS3332LD
    Text: 2.0-18.0 GHz GaAs MMIC Low Noise Amplifier CMM1100-BD February 2007 - Rev 06-Feb-07 Features Self Bias Architecture 18.0 dB Small Signal Gain 3.5 dB Noise Figure +16.0 dBm P1dB Compression Point 100% Visual Inspection to MIL-STD-883 Method 2010 Chip Device Layout


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    PDF CMM1100-BD 06-Feb-07 MIL-STD-883 CMM1100-BD-000X CMM1100-BD PB-CMM1100-BD CMM1100 CMM1100-BD-000X DM6030HK PB-CMM1100-BD TS3332LD

    CMM1110

    Abstract: CMM1110-BD CMM1110-BD-000X DM6030HK M420 PB-CMM1110-BD TS3332LD
    Text: 2.0-18.0 GHz GaAs MMIC Low Noise Amplifier CMM1110-BD January 2007 - Rev 29-Jan-07 Features Self Bias Architecture 16.0 dB Small Signal Gain 2.5 dB Noise Figure +13.0 dBm P1dB Compression Point 100% Visual Inspection to MIL-STD-883 Method 2010 Chip Device Layout


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    PDF CMM1110-BD 29-Jan-07 MIL-STD-883 CMM1110-BD-000X CMM1110-BD PB-CMM1110-BD CMM1110 CMM1110-BD-000X DM6030HK M420 PB-CMM1110-BD TS3332LD

    DM6030HK

    Abstract: TS3332LD XP1016 XP1016-BD XP1016-BD-000V XP1016-BD-EV1
    Text: 43.5-46.5 GHz GaAs MMIC Power Amplifier P1016-BD August 2007 - Rev 11-Aug-07 Features Excellent Driver Stage 14.0 dB Small Signal Gain +24.0 dBm P1dB Compression Point 100% On-Wafer RF, DC and Output Power Testing 100% Visual Inspection to MIL-STD-883 Method 2010


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    PDF P1016-BD 11-Aug-07 MIL-STD-883 XP1016-BD XP1016-BD-000V XP1016-BD-EV1 XP1016 DM6030HK TS3332LD XP1016-BD XP1016-BD-000V XP1016-BD-EV1

    BD 140 transistor

    Abstract: tanaka epoxy tanaka TS3332LD tanaka TS3332LD epoxy CMM1110-BD CMM1110-BD-000V DM6030HK M420 TS3332LD
    Text: 2.0-18.0 GHz GaAs MMIC Low Noise Amplifier CMM1110-BD May 2007 - Rev 01-May-07 Features Self Bias Architecture 15.0 dB Small Signal Gain 3.2 dB Noise Figure +13.0 dBm P1dB Compression Point 100% Visual Inspection to MIL-STD-883 Method 2010 Chip Device Layout


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    PDF CMM1110-BD 01-May-07 MIL-STD-883 CMM1110-BD-000V PB-CMM1110-BD-0000 CMM1110-BD BD 140 transistor tanaka epoxy tanaka TS3332LD tanaka TS3332LD epoxy CMM1110-BD-000V DM6030HK M420 TS3332LD

    ts333

    Abstract: P1016 tanaka epoxy tanaka TS3332LD DM6030HK TS3332LD XP1016 XP1016-BD XP1016-BD-000V XP1016-BD-EV1
    Text: 43.5-46.5 GHz GaAs MMIC Power Amplifier P1016-BD August 2007 - Rev 11-Aug-07 Features Excellent Driver Stage 14.0 dB Small Signal Gain +24.0 dBm P1dB Compression Point 100% On-Wafer RF, DC and Output Power Testing 100% Visual Inspection to MIL-STD-883 Method 2010


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    PDF P1016-BD 11-Aug-07 MIL-STD-883 XP1016-BD XP1016-BD-000V XP1016-BD-EV1 XP1016 ts333 P1016 tanaka epoxy tanaka TS3332LD DM6030HK TS3332LD XP1016-BD XP1016-BD-000V XP1016-BD-EV1