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    JIS C7021 B10 Search Results

    JIS C7021 B10 Result Highlights (6)

    Part ECAD Model Manufacturer Description Download Buy
    ADUC7021BCPZ62-RL Analog Devices Flash ARM7+8-ch,12-B ADC & 2x1 Visit Analog Devices Buy
    ADUC7021BCPZ62-RL7 Analog Devices Flash ARM7+8-ch,12-B ADC & 2x1 Visit Analog Devices Buy
    ADUC7021BCPZ62I Analog Devices Flash ARM7+8-ch,12-B ADC & 2x1 Visit Analog Devices Buy
    ADUC7021BCPZ62I-RL Analog Devices Flash ARM7+8-ch,12-B ADC & 2x1 Visit Analog Devices Buy
    ADUC7021BCPZ62 Analog Devices Flash ARM7+8-ch,12-B ADC & 2x1 Visit Analog Devices Buy
    ADUC7021BCPZ32-RL7 Analog Devices Flash ARM7+8-ch,12-B ADC & 2x1 Visit Analog Devices Buy

    JIS C7021 B10 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    Untitled

    Abstract: No abstract text available
    Text: Reliability Test TEST ITEM 1.TEMPERATURE CYCLE TC 2. HIGH TEMP. STORAGE (HTS) 3.LOW TEMP. STORAGE (LTS) 4.MOISTURE RESISTANCE (MR) 5.PRESSURE COOKER TEST (PCT) 6.SOLDERABILITY TEST (ST) TEST METHOD MIL-STD (1)MIL-STD-883D 1010.C0ND.C (2)JIS C7021 A-4 (1)MIL-STD-750B1031


    Original     		PDF MIL-STD-883D C7021 MIL-STD-750B1031 MIL-STD-750B1021 C7021B-11-C EIAJ-IC-121 MIL-STD-883D2003

    EIAJ-SD-121

    Abstract: JIS C7021 B10 EIAJ SD-121 C7021 EE-SX1041
    Text: Reliability • Market Product Quality OMRON is making efforts so that OMRON’s Photomicrosensors can achieve a failure rate of only 10–7/h. OMRON will continue improving the quality of its products to comply with OMRON Photomicrosensors users’ demand for product quality while


    Original     		PDF

    EE-SX4019-P

    Abstract: EE-CF4 EE-SX4019 EE-CF2 EIAJ-SD-121 EIAJ SD-121 EE-SX1235-P2 ee-sx307 EE-SX1018 C7021
    Text: Product Quality Control and Reliability Product Quality Control Basic Policy of Product Quality Control OMRON has been attaching great importance to quality control of its products, with the view of making a contribution to society by producing high-quality products. The table below shows the contents of OMRON’s quality control system including marketing surveys and quality control


    Original     		PDF st0033 EE-SX298* EE-SX4009-P* EE-SX301 EE-SX401 EE-SX4019-P EE-CF4 EE-SX4019 EE-CF2 EIAJ-SD-121 EIAJ SD-121 EE-SX1235-P2 ee-sx307 EE-SX1018 C7021

    JIS C7021 B-11

    Abstract: 2SA1576A 2SA1774 2SC2412K 2SC4081 2SC4617 C7021 H63A
    Text: Quality assurance and reliability Transistors Quality assurance and reliability !Quality Assurance Measures JIS Japan Industrial Standards defines reliability to be “the ability for an item to perform a required function under given conditions for a specified time”. This can be


    Original     		PDF 1000h JIS C7021 B-11 2SA1576A 2SA1774 2SC2412K 2SC4081 2SC4617 C7021 H63A

    JIS C7021 A-11

    Abstract: 741J tlp655 EIAJ ED-4701 B-121 EIAJ ED-4701 B-131 TLP641G EIAJ ED-4701 B-123 TLP641J TLP666 TLP721
    Text: [8] 7. ⸃ ⺑ ᶏᄖ቟ోⷙᩰ⹺ቯࡈࠜ࠻ࠞࡊ࡜ ᒰ␠ߢߪ‫ޔ‬UL USA ‫ޔ‬VDE (࠼ࠗ࠷)‫ޔ‬BSI (⧷࿖)‫ޔ‬SEMKO (ࠬ࠙ࠚ࡯࠺ࡦ) ߩ⹺ቯຠࠍ࠻࡜ࡦࠫࠬ࠲ ಴ജ‫࠲ࠬ࡝ࠗࠨޔ‬಴ജ‫ࠢ࠶ࠕࠗ࡜࠻ޔ‬಴ജߩ⒳‫ߩޘ‬ຠ⒳ߦࠊߚࠅ࡜ࠗࡦࠕ࠶ࡊߒߡ޿߹ߔ‫ࠣࡦ࠴࠶ࠗࠬޕ‬


    Original     		PDF VDE0884 TLP521-1 TLP531/532 TLP541G/545J TLP550/551 TLP560G/561G TLP620/-2/-4 TLP621/-2/-4 TLP750/751 TLP631/632 JIS C7021 A-11 741J tlp655 EIAJ ED-4701 B-121 EIAJ ED-4701 B-131 TLP641G EIAJ ED-4701 B-123 TLP641J TLP666 TLP721

    7 SEGMENT DISPLAY ALPHANUMERIC

    Abstract: 16x16 LED Matrix JIS C7021 B-11 C7021 full color dot matrix 8 x 8 18 pin Dual alphanumeric, 16 segment display BLUE 4 DIGIT 7 SEGMENT LED DISPLAY AA-11X11
    Text: Spark LED Lighting HK Co. Ltd. Room 1502, 15/F, New Treasure Centre, 10 Ng Fong Street, San Po Kong, Kowloon, Hong Kong Tel: 852-35201441 Fax: 852-35201449 sales@sparkledlighting.com www.sparkledlighting.com.hk Display Specification – General Information


    Original     		PDF MIL-STD-750 MIL-STD-883 C7021 160mA/duty 1000HRS -24HRS, 72HRS) 008-8mm 028-28mm 180180mm 7 SEGMENT DISPLAY ALPHANUMERIC 16x16 LED Matrix JIS C7021 B-11 full color dot matrix 8 x 8 18 pin Dual alphanumeric, 16 segment display BLUE 4 DIGIT 7 SEGMENT LED DISPLAY AA-11X11

    EIAJ SD-121

    Abstract: JIS-C-7021 JIS C7021 B-11 MIL-STD-750b JIS C7021 A-11 eiaj 5,5 3,4 1,0 JIS C7021 A-6 C7021 JIS C7021
    Text: 半導体製品の信頼性について [6] [ 6 ] 半導体製品の信頼性について 1. 品質保証体系 半導体素子に対する品質と信頼性はそれが産業機器は言うにおよばず、日常の生活にとっても、ます ます密接な関係をもち重要なものとなっています。


    Original     		PDF 2SC1815 EIAJ SD-121 JIS-C-7021 JIS C7021 B-11 MIL-STD-750b JIS C7021 A-11 eiaj 5,5 3,4 1,0 JIS C7021 A-6 C7021 JIS C7021

    C7021

    Abstract: PT600T C7035
    Text: v r e DATE : ‘REP4RED BY: 2’ “-” 1 lsPECNO. DG-953054 1 / 1 1 PAGE ELECTRONIC COMPONENTS GROUP REP E E~TATIVE,DIVISION SHARP CORPORATION o SPECIFICATION -w, ? O u“DEVICES.~IV. {/tFl/{44tl/ “ ‘“ 4 “ ‘-> < \ ~ DEVICE SPECIFICATION FOR PHOTO-TRANSISTOR


    Original     		PDF DG-953054 44tl/ PT60C C7021 PT600T C7035

    ST-100SX

    Abstract: MIL-STD-750b 100SX C5700 jis C5003 750H C5003 ST-100S YG6260 mosfet induction heater
    Text: [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices 1. Using Toshiba Semiconductors Safely TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless,


    Original     		PDF 2SK1544 ST-100SX MIL-STD-750b 100SX C5700 jis C5003 750H C5003 ST-100S YG6260 mosfet induction heater

    st-100sx

    Abstract: Arakawa ST-100SX jis C5003 mosfet induction heater MIL-STD-750b 750H C5003 C5700 ST-100S YG6260
    Text: [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices [ 4 ] Handling Guide for Semiconductor Devices 1. Using Toshiba Semiconductors Safely TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless,


    Original     		PDF 2SK1544 st-100sx Arakawa ST-100SX jis C5003 mosfet induction heater MIL-STD-750b 750H C5003 C5700 ST-100S YG6260

    zener DIODE A112

    Abstract: DC Motor control IGBT FUJI ELECTRIC ipm 7mbp75ra120 IGBT DRIVE 500V 300A 7MBP50RA120 application note 7MBP50RA06001 overcurrent circuit protection shock fuji ipm calculation of IGBT snubber TLP521-1GR
    Text: FUJI POWER SEMICONDUCTORS IGBT-IPM R-SERIES APPLICATION MANUAL 1 REH983 CONTENTS Chapter 1 Features 1.1 IGBT-IPM Characteristics. 3 1.2 R-IPM Characteristics. 4


    Original     		PDF REH983 zener DIODE A112 DC Motor control IGBT FUJI ELECTRIC ipm 7mbp75ra120 IGBT DRIVE 500V 300A 7MBP50RA120 application note 7MBP50RA06001 overcurrent circuit protection shock fuji ipm calculation of IGBT snubber TLP521-1GR

    Omron

    Abstract: Photomicrosensors dark detector application ,uses and working Automatic Voltage stabilizer 5 kw working of darlington photo transistor photo KW robot phototransistor microwaves EE-SX1018 garage door photoelectric EE-SX1041
    Text: Photomicrosensors Technical Information Features of Photomicrosensors The Photomicrosensor is a compact optical sensor that senses objects or object positions with an optical beam. The transmissive Photomicrosensor and reflective Photomicrosensor are typical Photomicrosensors.


    Original     		PDF X305-E-1 Omron Photomicrosensors dark detector application ,uses and working Automatic Voltage stabilizer 5 kw working of darlington photo transistor photo KW robot phototransistor microwaves EE-SX1018 garage door photoelectric EE-SX1041

    EE-SX1018

    Abstract: EE-SX1041 EE-SX1070 EE-SX198 EE-SY110 SX1042 SX199 phototransistor sensitive to red light EE-SG3 application EESK3W
    Text: Photomicrosensors Technical Information Features of Photomicrosensors The Photomicrosensor is a compact optical sensor that senses objects or object positions with an optical beam. The transmissive Photomicrosensor and reflective Photomicrosensor are typical Photomicrosensors.


    Original     		PDF JB301-E3-01 EE-SX1018 EE-SX1041 EE-SX1070 EE-SX198 EE-SY110 SX1042 SX199 phototransistor sensitive to red light EE-SG3 application EESK3W

    TOCP155K

    Abstract: JIS C7021 B-11 TOCP255K TOCP200K JIS D 4215 JIS F07 tocp100k TOFC200 TOFC200Q JIS F05
    Text: 解 [4] [4] 解 1. 説 説 光伝送デバイス トスリンク の概要 光伝送デバイスあるいは光通信用デバイスと聞くとどのような半導体素子を思い浮かべるでしょうか。 ほとんどの方が、光ファイバを使用して数十キロメートルの長距離伝送およびデジタル信号で数百メガ


    Original     		PDF OCP100K/155K OCP200K/255K OCP100PK/155PK OCP200PK/255PK PCK-201Q/202Q OCP100QK/150QKTOCP200QK OCP100XK/150XKTOCP200XK TOCP155K JIS C7021 B-11 TOCP255K TOCP200K JIS D 4215 JIS F07 tocp100k TOFC200 TOFC200Q JIS F05

    JIS C7021

    Abstract: JIS-C-7021 JIS C7021 B-10 JIS C 7021B-10 C7021A
    Text: • Soldering Instructions Iron soldering with 1.5mm iron tip Dip and flow soldering Types Temperature of the soldering bath Maximum soldering time Distance from solder joint to case Temperature of soldering iron Maximum soldering time Distance from solder joint


    OCR Scan     		PDF 10OOhrs 1000hrs p7021 C7021 C--25 30min- 30min C7021 JIS C7021 JIS-C-7021 JIS C7021 B-10 JIS C 7021B-10 C7021A

    Untitled

    Abstract: No abstract text available
    Text: K /D io d es pp pnp S « iiE ^ :ff flt 4 c o i ' T iiE ^ f i U t i (c o t ' T • ISttKp^cOtilStt \fi>tlt>tlit, OIj C b" ! ^ w,— t t i>\ Cftft', ^tt(7 TftUSt„ £ t£ g ift? T o nc-<n'9pnpf|i;:U:, » S « napS, fite (3) IH S tX flO T e S t/M ft'-i-S ftT ft tj,


    OCR Scan     		PDF si500mA) 500mA) ffl83fc& 400MHz) 00027/106B$ /10sB 0066/106B

    Toshiba b9 grease

    Abstract: grease toshiba b9 EIA and EIAJ standards for marking EIA and EIAJ standards IC 2 5/grease toshiba b9
    Text: 5.1. Quality assurance program The quality and reliability of semiconductor elements are closely related and important to our daily lives as well as to industrial equip­ ment. In this section is explained the quality assurance program as shown in Fig. 1 and


    OCR Scan     		PDF 168Hrs 2SD1406 150V140V^ 110V100V 70V60V50 168Hrs 500Hrs 500mA, Toshiba b9 grease grease toshiba b9 EIA and EIAJ standards for marking EIA and EIAJ standards IC 2 5/grease toshiba b9

    JIS C7021 A-11

    Abstract: No abstract text available
    Text: Transistors Quality assurance and reliability Quality assurance and reliability •Q ua lity Assurance Measures JIS Japan Industrial Standards defines reliability to be “the ability for an item to perform a required func­ tion under given conditions for a specified time”. This


    OCR Scan     		PDF

    JIS C7021 B-11

    Abstract: No abstract text available
    Text: Introduction Overview of manufacturing processes From the development stage through to the start of mass production, ROHM semiconductor devices are subject to multiple quality assurance verification tests to ensure that the final product will be reliable. Any product must pass all tests before mass production. At the start


    OCR Scan     		PDF

    chip die npn transistor

    Abstract: JIS C7021 B-11 JIS C7021 B-10
    Text: Introduction Quality assurance and reliability Quality assurance is defined in the JIS Japanese Industrial Standards as “the capability of an item to perform a required function under given conditions for an established period of time,” and can be expressed quantitatively in terms of failure rates and reliability levels.


    OCR Scan     		PDF

    2SC1254

    Abstract: JIS C7021 B-11 led Concave RS510
    Text: LED Structure, Characteristics and Operation | CHARACTERISTICS I LED BASIC STRUCTURE T h e LED Light E m itting Diode chip h as an internal P-N junction, and an electrode is provided on each surface of the chip to m ake ohm ic contact. T he P-N junction is form ed by


    OCR Scan     		PDF C7021 90-degree JIS-C7021 2SC1254 JIS C7021 B-11 led Concave RS510

    Untitled

    Abstract: No abstract text available
    Text: 5. Reliability of s e m i c o n d u c t o r s S .l. Q uality assurance program The quality and reliability of semiconductor elements are closely related and important to our daily lives as well as to industrial equip­ ment. In this section is explained the quality


    OCR Scan     		PDF 2SD1406 168Hrs 500Hrs 1000Hrs

    ATI Research

    Abstract: MIL-STD-750b
    Text: Reliability of semiconducto in a sta b ilized condition. T he ab ility of p ro d u c­ tion p ro cesses is confirm ed and p rio rity item s a re estab lish ed to rea lize ideal pro cess control, th u s p av in g th e w ay fo r su b se q u en t m ass p ro ­


    OCR Scan     		PDF 168Hrs 500Hre 2SK643 500H-S 100n- 500Hrs 700650J, ATI Research MIL-STD-750b

    Toshiba Power and Industrial Semiconductors

    Abstract: toshiba lot traceability
    Text: Quality Assurance Quality and Reliability Assurance In recent years, technical revolutions have become alm ost a daily occurrence in the electronics industry. This is accompanied by the increasing application of semiconductors in both the consumer and industrial sectors, and dem ands for higher quality and higher reliability.


    OCR Scan     		PDF FP144 Assurance-26 Toshiba Power and Industrial Semiconductors toshiba lot traceability