Untitled
Abstract: No abstract text available
Text: IOG17 page 1 2 3 4 sheet 1 2 3 FP date 1968.03 1968.03 1968.03 2001.05.17
|
Original
|
PDF
|
IOG17
|
con40a
Abstract: IOG20 S1D5 s1d0 iog-20 S0D14 S1D2 s1d1 SCSI 2 26 pin connector
Text: A B C D E 4 4 USB 3 SCSI WIDE -usb2_vmo -usb2_speed usb2_vp -usb1_speed usb1_oe\ - SCSI 8bit General I/O ATA-IDE S0D14 S1D6\ S0D12\ S1D4\ S0D10\ S1D2\ S0D8\ S1D0\ S0ENHID\S1BSY S1OE S1OE -S1ACK\ -S1CD\ -S1REQ\ S0P1\ S1P\ - IOg22
|
Original
|
PDF
|
S0D14
S0D12\
S0D10\
IOg22
IOg20
IOg18
IOg16
IOg24
P1D6/P0D14
--H18
con40a
IOG20
S1D5
s1d0
iog-20
S1D2
s1d1
SCSI 2 26 pin connector
|
FBGA672
Abstract: ioa18 fbga672 paging EPF8282A EPF8282AV EPF8636A EPF8820A EPM7032S EPM7064S AGILENT TECHNOLOGIES 3070
Text: IEEE 1149.1 JTAG Boundary-Scan Testing in Altera Devices June 2005, ver. 6.0 Introduction Application Note 39 As printed circuit boards (PCBs) become more complex, the need for thorough testing becomes increasingly important. Advances in surfacemount packaging and PCB manufacturing have resulted in smaller
|
Original
|
PDF
|
1980s,
FBGA672
ioa18
fbga672 paging
EPF8282A
EPF8282AV
EPF8636A
EPF8820A
EPM7032S
EPM7064S
AGILENT TECHNOLOGIES 3070
|
FBGA672
Abstract: IOAD16 8 IOG20 AGILENT TECHNOLOGIES 3070 ioa18 ieee 1532 EPC16 EPF81500A EPF8282A EPF8636A
Text: IEEE 1149.1 JTAG Boundary-Scan Testing in Altera Devices June 2005, ver. 6.0 Introduction Application Note 39 As printed circuit boards PCBs become more complex, the need for thorough testing becomes increasingly important. Advances in surfacemount packaging and PCB manufacturing have resulted in smaller
|
Original
|
PDF
|
1980s,
FBGA672
IOAD16 8
IOG20
AGILENT TECHNOLOGIES 3070
ioa18
ieee 1532
EPC16
EPF81500A
EPF8282A
EPF8636A
|
RadTol Eclipse FPGA
Abstract: f1 j39 CERAMIC QUAD FLATPACK CQFP F1 J37 transistor f1 j39 UT6325 J42-J45 ioa18 j78 transistor IOG10
Text: Standard Products UT8RHEEB-288PC RadTol Eclipse FPGA UT6325 Evaluation Board Advanced Data Sheet September 2008 www.aeroflex.com/FPGA INTRODUCTION FEATURES User configurable evaluation board for the UT6325 RadTol Eclipse FPGA Available with both 280-plastic ball grid array PBGA and
|
Original
|
PDF
|
UT8RHEEB-288PC
UT6325
280-plastic
288-ceramic
10K-ohm
10K-ohm
RadTol Eclipse FPGA
f1 j39
CERAMIC QUAD FLATPACK CQFP
F1 J37
transistor f1 j39
J42-J45
ioa18
j78 transistor
IOG10
|
Untitled
Abstract: No abstract text available
Text: IO G -17 VACUUM GAUGE HEAD , BAYARD-ALPERT TYPE G lass envelope, u ltra -h ig h vacuum gauge head of the B ay ard -A lp ert typ e. M easuring ran ge 1 0 ~ 3 t o r r to 1 0 _ 1 0 tDr r ; sen sitiv ity ap p rox. 12 p er t o r r . T h e gauge head is provided with two fila m e n ts, one of tungsten and one of lanthanum
|
OCR Scan
|
PDF
|
IOG-17
IO-10
7Z0917Â
IOG17
|