Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    GENERIC FAILURE RATE ELECTRONIC EQUIPMENT Search Results

    GENERIC FAILURE RATE ELECTRONIC EQUIPMENT Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    SSM6J808R Toshiba Electronic Devices & Storage Corporation MOSFET, P-ch, -40 V, -7 A, 0.035 Ohm@10V, TSOP6F, AEC-Q101 Visit Toshiba Electronic Devices & Storage Corporation
    SSM6K819R Toshiba Electronic Devices & Storage Corporation MOSFET, N-ch, 100 V, 10 A, 0.0258 Ohm@10V, TSOP6F, AEC-Q101 Visit Toshiba Electronic Devices & Storage Corporation
    SSM6K809R Toshiba Electronic Devices & Storage Corporation MOSFET, N-ch, 60 V, 6.0 A, 0.036 Ohm@10V, TSOP6F, AEC-Q101 Visit Toshiba Electronic Devices & Storage Corporation
    SSM6K504NU Toshiba Electronic Devices & Storage Corporation MOSFET, N-ch, 30 V, 9.0 A, 0.0195 Ohm@10V, UDFN6B, AEC-Q101 Visit Toshiba Electronic Devices & Storage Corporation
    SSM3K361R Toshiba Electronic Devices & Storage Corporation MOSFET, N-ch, 100 V, 3.5 A, 0.069 Ohm@10V, SOT-23F, AEC-Q101 Visit Toshiba Electronic Devices & Storage Corporation

    GENERIC FAILURE RATE ELECTRONIC EQUIPMENT Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    TL431 zener

    Abstract: ferrite TRANSFORMER calculation transformer mtbf Zener Diode tl431 generic failure rate electronic equipment generic failure rate electronic device transistor MTBF MIL-HDBK-217F generic failure rate regulator mtbf
    Text: Switching Power Supply/Adaptor MTBF Report CSS65 Part No. : Description : 2 X 4 Medical series Date : 2009.04.02 MTBF Model The calculation is based on MIL-HDBK-217F, Notice 1, Appendix A: Parts Count Reliability. The prediction were performed with the power supply operating in a Ground Benign Gb controlled environment


    Original     		PDF CSS65 MIL-HDBK-217F, MIL-HDBK-217F TL431/Zener TL431 zener ferrite TRANSFORMER calculation transformer mtbf Zener Diode tl431 generic failure rate electronic equipment generic failure rate electronic device transistor MTBF MIL-HDBK-217F generic failure rate regulator mtbf

    EMI filter ferrite bead mtbf

    Abstract: transformer mtbf generic failure rate electronic device TL431 zener ferrite TRANSFORMER calculation Zener Diode tl431 TL431 transistor transformer calculation MIL-HDBK-217F transistor MTBF
    Text: Switching Power Supply/Adaptor MTBF Report CSS150 SERIES Part No. : Description : 12Vdc/12.5Amp Sample Date : 2009.09.21 MTBF Model The calculation is based on MIL-HDBK-217F, Notice 1, Appendix A: Parts Count Reliability. The prediction were performed with the power supply operating in a Ground Benign (Gb) controlled environment


    Original     		PDF CSS150 12Vdc/12 MIL-HDBK-217F, MIL-HDBK-217F TL431/Zener EMI filter ferrite bead mtbf transformer mtbf generic failure rate electronic device TL431 zener ferrite TRANSFORMER calculation Zener Diode tl431 TL431 transistor transformer calculation MIL-HDBK-217F transistor MTBF

    generic failure rate electronic device

    Abstract: TC35856F "network interface cards"
    Text: TOSHIBA TC35856F 155 Mbps ATM PCI-SAR Features Description – – – – – – – The TC35856F is a single-chip, 155 Megabits per second Mbps segmentation assembly and reassembly (SAR) device with a PCI interface. It has hardware implemented ATM Forum-compliant


    Original     		PDF TC35856F TC35856F, generic failure rate electronic device "network interface cards"

    1769-SDN

    Abstract: 1769-sdn scanner micrologix 1500 error codes RSNETWORX CONFIGURATION 1770-KFD 1764-LRP Allen-Bradley 1485C DeviceNet cable CNET-UM001 1485A-C2 1769-UM009C-EN-P
    Text: Compact I/O 1769-SDN DeviceNet Scanner Module 1769-SDN User Manual Important User Information Solid state equipment has operational characteristics differing from those of electromechanical equipment. Safety Guidelines for the Application, Installation and Maintenance of Solid State Controls Publication SGI-1.1


    Original     		PDF 1769-SDN 1769-UM009C-EN-P 1769-UM009B-EN-P 1769-SDN 1769-sdn scanner micrologix 1500 error codes RSNETWORX CONFIGURATION 1770-KFD 1764-LRP Allen-Bradley 1485C DeviceNet cable CNET-UM001 1485A-C2

    transistor MTBF

    Abstract: thyristor 106 generic failure rate failure rate fuse generic failure rate electronic device Thyristor SCR DSA00347 failure rate connector "failure rate" fuse thyristor MTBF
    Text: MTBF Report KMS40-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		PDF KMS40-xx MIL-HDBK-217f, failures/106 Failures/10 transistor MTBF thyristor 106 generic failure rate failure rate fuse generic failure rate electronic device Thyristor SCR DSA00347 failure rate connector "failure rate" fuse thyristor MTBF

    transistor MTBF

    Abstract: generic failure rate electronic device generic failure rate
    Text: MTBF Report KMS15-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		PDF KMS15-xx MIL-HDBK-217f, failures/106 Failures/10 transistor MTBF generic failure rate electronic device generic failure rate

    generic failure rate electronic device

    Abstract: ferrite fuse Zener 224 TOGGLE CLIP generic failure rate electronic equipment generic failure rate Thyristor SCR failure rate fuse transistor MTBF thermistor 054
    Text: MTBF Report KMD40-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		PDF KMD40-xx MIL-HDBK-217f, failures/106 Failures/10 generic failure rate electronic device ferrite fuse Zener 224 TOGGLE CLIP generic failure rate electronic equipment generic failure rate Thyristor SCR failure rate fuse transistor MTBF thermistor 054

    transistor MTBF

    Abstract: failure rate fuse generic failure rate generic failure rate electronic device varistor rectifier generic failure rate electronic equipment Thyristor SCR
    Text: MTBF Report KMT15-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		PDF KMT15-xx MIL-HDBK-217f, failures/106 Failures/10 transistor MTBF failure rate fuse generic failure rate generic failure rate electronic device varistor rectifier generic failure rate electronic equipment Thyristor SCR

    generic failure rate

    Abstract: transistor MTBF Thyristor SCR ferrite fuse failure rate fuse "failure rate" fuse generic failure rate electronic equipment generic failure rate electronic device Quality Thermistor ceramics SCR 612
    Text: MTBF Report KMT40-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		PDF KMT40-xx MIL-HDBK-217f, failures/106 Failures/10 generic failure rate transistor MTBF Thyristor SCR ferrite fuse failure rate fuse "failure rate" fuse generic failure rate electronic equipment generic failure rate electronic device Quality Thermistor ceramics SCR 612

    generic failure rate

    Abstract: generic failure rate electronic device failure rate fuse 0638 ferrite fuse "failure rate" fuse
    Text: MTBF Report KMD15-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		PDF KMD15-xx MIL-HDBK-217f, failures/106 Failures/10 generic failure rate generic failure rate electronic device failure rate fuse 0638 ferrite fuse "failure rate" fuse

    Untitled

    Abstract: No abstract text available
    Text: AOS Semiconductor Product Reliability Report AOZ8175DI, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com 1 This AOS product reliability report summarizes the qualification result for AOZ8175DI. Review of the electrical test results confirm that AOZ8175DI pass AOS quality and reliability


    Original     		PDF AOZ8175DI, AOZ8175DI. AOZ8175DI 2x5x77x168x258] 10-5eV

    Untitled

    Abstract: No abstract text available
    Text: AOS Semiconductor Product Reliability Report AOZ8170DT, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com 1 This AOS product reliability report summarizes the qualification result for AOZ8170DT. Review of the electrical test results confirm that AOZ8170DT pass AOS quality and reliability


    Original     		PDF AOZ8170DT, AOZ8170DT. AOZ8170DT 2x5x77x168x258] 10-5eV

    quality acceptance plan

    Abstract: JESD22-102 JESD22-105 generic failure rate electronic device JESD22-A103 JESD22-A108 JESD22-A101 JESD22-A102 Fairchild wafer fab processes outgoing quality
    Text: QUALITY Reliability Qualification Program Fairchild Semiconductor is committed to delivering the highest level of quality and reliability to its customers. Fairchild supplies components for the most demanding applications with guaranteed parametric limits spanning commercial, automotive,


    Original     		PDF

    1756-hsc

    Abstract: 1756-hsc wiring Allen-Bradley Incremental Differential Line Driver Encoders 845h incremental encoder 75als192 RSLOGIX 500 LADDER 1756-UM007B-EN-P 1756-IN018 Allen-Bradley 1756-if16 1756-IF16
    Text: ControlLogix High-speed Counter Module Catalog Number 1756-HSC User Manual Important User Information Solid state equipment has operational characteristics differing from those of electromechanical equipment. Safety Guidelines for the Application, Installation and Maintenance of Solid State Controls publication SGI-1.1 available from your local Rockwell


    Original     		PDF 1756-HSC RA-DU002, 1756-UM007B-EN-P 1756-UM007A-EN-P 1756-hsc 1756-hsc wiring Allen-Bradley Incremental Differential Line Driver Encoders 845h incremental encoder 75als192 RSLOGIX 500 LADDER 1756-IN018 Allen-Bradley 1756-if16 1756-IF16

    PFRR

    Abstract: No abstract text available
    Text: PFRR www.vishay.com ESCC Vishay 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pr • Temperature coefficient to: 10 ppm/°C • Very low noise (< - 35 dB) and voltage coefficient


    Original     		PDF MIL-PRF-55342G 2011/65/EU 2002/95/EC. 2002/95/EC 2011/65/EU. 12-Mar-12 PFRR

    PFRR

    Abstract: No abstract text available
    Text: PFRR www.vishay.com ESCC Vishay 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pr • Temperature coefficient to: 10 ppm/°C • Very low noise (< - 35 dB) and voltage coefficient


    Original     		PDF 2002/95/EC. 2002/95/EC 2011/65/EU. JS709A 02-Oct-12 PFRR

    PFRR

    Abstract: No abstract text available
    Text: PFRR www.vishay.com ESCC Vishay 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pr • Temperature coefficient to: 10 ppm/°C • Very low noise (< - 35 dB) and voltage coefficient


    Original     		PDF 2011/65/EU 2002/95/EC. 2002/95/EC 2011/65/EU. 12-Mar-12 PFRR

    CRCW1206100

    Abstract: 562R CRCW.... EN802
    Text: CRCW. EN802 Vishay Draloric Lead Pb -Free Thick Film Chip Resistors with CECC Approval, Available with Established Reliability FEATURES • Approved to EN 140401-802, version E, with established reliability, failure rate level E6  Approved to EN 140401-802, version A, without


    Original     		PDF EN802 2002/95/EC 2002/95/EC. 2002/95/EC 2011/65/EU. JS709A 02-Oct-12 CRCW1206100 562R CRCW.... EN802

    EN140401-802

    Abstract: EZ 422 CRCW.... EN802
    Text: CRCW. EN802 Vishay Draloric Lead Pb -Free Thick Film Chip Resistors with CECC Approval, Available with Established Reliability FEATURES • Approved to EN 140401-802, version E, with established reliability, failure rate level E6  Approved to EN 140401-802, version A, without


    Original     		PDF EN802 2002/95/EC 2011/65/EU 2002/95/EC. 2002/95/EC 2011/65/EU. 12-Mar-12 EN140401-802 EZ 422 CRCW.... EN802

    AA-555

    Abstract: No abstract text available
    Text: FRJ Vishay Dale Metal Film Resistors, Zero Ohm Jumper, Industrial FEATURES • Provides low resistance circuit interconnections • Color band marking for ease of identification after mounting • Flame retardant coating • Compatible with automatic insertion equipment


    Original     		PDF 2002/95/EC FRJ50 FRJ-50 2011/65/EU 2002/95/EC. 2002/95/EC 2011/65/EU. 12-Mar-12 AA-555

    RC3715

    Abstract: smm0204
    Text: SMM0204 . EN803 E8 Vishay Draloric MINI-MELF Resistors with Established Reliability FEATURES • Approved to EN 140401-803, version E • Established reliability, failure rate level E8 • Stable metal film on high quality ceramic • Compatible with lead Pb -free and lead


    Original     		PDF SMM0204 EN803 2002/95/EC 2011/65/EU 2002/95/EC. 2002/95/EC 2011/65/EU. 12-Mar-12 RC3715 smm0204

    intermediat

    Abstract: capacitor 2D EIA-198 KKE0065-1 KKE0141-U KKE0148-H KKE0282-3 KKE0291-2 KKE0362-U-E material composition of chip capacitors
    Text: Multilayer ceramic capacitors General technical information Date: October 2006 Data Sheet ã EPCOS AG 2006. Reproduction, publication and dissemination of this data sheet and the information contained therein without EPCOS’ prior express consent is prohibited.


    Original     		PDF 198-1-F, intermediat capacitor 2D EIA-198 KKE0065-1 KKE0141-U KKE0148-H KKE0282-3 KKE0291-2 KKE0362-U-E material composition of chip capacitors

    smd RESISTORS 0603 1M OHM

    Abstract: No abstract text available
    Text: MCS 0402 VG01, MCT 0603 VG01, MCU 0805 VG01, MCA 1206 VG01 Vishay Beyschlag Thin Film Chip Resistors with Established Reliability FEATURES • • • • • • Approved to EN 140401-801, version E Established reliability, failure rate level E6 Advanced thin film technology


    Original     		PDF 2002/95/EC 2011/65/EU 2002/95/EC. 2002/95/EC 2011/65/EU. 12-Mar-12 smd RESISTORS 0603 1M OHM

    CRCW1206

    Abstract: CRCW.... EN802
    Text: CRCW. EN802 Vishay Draloric Lead Pb -Free Thick Film Chip Resistors with CECC Approval, Available with Established Reliability FEATURES • Approved to EN 140401-802, version E, with established reliability, failure rate level E6  Approved to EN 140401-802, version A, without


    Original     		PDF EN802 2002/95/EC 11-Mar-11 CRCW1206 CRCW.... EN802