Please enter a valid full or partial manufacturer part number with a minimum of 3 letters or numbers

    GENERIC FAILURE RATE Search Results

    GENERIC FAILURE RATE Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    MP-54RJ45DNNE-100 Amphenol Cables on Demand Amphenol MP-54RJ45DNNE-100 Cat5e STP Double Shielded Patch Cable (Braid+Foil Screened) with RJ45 Connectors - 350MHz CAT5e Rated 100ft Datasheet
    MP-54RJ45DNNE-015 Amphenol Cables on Demand Amphenol MP-54RJ45DNNE-015 Cat5e STP Double Shielded Patch Cable (Braid+Foil Screened) with RJ45 Connectors - 350MHz CAT5e Rated 15ft Datasheet
    MP-54RJ45SNNE-050 Amphenol Cables on Demand Amphenol MP-54RJ45SNNE-050 Cat5e STP Shielded Patch Cable (Foil-Screened) with RJ45 Connectors - 350MHz CAT5e Rated 50ft Datasheet
    MP-54RJ45DNNE-005 Amphenol Cables on Demand Amphenol MP-54RJ45DNNE-005 Cat5e STP Double Shielded Patch Cable (Braid+Foil Screened) with RJ45 Connectors - 350MHz CAT5e Rated 5ft Datasheet
    MP-54RJ45SNNE-010 Amphenol Cables on Demand Amphenol MP-54RJ45SNNE-010 Cat5e STP Shielded Patch Cable (Foil-Screened) with RJ45 Connectors - 350MHz CAT5e Rated 10ft Datasheet

    GENERIC FAILURE RATE Datasheets Context Search

    Catalog Datasheet Type Document Tags PDF

    BELLCORE

    Abstract: TR332 generic failure rate TR322 TR-332
    Text: Document 235 F-I-T Calculation Chip Inductors Coilcraft uses the Bellcore method TR322 to calculate the failure rate for chip inductor products. Bellcore TR322 uses actual field failure history of devices to define the generic device failure rate (similar to mil std.217). This is then adjusted for:


    Original     		TR322) TR322 failure/109 TR332 BELLCORE generic failure rate TR-332 PDF

    transistor MTBF

    Abstract: thyristor 106 generic failure rate failure rate fuse generic failure rate electronic device Thyristor SCR DSA00347 failure rate connector "failure rate" fuse thyristor MTBF
    Text: MTBF Report KMS40-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		KMS40-xx MIL-HDBK-217f, failures/106 Failures/10 transistor MTBF thyristor 106 generic failure rate failure rate fuse generic failure rate electronic device Thyristor SCR DSA00347 failure rate connector "failure rate" fuse thyristor MTBF PDF

    transistor MTBF

    Abstract: generic failure rate electronic device generic failure rate
    Text: MTBF Report KMS15-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		KMS15-xx MIL-HDBK-217f, failures/106 Failures/10 transistor MTBF generic failure rate electronic device generic failure rate PDF

    generic failure rate electronic device

    Abstract: ferrite fuse Zener 224 TOGGLE CLIP generic failure rate electronic equipment generic failure rate Thyristor SCR failure rate fuse transistor MTBF thermistor 054
    Text: MTBF Report KMD40-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		KMD40-xx MIL-HDBK-217f, failures/106 Failures/10 generic failure rate electronic device ferrite fuse Zener 224 TOGGLE CLIP generic failure rate electronic equipment generic failure rate Thyristor SCR failure rate fuse transistor MTBF thermistor 054 PDF

    transistor MTBF

    Abstract: failure rate fuse generic failure rate generic failure rate electronic device varistor rectifier generic failure rate electronic equipment Thyristor SCR
    Text: MTBF Report KMT15-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		KMT15-xx MIL-HDBK-217f, failures/106 Failures/10 transistor MTBF failure rate fuse generic failure rate generic failure rate electronic device varistor rectifier generic failure rate electronic equipment Thyristor SCR PDF

    generic failure rate

    Abstract: transistor MTBF Thyristor SCR ferrite fuse failure rate fuse "failure rate" fuse generic failure rate electronic equipment generic failure rate electronic device Quality Thermistor ceramics SCR 612
    Text: MTBF Report KMT40-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		KMT40-xx MIL-HDBK-217f, failures/106 Failures/10 generic failure rate transistor MTBF Thyristor SCR ferrite fuse failure rate fuse "failure rate" fuse generic failure rate electronic equipment generic failure rate electronic device Quality Thermistor ceramics SCR 612 PDF

    generic failure rate

    Abstract: generic failure rate electronic device failure rate fuse 0638 ferrite fuse "failure rate" fuse
    Text: MTBF Report KMD15-xx Referring to MIL-HDBK-217f, Notice 1,APPENDIX A : PARTS COUNT RELIABLILITY PREDICTION ,PREDICT the MTBF. Testing Conditions : According to applicant's specifications Environmental factor E : Ground Benign (Gb) g :Generic failure rate (failures/106 hours)


    Original     		KMD15-xx MIL-HDBK-217f, failures/106 Failures/10 generic failure rate generic failure rate electronic device failure rate fuse 0638 ferrite fuse "failure rate" fuse PDF

    generic failure rate

    Abstract: billion ENERGY LTC1695
    Text: RELIABILITY DATA LTC1695 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SOIC/SOT/MSOP SAMPLE SIZE OLDEST DATE CODE 80 0001 80 1 Assumes Activation Energy = 0.7 Electron Volts (2) Not Enough Data to Predict Failure Rate (3) Refer to Rel Data Pack for Generic Product Family Data


    Original     		LTC1695 00-03-6209B. generic failure rate billion ENERGY LTC1695 PDF

    metal oxide in capacitor

    Abstract: capacitor porous
    Text: V I S H A Y I N T E R T E C H N O L O G Y, I N C . DC LEAKAGE FAILURE MODE Abstract This paper is submitted as an educational medium for use by anyone who has interest in solid tantalum chip capacitor performance. It represents technical phenomena that are generic to all solid tantalum chip


    Original     		VSD-TN0003-0402 17-Mar-04 metal oxide in capacitor capacitor porous PDF

    VISHAY film resistors

    Abstract: PFRR
    Text: PFRR Vishay Sfernice ESCC 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pn • Temperature coefficient to: 10 ppm/°C • Very low noise (< 35 dB) and voltage coefficient


    Original     		11-Mar-11 VISHAY film resistors PFRR PDF

    0402 resistor ipc-7351

    Abstract: PFRR
    Text: PFRR www.vishay.com Vishay ESCC 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pn • Temperature coefficient to: 10 ppm/°C • Very low noise (< - 35 dB) and voltage coefficient


    Original     		2011/65/EU 2002/95/EC. 2002/95/EC 2011/65/EU. 12-Mar-12 0402 resistor ipc-7351 PFRR PDF

    mil-std 883d method 1010

    Abstract: No abstract text available
    Text: QUALITY & RELIABILITY CYPRESS 2001 Q1 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination


    Original     		PDF

    tsop 928

    Abstract: No abstract text available
    Text: QUALITY & RELIABILITY CYPRESS 2001 Q2 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination


    Original     		PDF

    PFRR

    Abstract: No abstract text available
    Text: PFRR www.vishay.com ESCC Vishay 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pr • Temperature coefficient to: 10 ppm/°C • Very low noise (< - 35 dB) and voltage coefficient


    Original     		MIL-PRF-55342G 2011/65/EU 2002/95/EC. 2002/95/EC 2011/65/EU. 12-Mar-12 PFRR PDF

    VISHAY film resistors

    Abstract: vishay 0603 SMD resistors vishay 0805 SMD resistors
    Text: V is h ay I n tertec h n o l o g y, I n c . PFRR Key Benefits • ESA qualified • R Failure rate SMD chip resistor • TCR to 10ppm [–55 °C; +155 °C] • Tolerances down to 0.05 % • Load life stability: less than 0.25 % at Pn at 70 °C after 2000 hours


    Original     		10ppm VMN-PT0205-1004 VISHAY film resistors vishay 0603 SMD resistors vishay 0805 SMD resistors PDF

    PFRR

    Abstract: No abstract text available
    Text: PFRR www.vishay.com ESCC Vishay 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pr • Temperature coefficient to: 10 ppm/°C • Very low noise (< - 35 dB) and voltage coefficient


    Original     		2011/65/EU 2002/95/EC. 2002/95/EC 2011/65/EU. 12-Mar-12 PFRR PDF

    Untitled

    Abstract: No abstract text available
    Text: QUALITY & RELIABILITY CYPRESS 2000 Q4 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination


    Original     		PDF

    cmos tsmc 0.18

    Abstract: reliability data analysis report failure test report
    Text: QUALITY & RELIABILITY CYPRESS 2000 Q3 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination


    Original     		PDF

    cmos tsmc 0.18

    Abstract: No abstract text available
    Text: CYPRESS QUALITY & RELIABILITY 2000 Q2 RELIABILITY REPORT TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS MANAGEMENT SYSTEM SEMICONDUCTOR 2.0 EARLY FAILURE RATE SUMMARY 2.1 Early Failure Rate Determination 3.0 LONG TERM FAILURE RATE SUMMARY 3.1 Long Term Failure Rate Determination


    Original     		PDF

    PFRR

    Abstract: No abstract text available
    Text: PFRR www.vishay.com ESCC Vishay 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pr • Temperature coefficient to: 10 ppm/°C • Very low noise (< - 35 dB) and voltage coefficient


    Original     		2002/95/EC. 2002/95/EC 2011/65/EU. JS709A 02-Oct-12 PFRR PDF

    PFRR

    Abstract: No abstract text available
    Text: PFRR www.vishay.com ESCC Vishay 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pn • Temperature coefficient to: 10 ppm/°C • Very low noise (< -35 dB) and voltage coefficient


    Original     		2002/95/EC. 2002/95/EC 2011/65/EU. JS709A 02-Oct-12 PFRR PDF

    CY7B9532V

    Abstract: CY7C9536 OC48
    Text: ADVANCE INFORMATION CY7C9536 Packet over SONET/SDH IC - POSIC Features • OC-48/STS-48/STM-16, OC-12/STS-12/STM-4, OC-3/STS3/STM-1 rates, Concatenated and Nonconcatenated — Complies with ITU-Standards G.707/Y.1322 & G.783 • Programmable Frame Tagging Engine, for packet preclassification, enables features such as:


    Original     		CY7C9536 OC-48/STS-48/STM-16, OC-12/STS-12/STM-4, 707/Y GR253 16xOC-3 4xOC-12 CY7C9536 CY7B9532V OC48 PDF

    IEC 68-2-30

    Abstract: ESCC 4001 escc Vishay PHR Marking 4001 Vishay PFRR
    Text: PFRR Vishay Sfernice ESCC 4001/023 Qualified R Failure Rate High Precision (10 ppm/°C, 0.05 %) Thin Film Chip Resistors FEATURES • Load life stability at ± 70 °C for 2000 h: 0.25 % under Pn • Temperature coefficient to: 10 ppm/°C • Very low noise (< 35 dB) and voltage coefficient


    Original     		18-Jul-08 IEC 68-2-30 ESCC 4001 escc Vishay PHR Marking 4001 Vishay PFRR PDF

    ESCC 4001

    Abstract: ESCC 4001/026 p0603 VMN-SG21 CS22 CS33 RMK22N RMK515N RMK55N VMN-SG2135-1007
    Text: V i s h ay I n t e r t e c h n o l o g y, I n c . High Reliability Products Features • CECC qualified • ESCC qualified Space level and R Failure Rate • ESCC QML qualification • Products to Source Control Drawing APPLICATIONS • Space (satellites, launcher, International Space Station)


    Original     		VMN-SG2135-1007 ESCC 4001 ESCC 4001/026 p0603 VMN-SG21 CS22 CS33 RMK22N RMK515N RMK55N VMN-SG2135-1007 PDF