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Abstract: No abstract text available
Text: 03/12/2004 RELIABILITY REPORT FOR DS1961S Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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DS1961S
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FP4527
Abstract: PHYSICAL DIMENSIONS JESD22-B100 JESD22-B117 fr 0204 JEDEC JESD22-B117 j-std-020 JESD22-B100 JSTD-020 catalyst tester FP452
Text: 01/31/2003 RELIABILITY REPORT FOR DS21Q48 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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DS21Q48
FA30006154)
FP4527
PHYSICAL DIMENSIONS JESD22-B100
JESD22-B117
fr 0204
JEDEC JESD22-B117
j-std-020
JESD22-B100
JSTD-020
catalyst tester
FP452
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FP4527
Abstract: 200G DS1963S Hysol
Text: 03/11/2003 RELIABILITY REPORT FOR DS1963S Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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DS1963S
FP4527
200G
DS1963S
Hysol
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FP4527
Abstract: FP4323 Hysol Dexter IEC-1000-4-2 Maxim ic date code DS1961S FP452 FR 525
Text: 03/12/2004 RELIABILITY REPORT FOR DS1961S Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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Original
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PDF
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DS1961S
FP4527
FP4323
Hysol
Dexter
IEC-1000-4-2
Maxim ic date code
DS1961S
FP452
FR 525
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