73247
Abstract: No abstract text available
Text: 2014 | | CATALOGO GENERALE - GENERAL CATALOGUE | Via E. Fermi, 40/42 20090 Assago, MI | Italia Tel. +39 02 93977.1 Fax +39 02 93904565 info@italweber.it www.italweber.it CATALOGO GENERALE | 2014 2014 2014 | | CATALOGO GENERALE - GENERAL CATALOGUE | | CATALOGO
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AS3993
Abstract: No abstract text available
Text: Application Note: UHF RFID Fermi Reader HW-Description AS3993 UHF RFID Single Chip Reader EPC Class1 Gen2 Compatible www.ams.com Revision 1.0 / 2012/06/26 AS3993 – AN13 – Received Signal Strength Indicator RSSI Table of Contents 1. Introduction . 2
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AS3993
AS3993
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Robinson Nugent PAK-50
Abstract: resistor 270 ohm ECU-V1H100DCN EPM9320ARC208-10 ECU-V1H471JCX 3 pins Variable resistor 10K ohm through hole 26 pin ecu connectors miniSMDC035 ERJ-6GEYJ10KV MINISMDC035-2
Text: SCLR 06/06/00 Fermi National Accelerator Laboratory D0 Trigger Distribution System Serial Command Link Receiver SCLR June 6, 2000 Bill Haynes, Thinh Pham, Neal Wilcer and Ted Zmuda -TZ page i SCLR 6/6/00 1 GENERAL INFORMATION . 2
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160-1169-1-ND
64-pin
160-1170-1-ND
MINISMDC035-2
Robinson Nugent PAK-50
resistor 270 ohm
ECU-V1H100DCN
EPM9320ARC208-10
ECU-V1H471JCX
3 pins Variable resistor 10K ohm through hole
26 pin ecu connectors
miniSMDC035
ERJ-6GEYJ10KV
MINISMDC035-2
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VARTA 3/V
Abstract: varta 55615 703 012 100uF 450v capacitor electrolytic 220V LED Bulb circuit diagram VARTA 3/v 150 ELECTROLYTIC capacitor, .10uF 50V capacitor 100uf 50v pin identification electrolytic capacitor date code 100uF (M) capacitor filter 747D452M035AA2A
Text: LeCroy 1440 System Manual f Fermi National Accelerator Laboratory Equipment Support Department Authored by Tom Boes Contributions by Hank Connor, Stew Bledsoe, Tim Kasza, Adam Walters July 11, 2003 LeCroy 1440 System Manual Purpose of this document This information in this manual is primarily intended for expert
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100uF/450V
100uF
650uF,
10-Watt
100uF/450V
VARTA 3/V
varta 55615 703 012
100uF 450v capacitor electrolytic
220V LED Bulb circuit diagram
VARTA 3/v 150
ELECTROLYTIC capacitor, .10uF 50V
capacitor 100uf 50v pin identification
electrolytic capacitor date code
100uF (M) capacitor filter
747D452M035AA2A
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photo darlington sensor
Abstract: light sensitive trigger circuit Application TRansistor A 940 cmos light DETECTOR CIRCUIT DIAGRAM injection molding machine PHOTO GAP DETECTOR infrared emitters and detectors light detector Reflective photosensor "Infrared LED" 880 nm wavelength circuits
Text: Sensors Sensors Sensors FEmitters 1 Infrared LEDs (1) Principle In the absence of an externally applied voltage, the P-N junction of a diode will be at thermal equilibrium and the Fermi levels of the P layer and N layer will be equal (Fig. 1 (a). In this case, the height of the potential barrier will
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Untitled
Abstract: No abstract text available
Text: Sensors Sensors Sensors FEmitters 1 Infrared LEDs (1) Principle In the absence of an externally applied voltage, the P-N junction of a diode will be at thermal equilibrium and the Fermi levels of the P layer and N layer will be equal (Fig. 1 (a). In this case, the height of the potential barrier will
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AN2386
Abstract: Atlas silvaco 14047 silvaco
Text: AN2386 Application note How to achieve the threshold voltage thermal coefficient of the MOSFET acting on design parameters Introduction Today, the MOSFET devices are used mainly as switches in electronic circuits. In such operational conditions, the MOSFET device works in switch on and switch off modes.
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AN2386
AN2386
Atlas silvaco
14047
silvaco
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Untitled
Abstract: No abstract text available
Text: Solid-State Electronics 48 2004 1717–1720 www.elsevier.com/locate/sse Reliability of SiC MOS devices q Ranbir Singh *, Allen R. Hefner National Institute of Standards and Technology, 100 Bureau Dr. MS 8120, Gaithersburg, MD 20899, USA Received 10 December 2003; accepted 15 March 2004
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15R-SiC
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Abstract: No abstract text available
Text: CHAPTER 2 BASIC PRINCIPLES OF PHOTOMULTIPLIER TUBES 1 -5) A photomultiplier tube is a vacuum tube consisting of an input window, a photocathode, focusing electrodes, an electron multiplier and an anode usually sealed into an evacuated glass tube. Figure 2-1 shows the schematic
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10P-4)
0201EA
NS-17,
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Untitled
Abstract: No abstract text available
Text: artville Opportunities and Challenges in Realizing the Full Potential of SiC Power Devices Ranbir Singh and Michael Pecht 1932-4529/08/$25.00©2008 IEEE E volutionary improvements in silicon Si power devices through better device designs, processing techniques, and material quality have
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r1996,
XVI-14.
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InP transistor HEMT
Abstract: Gan on silicon transistor AlGaN/GaN HEMTs GaN TRANSISTOR MMIC POWER AMPLIFIER hemt Fermi level inp hemt power amplifier
Text: TECHNOLOGY T RANSISTORS High-power GaN HEMTs battle for vacuum-tube territory US NAVY The vacuum tubes used in today’s millimeter-wave transmitters face an increasing threat from GaN HEMTs. Cree’s Yifeng Wu and Primit Parikh are leading the GaN charge with designs that
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sm 4205
Abstract: No abstract text available
Text: CONDUCTIVITY MECHANISMS AND BREAKDOWN CHARACTERISTICS OF NIOBIUM OXIDE CAPACITORS J. Sikula, J. Hlavka, V. Sedlakova and L. Grmela Czech Noise Research Laboratory, Brno University of Technology Technicka 8, 603 00 Brno, Czech Republic Tel. +4205 41143328 Fax. +4205 41143398 E-mail: sikula@feec.vutbr.cz
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D100/10
sm 4205
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Conductivity Mechanisms and Breakdown Characteristics of Niobium Oxide Capacitors
Abstract: No abstract text available
Text: Conductivity Mechanisms and Breakdown Characteristics of Niobium Oxide Capacitors J. Sikula, J. Hlavka, V. Sedlakova, L. Grmela Czech Noise Research Laboratory, Brno University of Technology Technicka 8, 603 00 Brno, Czech Republic Phone: + 4205 41143328, Fax. + 4205 41143398, E-mail: sikula@feec.vutbr.cz
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Untitled
Abstract: No abstract text available
Text: Microelectronics Reliability 46 2006 713–730 www.elsevier.com/locate/microrel Introductory Invited Paper Reliability and performance limitations in SiC power devices Ranbir Singh * GeneSiC Semiconductor Inc., 42652 Jolly Lane, South Riding, VA 20152, United States
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ic 555 use with metal detector
Abstract: DVD optical pick-up assembly CD laser pickup assembly bolometer detector Light Detector laser
Text: Introduction CHAPTER 01 1 Light and opto-semiconductors 1-1 Light 1-2 Opto-semiconductors 2 Opto-semiconductor lineup 3 Manufacturing process of opto-semiconductors 1 Introduction 1. Light and opto-semiconductors 1-1 Light Definition of light Light, like radio waves, is a type of electromagnetic wave.
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cd photo detector
Abstract: No abstract text available
Text: Sensors Sensors Sensors •Em itters 1 Infrared LEDs 1) Principle In the absence of an externally applied voltage, the P-N junction of a diode will be at thermal equilibrium and the Fermi levels of the P layer and N layer will be equal (Fig. 1 (a). In this case, the height of the poten
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cds photo diode
Abstract: OD44L T36 diode Photo transistor with open base automatic light control with photo diode photo sensor devices
Text: -•P R O D U C T OVERVIEW# PHOTO SENSORS PHOTO SENSORS APPLICATION NOTES Photoelectric conversion elements have the following functions. Light signal light energy <= => electrical signal (electrical energy)
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backward diode
Abstract: tunnel diode General Electric "backward diode"
Text: P j p i GE C P L E S S E Y CT3508-1.2 MIXER & DETECTOR DIODES - INTRODUCTION M ETAL S E M IC O N D U C TO R SC H O TTK Y BA RRIER DIO DES INTRODUCTION A mixer is a sensitive receiver circuit which makes use of the nonlinear properties of a mixer diode to produce a
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CT3508-1
backward diode
tunnel diode General Electric
"backward diode"
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ROHM capacitor
Abstract: No abstract text available
Text: Introduction Precautions for use Infrared LEDs, phototransistors, and photo ICs are required to pass light through them. Consequently, the resin used in these elements differs from the black mold material used in transistors or ICs, for instance, in that it is almost pure epoxy resin. In comparison to black
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AS-303
Abstract: SN74AS303 D3543 AS303
Text: SN74AS303 OCTAL DIVIDE-BY-2 CIRCUIT/CLOCK DRIVER D3543. JULY 1990 Maximum Output Skew of 1 ns SN74AS303 . . . D t OR N PACKAGE TOP VIEW Maximum Pulse Skew of 1 ns Q 3[ Q 4[ GND[ GND[ GND[ Q 5[ Q 6[ Q 7[ Center-PIn Vcc and GND Configurations Minimize High-Speed Switching Noise
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SN74AS303
D3543.
300-mil
SN74AS303
10pFto30pF
AS-303
D3543
AS303
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R098C64-25
Abstract: R098C64-20
Text: R098C64 SALES AND SUPPORT To order or to obtain information, e.g., on pricing or delivery, please use the listed part numbers, and refer to the factory or the listed sales offices. PART NUMBERS R098C64 - 25 I / P J K L P Package: Temperature Range: Access Time:
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R098C64
R098C64
DS60015A
DS10027A-1
R098C64-25
R098C64-20
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27C512 eprom
Abstract: No abstract text available
Text: & R09C512 Microchip 512K 64K x 8 CMOS ROM FEATURES DESCRIPTION • High speed performance — 120ns maximum access time • CMOS technology for low power consumption — 20mA active current — 100nA standby current • Low-cost EPROM replacement • Auto-insertion-compatible plastic packages
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R09C512
R09C512
120ns.
27C512
I-20094
DS10030A-4
27C512 eprom
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Untitled
Abstract: No abstract text available
Text: £ R09C256 M ic ro c h ip 256K 32K x 8 CMOS ROM FEATURES DESCRIPTION • High speed performance — 150ns maximum access time • CMOS technology for low power consumption The Microchip Technology Inc R 09C 256 is a CMOS 256K bit Read Only Memory. The device is organized as
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R09C256
150ns.
27C256
DS10029A-4
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27C128 eprom
Abstract: R09C128
Text: $ ' R09C128 M ic ro c h ip 128K 16K x 8 CMOS ROM FEATURES DESCRIPTION • High speed performance — 120ns maximum access time • CMOS technology for low power consumption —20mA active current —100|iA standby current • Low-cost EPROM replacement • Auto-insertion-compatible plastic packages
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120ns
--20mA
--28-pin
--32-pin
R09C128
R09C128
DS10028A-4
27C128 eprom
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