13001 s
Abstract: 13001 datasheet 13001 JL-01 ACTEL 1020B RTSX32 B 13001 RTSX16 42MX09 1280A
Text: Actel 4th Quarter 2000 Reliability Report 1 Table of Contents Page Reliability Test Matrix • Test Methods and Conditions Failure Rates • Failure Rates FITs Based For Current Process Data • Mean Time Between Failure (MTBF) For Current Process Data 2
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1225XL,
1240XL,
1280XL,
A1415,
A1425,
14100BP,
32140DX,
32200DX
13001 s
13001 datasheet
13001
JL-01
ACTEL 1020B
RTSX32
B 13001
RTSX16
42MX09
1280A
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PDF
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800RPM
Abstract: KD240
Text: L10 Life Test Report Model No. KD2408PHS3.H Test Condition Input 24 VDC Failures Elec-SPEC 4,800RPM Observe MTTF 0.19AMP Temp 70 ℃ Fan Vertical Useful Life 50 PCS Condition Test Sample Test Hours/Each 15,288 Hours Total Test Hour 740,544 Hours Failure Definition
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KD2408PHS3
800RPM
19AMP
800RPM
KD240
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PDF
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6K tantalum capacitors
Abstract: No abstract text available
Text: NIC Doc #R-NTC02 Page 1 of 6 70 Maxess Road ! Melville, New York 11747 631 396-7500 ! Fax (631) 396-7575 NTC SERIES TANTALUM CHIP CAPACITORS ! ! ! ! FAILURE RATE ESTIMATION DE-RATED OPERATION LIST OF RELIABILITY TESTS LIFE TEST SUMMARY FAILURE RATE ESTIMATION
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R-NTC02
4/988E
6K tantalum capacitors
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PDF
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CBR08C
Abstract: CBR08C1
Text: KEMET Ceramic Surface Mount Capacitors Product RF C0G 0201 33pF 10 V Product Family Qualification CBRO2C330J8GAC 114A010282 SS # Fail Test Performed Test Conditions Sample Size per lot Failure Count Reliability and Environmental Tests High Temperature Life
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CBRO2C330J8GAC
114A010282
30min)
CBR08C
CBR08C1
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PDF
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MTTF
Abstract: No abstract text available
Text: Life Model No. KD2408PHS3.H Elec-SPEC 4,800RPM Test Sample 50 Pcs Test Hours/Each 2,160 Hours Total Test Hour 108,000 Hours Failure Definition 1.Fan not function 2.RPM Under 15% of original 3.Current Over 15% of original 4.Noise Over 5dB of original Test Condition
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KD2408PHS3
800RPM
19AMP
MTTF
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PDF
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IRFP460Z
Abstract: IRF3205 application IRF3205 equivalent power MOSFET IRFP460z irfp4004 IRF3808 equivalent irfz44v equivalent IRF1405 equivalent IRLL014N IRF3205
Text: Switch and I/O Reliability Report March, 2003 International Rectifier Table Of Contents 1.0 Introduction 2.0 Environmental Stress And Failure Modes 3.0 The Matrix Qualification Philosophy 4.0 Summary Of Long Term Reliability Test 4.1 Transistors 4.1.1 HTRB
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O-220
IRFP460Z
IRF3205 application
IRF3205 equivalent
power MOSFET IRFP460z
irfp4004
IRF3808 equivalent
irfz44v equivalent
IRF1405 equivalent
IRLL014N
IRF3205
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PDF
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JESD22-B104-B
Abstract: JESD22-b103 JESD22-B104 iP1201 transistor Amp 2054 equivalent C1173 JESD22-B103B JESD22-B103-B
Text: International Rectifier Reliability Report for iPOWIR Family iP1001, iP1201, iP1202, iP2001, iP2002, iP2003 20-Apr-04 iPOWIR Family Reliability Testing Summary 4/20/2004 1 . HTOL - High Temperature Operating Life Test Failure Rate Device Number Conditon Samples
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iP1001,
iP1201,
iP1202,
iP2001,
iP2002,
iP2003
20-Apr-04
iP1001
iP2001
iP2002
JESD22-B104-B
JESD22-b103
JESD22-B104
iP1201
transistor Amp 2054 equivalent
C1173
JESD22-B103B
JESD22-B103-B
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PDF
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ID32
Abstract: HTGB JA113
Text: GEN-V SOT-223 HEXFET RELIABILITY REPORT page 1 Table of Contents Section I. II. III. IV. V. VI. VII. VIII. IX. X. Page Executive Summary Introduction Procedure Reliability Tests - Table I Electrical Tests - Table II Test Purposes & Common Failure Mechanisms
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OT-223
ID32
HTGB
JA113
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PDF
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irlml2404
Abstract: transistor 9529 IRF7603 IRF7389 IRF7103 irlml2402 Small-Outline SMD Reliability Report 704618 HEXFET SO-8 irf7404 datasheet
Text: Small-Outline SMD Reliability Report Page 1 Table of Contents Section I. II. III. IV. V. VI. VII. VIII. IX. X. Page Executive Summary Introduction Procedure Reliability Tests - Table I Electrical Tests - Table II Test Purposes & Common Failure Mechanisms Reliability Data
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EIA-625A
Abstract: SSYA010 EIA-541
Text: Application Report SSYA010 - January 2001 Electrostatic Discharge ESD Tom Diep and Charvaka Durvury Standard Linear & Logic ABSTRACT This application report provides an overview of electrostatic-discharge (ESD) test models, failure modes, protection strategies, and Texas Instruments (TI) procedures to guard against
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SSYA010
EIA-625A
EIA-541
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PDF
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transistor 9752
Abstract: RECTIFIER 8212 ID09 HTGB
Text: GEN-III SOT-223 HEXFET RELIABILITY REPORT page 1 Table of Contents Section I. II. III. IV. V. VI. VII. VIII. IX. X. XI. Page Executive Summary Introduction Procedure Reliability Tests - Table I Electrical Tests - Table II Test Purposes & Common Failure Mechanisms
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OT-223
transistor 9752
RECTIFIER 8212
ID09
HTGB
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PDF
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2005 Z
Abstract: R 753 tcr-125 TCR55 S10K 22-315
Text: CHINA 752 & 753 SERIES QUALIFICATION DATA FOR THE YEAR 2005 RES TEST BL# LET VALUE MIN MAX AVG RES QTY PARTS TOTAL PER PART TESTED FAILURE RESISTORS REPORT QTR PARTS RES FAILED FAILED PART SERIES YEAR NUMBER IN RES 19747 D 100/1K - - - 12 80 - 1 752
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100/1K
753091331G
22316S
753091103G
752QA1
2005 Z
R 753
tcr-125
TCR55
S10K
22-315
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PDF
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DD-03201FP-200
Abstract: CH85 capacitor ARINC429 arinc429 104 DD-03201 DO-160C CH52 CH-1701 TAE 1102
Text: Make sure the next Card you purchase has. DD-03201 32- OR 96-CHANNEL DISCRETE-TODIGITAL INTERFACE “RXD3” FEATURES • Universal Inputs - Configurable As: • 28 V/Gnd • Open/Gnd • 28 V/Open • Input Resistor Usage • Built-In Self-Test • Soft Failure Reporting
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DD-03201
96-CHANNEL
DD-03201
1-800-DDC-5757
A5976
E-03/04-0
DD-03201FP-200
CH85 capacitor
ARINC429
arinc429 104
DO-160C
CH52
CH-1701
TAE 1102
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PDF
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Untitled
Abstract: No abstract text available
Text: Make sure the next Card you purchase has. DD-03201 32- OR 96-CHANNEL DISCRETE-TODIGITAL INTERFACE “RXD3” FEATURES • Universal Inputs - Configurable As: • 28 V/Gnd • Open/Gnd • 28 V/Open • Input Resistor Usage • Built-In Self-Test • Soft Failure Reporting
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DD-03201
96-CHANNEL
DD-03201
1-800-DDC-5757
A5976
F-11/06-0
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PDF
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|
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CH85 capacitor
Abstract: No abstract text available
Text: Make sure the next Card you purchase has. DD-03201 32- OR 96-CHANNEL DISCRETE-TODIGITAL INTERFACE “RXD3” FEATURES • Universal Inputs - Configurable As: • 28 V/Gnd • Open/Gnd • 28 V/Open • Input Resistor Usage • Built-In Self-Test • Soft Failure Reporting
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DD-03201
96-CHANNEL
DD-03201
1-800-DDC-5757
A5976
J-3/08-0
CH85 capacitor
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PDF
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DD-03201FP-200
Abstract: 8065 microprocessor
Text: Make sure the next Card you purchase has. DD-03201 32- or 96-Channel discrete-ToDigital Interface “RXD3” FEATURES • Universal Inputs - Configurable As: • 28 V/Gnd • Open/Gnd • 28 V/Open • Input Resistor Usage • Built-In Self-Test • Soft Failure Reporting
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DD-03201
96-Channel
DD-03201
1-800-DDC-5757
A5976
L-10/08-0
DD-03201FP-200
8065 microprocessor
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PDF
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CH89 diode
Abstract: 74CH74 DIODE CH71 DD-03182PP 96-channel diode gp 429
Text: Make sure the next Card you purchase has. DD-03296 96-CHANNEL DISCRETE-TO-DIGITAL INTERFACE FEATURES • HIRF Layer • Universal Inputs • 28V/Gnd • Open/Gnd • 28V/Open • Built-in Self-Test • Soft Failure Reporting • Higher MTBUR • ARINC 429 Output Port
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DD-03296
96-CHANNEL
DD-03296
16-bit
1-800-DDC-5757
A5976
F-3/08-0
CH89 diode
74CH74
DIODE CH71
DD-03182PP
diode gp 429
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PDF
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Untitled
Abstract: No abstract text available
Text: Make sure the next Card you purchase has. DD-03296 96-CHANNEL DISCRETE-TO-DIGITAL INTERFACE FEATURES • HIRF Layer • Universal Inputs • 28V/Gnd • Open/Gnd • 28V/Open • Built-in Self-Test • Soft Failure Reporting • Higher MTBUR • ARINC 429 Output Port
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DD-03296
96-CHANNEL
DD-03296
16-bit
1-800-DDC-5757
A5976
E-7/07-0
F-11/06-0
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PDF
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Untitled
Abstract: No abstract text available
Text: PD - 91396B IRHNA7160 IRHNA8160 REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR N-CHANNEL MEGA RAD HARD Ω, RAD HARD HEXFET 100Volt, 0.040Ω International Rectifier’s RAD HARD technology HEXFETs demonstrate immunity to SEE failure. Additionally, under identical pre- and post-irradiation test
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91396B
IRHNA7160
IRHNA8160
100Volt,
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PDF
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IRHNA7Z60
Abstract: IRHNA8Z60
Text: PD - 91701B IRHNA7Z60 IRHNA8Z60 REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR N-CHANNEL MEGA RAD HARD W , RAD HARD HEXFET 30 Volt, 0.009W International Rectifier’s RAD HARD technology HEXFETs demonstrate immunity to SEE failure. Additionally, under identical pre- and post-irradiation test
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91701B
IRHNA7Z60
IRHNA8Z60
patente10)
IRHNA7Z60
IRHNA8Z60
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PDF
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IRHNA7160
Abstract: IRHNA8160 JANSH2N7432U JANSR2N7432U
Text: REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR IRHNA7160 IRHNA8160 JANSR2N7432U JANSH2N7432U N-CHANNEL MEGA RAD HARD Ω , RAD HARD HEXFET 100Volt, 0.040Ω International Rectifier’s RAD HARD technology HEXFETs demonstrate immunity to SEE failure. Additionally, under identical pre- and post-irradiation test
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IRHNA7160
IRHNA8160
JANSR2N7432U
JANSH2N7432U
100Volt,
IRHNA7160
IRHNA8160
JANSH2N7432U
JANSR2N7432U
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PDF
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SMD 43A
Abstract: IRHNB7260 IRHNB8260
Text: PD - 91798 IRHNB7260 IRHNB8260 REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR N-CHANNEL MEGA RAD HARD Ω, MEGA RAD HARD HEXFET 200Volt, 0.070Ω International Rectifier’s RAD HARD technology HEXFETs demonstrate immunity to SEE failure. Additionally, under identical pre- and post-irradiation test
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IRHNB7260
IRHNB8260
200Volt,
Rectifie10)
SMD 43A
IRHNB7260
IRHNB8260
|
PDF
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smd 43a
Abstract: No abstract text available
Text: PD - 91798 IRHNB7260 IRHNB8260 REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR N-CHANNEL MEGA RAD HARD Ω , MEGA RAD HARD HEXFET 200Volt, 0.070Ω International Rectifier’s RAD HARD technology HEXFETs demonstrate immunity to SEE failure. Additionally, under identical pre- and post-irradiation test
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IRHNB7260
IRHNB8260
200Volt,
smd 43a
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PDF
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Untitled
Abstract: No abstract text available
Text: PD - 91397A IRHNA7260 IRHNA8260 REPETITIVE AVALANCHE AND dv/dt RATED HEXFET TRANSISTOR N-CHANNEL MEGA RAD HARD Ω, MEGA RAD HARD HEXFET 200Volt, 0.070Ω International Rectifier’s RAD HARD technology HEXFETs demonstrate immunity to SEE failure. Additionally, under identical pre- and post-irradiation test
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1397A
IRHNA7260
IRHNA8260
200Volt,
HEXF90245,
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PDF
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