13001 s
Abstract: 13001 datasheet 13001 JL-01 ACTEL 1020B RTSX32 B 13001 RTSX16 42MX09 1280A
Text: Actel 4th Quarter 2000 Reliability Report 1 Table of Contents Page Reliability Test Matrix • Test Methods and Conditions Failure Rates • Failure Rates FITs Based For Current Process Data • Mean Time Between Failure (MTBF) For Current Process Data 2
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1225XL,
1240XL,
1280XL,
A1415,
A1425,
14100BP,
32140DX,
32200DX
13001 s
13001 datasheet
13001
JL-01
ACTEL 1020B
RTSX32
B 13001
RTSX16
42MX09
1280A
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VCC6
Abstract: MTTF MTTF test data
Text: VCC6 PECL FITS RATE AND MTTF LONG-TERM FAILURE RATES Using the previous cumulative ceramic oscillators life test data, the failure rates in FITs failure in billion device-hours of operation and Mean Time To Failures (MTTF) at both 60% and 90% confidence levels are depicted in the following
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VCC1
Abstract: MTTF MTTF test data
Text: VCC1 SERIES FITS RATE AND MTTF LONG-TERM FAILURE RATES Using the previous cumulative ceramic oscillators life test data, the failure rates in FITs failure in billion device-hours of operation and Mean Time To Failures (MTTF) at both 60% and 90% confidence levels are depicted in the following
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MTTF
Abstract: VC-706 failure rate VC70 VC706
Text: VC-706 PECL FITS RATE AND MTTF LONG-TERM FAILURE RATES Using the previous cumulative ceramic oscillators life test data, the failure rates in FITs failure in billion device-hours of operation and Mean Time To Failures (MTTF) at both 60% and 90% confidence levels are depicted in the following
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VC-706
MTTF
failure rate
VC70
VC706
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72483
Abstract: No abstract text available
Text: Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size Equivalent Device Hours Failure Rate in FIT 2296 248 147 113 3.667 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs,
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JESD85,
28-Jul-08
18-Jul-08
72483
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U.S. Sensor
Abstract: No abstract text available
Text: Reliability Testing MEASUREMENT CAPABILITIES « Previous Continue » Failure Analysis In the event that you should experience a problem with a U.S. Sensor thermistor or probe assembly, our test facilities and experienced personnel are available to perform failure analysis on your
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Novacap
Abstract: RELIABILITY DATA capacitor 856 diode mtbf
Text: Class I 200ºC Operational Life Test Data Failure Rates at 90% Confidence Test Conditions: Time Period: Number of Capacitors Tested: Testing Location: Results: Conversion Factors: 2000hrs. @ 200ºC. Applied voltage is dependent on capacitors tested. July 2004 to May 2006.
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2000hrs.
Novacap
RELIABILITY DATA capacitor
856 diode
mtbf
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Novacap
Abstract: mtbf 90 2004 FAILURE
Text: Class II 200ºC Operational Life Test Data Failure Rates at 90% Confidence Test Conditions: Time Period: Number of Capacitors Tested: Testing Location: Results: Conversion Factors: 2000hrs. @ 200ºC. Applied voltage is dependent on capacitors tested. March 2004 to July 2007.
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2000hrs.
Novacap
mtbf
90 2004
FAILURE
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Untitled
Abstract: No abstract text available
Text: Cell-Based IC Metastability Evaluation Background Test Results The failure of synchronisation when latching asynchronous signals has been investigated on a test IC using StandardLib and PadLib2 cells. The evaluation presented in this Application Note is based on measurements conducted
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AEC-Q100-004
Abstract: JESD22-A113 HDJD-J822
Text: HDJD-J822 Color Management System Feedback Controller Data Sheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of JEDEC. Avago
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HDJD-J822
AEC-Q100-004
/-100mA)
JESD22-A113-A
5989-4106EN
AEC-Q100-004
JESD22-A113
HDJD-J822
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Optical Encoder Modules
Abstract: HEDL-5500 HEDL-5600 HEDL-6500
Text: HEDL-5500, HEDL-5600, HEDL-6500, HEDL-9x00 Series Motion Sensing Products, Optical Encoder Modules Reliability Data Sheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies Malaysia
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HEDL-5500,
HEDL-5600,
HEDL-6500,
HEDL-9x00
characteristi760
15min
AV01-0682EN
Optical Encoder Modules
HEDL-5500
HEDL-5600
HEDL-6500
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JESD22-A115-A
Abstract: JESD22-A115A JESD22-A113D HSMP-282Y JESD22-A114-C JESD22-A114 HSMS-286Y JESD22-A113-D transistor A114 JESD22A115A
Text: HSMS-282Y, HSMS-285Y, HSMS-286Y Schottky Diode Reliability Data Sheet Description Reliability Prediction Model This document describes the reliability performance of HSMS-285Y based on a series of reliability test conducted. An exponential cumulative failure function constant
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HSMS-282Y,
HSMS-285Y,
HSMS-286Y
HSMS-285Y
JESD22-A113-D
AV01-0356EN
JESD22-A115-A
JESD22-A115A
JESD22-A113D
HSMP-282Y
JESD22-A114-C
JESD22-A114
HSMS-286Y
transistor A114
JESD22A115A
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JESD-A101
Abstract: JESD-A103 JESDA101 JESDB103
Text: ASMC-QxB2-Txxx Envisium 0.5W Power PLCC-4 Surface Mount LED Indicator Reliability Datasheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of
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MIL-STD-883/JEDEC
JESDB106
JESDB104
1500G,
JESDB103
06inch
20Hz-100Hz,
100Hz-2000Hz
AV01-0636EN
JESD-A101
JESD-A103
JESDA101
JESDB103
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AVAGO DIP
Abstract: No abstract text available
Text: HLMP-DB25, HLMP-KB45 T-1 ¾ 5mm , T1 (3mm) Blue LED Lamps Reliability Data Sheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of
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HLMP-DB25,
HLMP-KB45
MIL-STD-883
C7021.
AV01-0168EN
AVAGO DIP
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JESD-B-102
Abstract: AVAGO DIP JESD-A102 JA113
Text: ACPL-M71U, ACPL-M72U Wide Operating Temperature High Speed, Low Power CMOS Digital Optocoupler with R2CouplerTM Isolation Reliability Data Sheet Description Definition of Failure The reliability data shown includes Avago Technologies reliability test data from the reliability qualification done
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ACPL-M71U,
ACPL-M72U
JESD-A110
15psig
JESD-A102
JESD-A103
AV02-3713EN
JESD-B-102
AVAGO DIP
JESD-A102
JA113
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irlml2404
Abstract: transistor 9529 IRF7603 IRF7389 IRF7103 irlml2402 Small-Outline SMD Reliability Report 704618 HEXFET SO-8 irf7404 datasheet
Text: Small-Outline SMD Reliability Report Page 1 Table of Contents Section I. II. III. IV. V. VI. VII. VIII. IX. X. Page Executive Summary Introduction Procedure Reliability Tests - Table I Electrical Tests - Table II Test Purposes & Common Failure Mechanisms Reliability Data
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JESDA101
Abstract: No abstract text available
Text: ASMT-FJ30 Mini Surface Mount AF LED Reliability Data Sheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of MIL-STD-883/JEDEC standards.
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ASMT-FJ30
MIL-STD-883/JEDEC
500hrs
JESDB104
1500G,
AV02-0860EN
JESDA101
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Y451
Abstract: Y45-1 54200 206800
Text: HLMP Y301/Y402/Y502/Y451 T-1 3mm GaP LED Lamps Data Sheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of JEDEC stds. Avago tests
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Y301/Y402/Y502/Y451
500hrs
1000hrs
1000hrs
AV02-0936EN
Y451
Y45-1
54200
206800
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MM-JESD22-A115-A
Abstract: JESD22-A115 AEDR-8400-140 AEDR-8400-142 HBM-JESD22-A114D
Text: AEDR-8400-140 and AEDR-8400-142 Reflective Surface Mount Optical Encoder Reliability Data Sheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies Malaysia in accordance with the latest revisions of JEDEC Standard.
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AEDR-8400-140
AEDR-8400-142
by22-A115-A
20-2kHz,
AV02-0370EN
MM-JESD22-A115-A
JESD22-A115
AEDR-8400-142
HBM-JESD22-A114D
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Untitled
Abstract: No abstract text available
Text: HLMP Y601/ Y651/Y701/Y801/ Y802/Y901/Y951 T-1 3mm AlInGaP LED Lamps Data Sheet Description Failure Rate Prediction The following cumulative test results have been obtained from testing performed at Avago Technologies in accordance with the latest revision of JEDEC stds. Avago tests
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Y651/Y701/Y801/
Y802/Y901/Y951
1000hrs
AV02-0935EN
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IRFP460Z
Abstract: IRF3205 application IRF3205 equivalent power MOSFET IRFP460z irfp4004 IRF3808 equivalent irfz44v equivalent IRF1405 equivalent IRLL014N IRF3205
Text: Switch and I/O Reliability Report March, 2003 International Rectifier Table Of Contents 1.0 Introduction 2.0 Environmental Stress And Failure Modes 3.0 The Matrix Qualification Philosophy 4.0 Summary Of Long Term Reliability Test 4.1 Transistors 4.1.1 HTRB
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O-220
IRFP460Z
IRF3205 application
IRF3205 equivalent
power MOSFET IRFP460z
irfp4004
IRF3808 equivalent
irfz44v equivalent
IRF1405 equivalent
IRLL014N
IRF3205
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SOP 8 200MIL
Abstract: No abstract text available
Text: TOSHIBA [13] Reliability Data 13. Reliability Data Intrinsic Failure Rate Estimation from Life Test Results 1995/3Q-1996/2Q Data Test Condition :Ta = 125°C, Vcc = 6.0V Operation 1000Hrs. Device 4120 Ta = 60°C Equivalent Device Hours Ea = 0.8V 391.15x106
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1995/3Q-1996/2Q
1000Hrs.
15x106
TSSOP-16
TSSOP-20
300cyde
100Hrs.
TSSOP-14
SOP 8 200MIL
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temptronic TP03000A
Abstract: NXR-1400 INCOMING RAW MATERIAL INSPECTION procedure Sample form for INCOMING Inspection of RAW MATERIAL INCOMING MATERIAL INSPECTION procedure INCOMING MATERIAL FLOW PROCESS FOR GENERAL FABRICATION UNIT TP04000 nicolet nxr1400 TRIO TECH
Text: QUALITY CONTROL FLOW LG Semicon CONTENTS PAGE 1. Introduction . 2. Q uality A ssurance System 3. R eliability Test . 13 . 30 4. Failure M ode A n alysis .
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MIL-STD-883 Method 3015.7
Abstract: EIA-583 H820 EIA 583
Text: VISHAY Vishay Telefunken Life Test Data for IRDC Modules Technology includes : TFDS3xxx, TFDx4xxx, TFDx6xxx Predicted failure rate (FITs), based on accelerated life testing At 60% upper confidence level derated to 55°C assuming the activation energy to be 0.8 eV.
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OCR Scan
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TFDx3000/4xxx
Failures/109
EIA-583
22-A113.
22-A113
MILSTD-883
MIL-STD-883 Method 3015.7
EIA-583
H820
EIA 583
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