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    MAS-5010

    Abstract: 53368 62212 ETS500 119185
    Text: Hi-Rel Operations National Semiconductor Corporation Radiation Effects Laboratory South Portland, Maine 04106 ANALOG TOTAL DOSE RADIATION REPORT Customer: Rad Qual Part Type: RM2012XW-QMLV Input Bias Circuit: 6354IR Dose Rate: 37.878 rad Si /sec Test Program Used: EQR2012BA


    Original     		PDF RM2012XW-QMLV 6354IR EQR2012BA EM16383E JCPAC010 7H4381G019 e-128 MAS-5010 53368 62212 ETS500 119185

    Hi-rel 8936

    Abstract: 45288 2167.1 MAS50 MAS-5010 1764 689 74845 8195 82583 8533
    Text: Hi-Rel Operations National Semiconductor Corporation Radiation Effects Laboratory South Portland, Maine 04106 ANALOG TOTAL DOSE RADIATION REPORT Customer: Rad Qual Part Type: RM2012XW-QMLV Input Bias Circuit: 6354IR Dose Rate: 37.878 rad Si /sec Test Program Used: EQR2012BA


    Original     		PDF RM2012XW-QMLV 6354IR EQR2012BA EM16372S1 JCPAC010 7H4385K019 Hi-rel 8936 45288 2167.1 MAS50 MAS-5010 1764 689 74845 8195 82583 8533