MSC1210 Flash Routines
Abstract: JESD22-A117 SBAA085 programming MSC1210 MSC1210 1486-012 JESD22a117 msc1210 flash programming
Text: Application Report SBAA091 – April 2003 Maximizing Endurance of MSC1210 Flash Memory Ramesh Saripalli Data Acquisition Products—Microsystems saripalli_ramish@ti.com ABSTRACT The MSC1210 embeds an 8051 CPU, a high-performance, delta-sigma, 24-bit analog-todigital converter ADC , 4/8/16/32K bytes flash memory (Flash) and other peripherals to give a
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SBAA091
MSC1210
24-bit
4/8/16/32K
MSC1210
MSC1210.
MSC1210 Flash Routines
JESD22-A117
SBAA085
programming MSC1210
1486-012
JESD22a117
msc1210 flash programming
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transistor poly3
Abstract: RR510 RR-504 RR-520 X28C256 rr520
Text: Xicor Endurance Report Xicor Endurance Report RR-520 H. A.R. Wegener INTRODUCTION This report describes endurance relating to Xicor’sproducts employing the Direct WriteTM cell. These devices display enhanced endurance cycling characteristics that are attributable to the direct write cell, process
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RR-520
RR-504
000PageCycles
transistor poly3
RR510
RR-504
RR-520
X28C256
rr520
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RR502A
Abstract: RR504 x2864 X2864A X2816A RR-504 predicting xicor X2816A
Text: U ff !' VH I I I I iiJ r r* > 3* / y h \ 'i DETERMINING SYSTEM RELIABILITY FROM E2PROM ENDURANCE DATA By Richard Palm • D ata retention refers to the capability of a non volatile m emory device to retain valid data under worst case conditions. Xicor has published numerous reliability reports
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X2816A
X2864A.
X2864A
RR502A
RR504
x2864
RR-504
predicting
xicor X2816A
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Untitled
Abstract: No abstract text available
Text: EEPROM Reliability The reliability of AMD's NS-18 process used in the fabrication of 64K EEPROMs is described in this report. The reliability monitors used at AMD were designed to predict the future operating life results by accelerat ing failure rates. The monitors include data from endur
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NS-18
Am2864AE/BE
Am2864B
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TA-NWT-000983
Abstract: Mil-Std-883D SG608 CDX2155 CDX2622 SDX1155 UL-94-VO mil-std 883d method 1010 MILSTD-883D
Text: Interim Qualification Report 2000 Hours Endurance Reliability Data CDX2155, CDX2622 Summary The CDX2155 and CDX2622 transceivers have been successfully qualified in accordance with the requirements of Bellcore document TA-NWT-000983, under the supervision of HewlettPackard FCO Quality and
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CDX2155,
CDX2622
CDX2155
TA-NWT-000983,
CDX2622
TA-NWT-000983.
MIL-STD-202
PSE6256/05
TA-NWT-000983
Mil-Std-883D
SG608
SDX1155
UL-94-VO
mil-std 883d method 1010
MILSTD-883D
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Untitled
Abstract: No abstract text available
Text: What H E W L E T T * mL'fiM P A C K A R D Interim Qualification Report 2000 Hours Endurance Reliability Data CDX2155, CDX2622 Summary The CDX2155 and CDX2622 transceivers have been success fully qualified in accordance with the requirements of Bellcore
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CDX2155,
CDX2622
CDX2155
CDX2622
TA-NWT-000983,
TA-NWT-000983.
MIL-STD-202
PSE6256/05
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5966-1888E
Abstract: No abstract text available
Text: Interim Qualification Report 2000 Hours Endurance Reliability Data HFCT-5202, HFCT-5207 Summary The HFCT-5202 and HFCT-5207 transceivers have been successfully qualified in accordance with the requirements of Bellcore document TA-NWT-000983, under the supervision of HewlettPackard Quality and Reliability
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HFCT-5202,
HFCT-5207
HFCT-5202
HFCT-5207
TA-NWT-000983,
TA-NWT-000983.
PSE6257/08
PSE6257/09
5966-1888E
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report on dc motor
Abstract: B150 C150 C300 E56140 endurance test report
Text: File E56140 Vol. 2 Sec. 1 and Report Page 1 Issued: Revised: 07-07-86 09-04-98 D E S C R I P T I O N PRODUCT COVERED: Component - Magnetic Motor Controllers, Model Series VB and VS, may be followed by L, followed by 3 through 110, may be followed by S, followed by B,
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E56140
report on dc motor
B150
C150
C300
E56140
endurance test report
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sd667
Abstract: SE621 FDX1125B SDX1155 SDX1155B UL-94-VO IEC-68-2-20 TA-NWT-000983 se6303 SE6211
Text: Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out in Bellcore TA-NWT-000983. All
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SDX1155B,
FDX1125B
SDX1155B
FDX1125B
TA-NWT-000983.
int06
SD668107
SD668110
sd667
SE621
SDX1155
UL-94-VO
IEC-68-2-20
TA-NWT-000983
se6303
SE6211
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SE6211
Abstract: RSE635204 SE630505
Text: ma I H EW L E T T K firn P A C K A R D Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out
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SDX1155B,
FDX1125B
SDX1155B
FDX1125B
TA-NWT-000983.
PSD697201
PSD697202
SE6211
RSE635204
SE630505
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SE6211
Abstract: se6303
Text: W hatHEW LETT mL'HM PACKARD Interim Qualification Report 2000 hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extrem es as set out in
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SDX1155B,
FDX1125B
SDX1155B
TheFDX1125B
SDX1155B.
TA-NWT-000983.
perfo68
SE6211
se6303
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CTL4468-002
Abstract: lbff 1408150-1
Text: 501-672 Qualification Test Report 30Jan08 Rev A Series MMCX 50 Ohm Micro-Miniature Connectors 1. INTRODUCTION 1.1. Purpose Testing was performed on the Tyco Electronics Series MMCX 50 ohm micro-miniature connectors to determine their conformance to the requirements of Product Specification 108-2084 Revision A.
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30Jan08
28Mar07
18Feb08.
CTL4468-002
EME4468-003.
lbff
1408150-1
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MB91F376G
Abstract: FMl 125 0629 LQFP-120
Text: １／３ Reliability Engineering Report Summary Sheet 0.35um Process Technology Flash-MCU （Fujitsu Semiconductor Technology） Package Type: LQFP 0629 FML Quality Assurance Division Fujitsu Microelectronics Limited Confidential ２／３ Reliability Test
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MB91F376G
LQFP-120
500Hz
1000h
200cyc
MB91F376G
FMl 125
0629
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Untitled
Abstract: No abstract text available
Text: Qualification Report 5000 hours Endurance Reliability Data HFCT-5208 Summary The HFCT-5208 transceiver has been successfully qualified in accordance with the requirements of Bellcore Document TA-NWT-000983 under the supervision of HewlettPackard Quality and Reliability
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HFCT-5208
TA-NWT-000983
TA-NWT-000983.
SDX1155
T231B-10
T231B-12
T231B-13
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TA-NWT-000983
Abstract: No abstract text available
Text: Qualification Report Reliability Data XMT5x70x-155 XMT5170B-622 XMT5370x-622 Summary The XMT5x70x-155, XMT5170B-622 and XMT5370x-622 transmitter modules have been successfully qualified in accordance with the requirements of Bellcore Document TA-NWT-000983 under
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XMT5x70x-155
XMT5170B-622
XMT5370x-622
XMT5x70x-155,
TA-NWT-000983
XMT5170A-155
TA-NWT-000983.
DePTK295509
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MIL-STD-883C 1010.7
Abstract: ED-4701 LH28F320S3NS 7022 ED-4701-1
Text: S H A R P * RELIABILITY TEST REPORT Product Type ! Model No. ! P a c k a g e ! Date Smart voltage 32Mbit Flash Memory LH28F320S3NS 56Pin SSOP SSQP056-P-0600 : NOV. 10 , 1998 'JL-' . ? GENERAL raANAGER M.NAKAJÏMA QUALITY ASSURANCE DEPARTMENT QUALITY & RELIABILITY CONTROL CENTER
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RD-98Y08
32Mbit
LH28F320S3NS
56Pin
SSOP056-P-0600)
100pF
100mA
ED-4701-1
500ms
C-113
MIL-STD-883C 1010.7
ED-4701
LH28F320S3NS
7022
ED-4701-1
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SLAA334A
Abstract: MSP430F1xx MSP430F4xx MSP430 flash "high temperature data retention" mechanism
Text: Application Report SLAA334A – September 2006 – Revised April 2008 MSP430 Flash Memory Characteristics Peter Forstner . MSP430 Applications ABSTRACT Flash memory is a widely used, reliable, and flexible nonvolatile memory to store
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SLAA334A
MSP430
MSP430F1xx,
MSP430F2xx,
MSP430F4xx
SLAA334A
MSP430F1xx
MSP430F4xx
flash "high temperature data retention" mechanism
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GT 1081
Abstract: transistor GT 1081 58993 IEC825-1 LST062X-SC-A iec 90092 74469 SL400518 34636 sl447
Text: Single Mode SC Connectorized Laser Transmitter Module Reliability Data LST062X-SC-A Summary This report details the qualification testing of the LST062*-SC-A laser transmitter over a range of environmental and mechanical extremes in line with the requirements of Bellcore TA-NWT000983 “Reliability Assurance
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LST062X-SC-A
LST062
TA-NWT000983
QP034.
SL400531
SL400532
SL400533
SL447327
SL498614
GT 1081
transistor GT 1081
58993
IEC825-1
LST062X-SC-A
iec 90092
74469
SL400518
34636
sl447
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Untitled
Abstract: No abstract text available
Text: M 1996 Annual Reliability Report compiled 7/97 INTRODUCTION RELIABILITY CONTROL SYSTEM “Quality Comes First” By adhering to this guiding value, Microchip Technology Inc. has achieved competitive leadership in quality and reliability for its products. Demonstrated performance
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24lc56
Abstract: No abstract text available
Text: 1995 Reliability Report Published 9/96 INTRODUCTION RELIABILITY CONTROL SYSTEM By adhering to this guiding value, Microchip Technology Inc. has achieved competitive leadership in quality and reliability for its products. Demonstrated performance levels of less than 100 Failures in Time (FITS) for most
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U637256DC70
Abstract: U637256DK70 U637H256DC25 U637H256DK25 U637H256 Preconditioning 336H
Text: Dresden, Jan.26th,1999 Gersdorf,QP (0351 8822 586 Qualification Report Function: Package: Lot no.: U637H256DC25 / U637256DC70 U637H256DK25 / U637256DK70 32k x 8 nvSRAM „ Cap - Store „ DIP 28 ( 600mil ) plastic 2259041, 225941A, 2279821, 2279821A Test results
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U637H256DC25
U637256DC70
U637H256DK25
U637256DK70
600mil
25941A,
279821A
C/10sec
10min
C/16h
U637256DC70
U637256DK70
U637H256
Preconditioning
336H
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24lc56
Abstract: LA 7670 block diagram of electric cooker EEPROM retention testing eprom 24c04 royal fuse curves PIC16C54 PIC16C55 PIC16C56 PIC16C57
Text: 1995 Reliability Report Published 9/96 INTRODUCTION RELIABILITY CONTROL SYSTEM By adhering to this guiding value, Microchip Technology Inc. has achieved competitive leadership in quality and reliability for its products. Demonstrated performance levels of less than 100 Failures in Time (FITS) for most
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DS00097D-page
24lc56
LA 7670
block diagram of electric cooker
EEPROM retention testing
eprom 24c04
royal fuse curves
PIC16C54
PIC16C55
PIC16C56
PIC16C57
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EPROM retention bake
Abstract: No abstract text available
Text: M 1998 Semi-Annual Reliability Report compiled 10/98 INTRODUCTION RELIABILITY CONTROL SYSTEM Quality Comes First By adhering to this guiding value, Microchip Technology Inc. has achieved competitive leadership in quality and reliability for its products. Demonstrated performance
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DS00131B-page
EPROM retention bake
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Untitled
Abstract: No abstract text available
Text: M 1998 Semi-Annual Reliability Report compiled 10/98 INTRODUCTION RELIABILITY CONTROL SYSTEM Quality Comes First By adhering to this guiding value, Microchip Technology Inc. has achieved competitive leadership in quality and reliability for its products. Demonstrated performance
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