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    CTL 127 Search Results

    CTL 127 Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    HMC812ALC4TR Analog Devices Voltage Variable (RFH-CTL-ATTN Visit Analog Devices Buy
    HMC812ALC4 Analog Devices Voltage Variable (RFH-CTL-ATTN Visit Analog Devices Buy
    LTC7818EUJ#PBF Analog Devices Buck/Buck/Boost Sync CTL, 40V, Visit Analog Devices Buy
    LTC7818EUJ#TRPBF Analog Devices Buck/Buck/Boost Sync CTL, 40V, Visit Analog Devices Buy
    LTC7806RUFDM#PBF Analog Devices 2-Phase Sync Boost CTL, 40V, 3 Visit Analog Devices Buy
    SF Impression Pixel

    CTL 127 Price and Stock

    WeEn Semiconductor Co Ltd BTA206X-800CT,127

    Triacs 800 V 6 A TO220F
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    Mouser Electronics BTA206X-800CT,127
    • 1 $1.02
    • 10 $0.589
    • 100 $0.51
    • 1000 $0.361
    • 10000 $0.282
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    WeEn Semiconductor Co Ltd BTA416-800CT/L01,127

    Triacs BTA416-800CT/L01/SIL3P/STANDARD MARKING * HORIZONTAL, RAIL PACK
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    Mouser Electronics BTA416-800CT/L01,127
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    • 10000 $0.367
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    WeEn Semiconductor Co Ltd BTA206X-800CT/L01,

    Triacs BTA206X-800CT/L01/TO-220F/STAN
    Distributors Part Package Stock Lead Time Min Order Qty Price Buy
    Mouser Electronics BTA206X-800CT/L01,
    • 1 -
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    • 10000 $0.286
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    CTL 127 Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    Untitled

    Abstract: No abstract text available
    Text: 401036.03BB 3/11/02 3:40 PM Page 138 COMPRESSION Colour-Coded Compression Connectors ® Type CTL — Copper Lugs, 1-Hole Mount, Long Barrel Cat. No. Copper Compression Connectors • For use with copper conductor: AWG stranded, flexible cable, welding cable


    Original     		PDF CTL8L-14 CTL4L-14 CTL2L-516 CTL600L-58 CTL750L-58 CTL1000L-58

    SPM3255

    Abstract: marking ML
    Text: Ordering number:ENN6351 SPM3255 Single Power Supply Operation RF Switch MMIC Features Package Dimensions • Control voltage +3 / 0V. · Mini molded package. · Low insertion loss, high linearity. unit:mm 1273 [SPM3255] 0.6 0.4 6 0.16 4 0.95 0.95 1.9 2.9 3


    Original     		PDF ENN6351 SPM3255 SPM3255] SPM3255 marking ML

    MPC555

    Abstract: G427
    Text: SECTION 22 IEEE 1149.1-COMPLIANT INTERFACE JTAG The MPC555 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to development


    Original     		PDF MPC555 MPC555 G427

    G150C

    Abstract: G150 G200 G203 G204 MPC821 g80.ctl g84c
    Text: SECTION 20 IEEE 1149.1 TEST ACCESS PORT The MPC821 provides a dedicated user—accessible test access port TAP that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to


    Original     		PDF MPC821 16-state G150C G150 G200 G203 G204 g80.ctl g84c

    G545

    Abstract: MPC555 g545 b2 G306 G340 G409 G335 g307.ctl
    Text: SECTION 22 IEEE 1149.1-COMPLIANT INTERFACE JTAG The MPC555 / MPC556 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to


    Original     		PDF MPC555 MPC556 MPC556 G545 g545 b2 G306 G340 G409 G335 g307.ctl

    G337

    Abstract: g545 MPC556 G409 MPC555 g229 G-403-C G-309-C G-405-C g307.ctl
    Text: SECTION 22 IEEE 1149.1-COMPLIANT INTERFACE JTAG The MPC555 / MPC556 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to


    Original     		PDF MPC555 MPC556 MPC556 G337 g545 G409 g229 G-403-C G-309-C G-405-C g307.ctl

    MPC860 jtag

    Abstract: tms 1943 G150 G200 G203 G204 MPC860 MPC860 equivalent g80.ctl G100C
    Text: SECTION 19 IEEE 1149.1 TEST ACCESS PORT The MPC860 provides a dedicated user—accessible test access port TAP that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to


    Original     		PDF MPC860 16-state MPC860 jtag tms 1943 G150 G200 G203 G204 MPC860 equivalent g80.ctl G100C

    g92.ctl

    Abstract: G150 G151 G200 G203 G204 MPC823
    Text: SECTION 21 IEEE 1149.1 TEST ACCESS PORT The MPC823 provides a dedicated user-accessible test access port TAP that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led tothe


    Original     		PDF MPC823 16-state g92.ctl G150 G151 G200 G203 G204

    G545

    Abstract: g545 b2 MPC555 G409C 74 164 14 PIN DIAGRAM g307.ctl 74HC7541DB G404 g408 chip g408.ctl
    Text: SECTION 22 IEEE 1149.1-COMPLIANT INTERFACE JTAG The MPC555 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture . Problems associated with testing high-density circuit boards have led to development


    Original     		PDF MPC555 MPC555 G545 g545 b2 G409C 74 164 14 PIN DIAGRAM g307.ctl 74HC7541DB G404 g408 chip g408.ctl

    b1a12

    Abstract: K4S1G0632B PC133 SDRAM registered DIMM 512MB samsung M390S2950BTU-C7A M390S2953BT1-C7A M390S5658BT1-C7A M390S5658BTU-C7A M390S6553BT1-C7A M390S6553BTU-C7A K4S510832
    Text: 512MB, 1GB, 2GB Registered DIMM SDRAM SDRAM Registered Module 168pin Registered Module based on 512Mb B-die with 72-bit ECC Revision 1.0 January 2004 * Samsung Electronics reserves the right to change products or specification without notice. Rev. 1.0 January 2004


    Original     		PDF 512MB, 168pin 512Mb 72-bit M390S6553BT1-C7A 512MB b1a12 K4S1G0632B PC133 SDRAM registered DIMM 512MB samsung M390S2950BTU-C7A M390S2953BT1-C7A M390S5658BT1-C7A M390S5658BTU-C7A M390S6553BT1-C7A M390S6553BTU-C7A K4S510832

    b1a12

    Abstract: B1A10 K4S1G0632D K4S510832d K4S1G0632 B1A0
    Text: 1GB, 2GB Registered DIMM SDRAM SDRAM Registered Module 168pin Registered Module based on 512Mb D-die 54 TSOP-II with Pb-Free RoHS compliant INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS, AND IS SUBJECT TO CHANGE WITHOUT NOTICE.


    Original     		PDF 168pin 512Mb medic250 K4S1G0632D 256Mx4 PC133 b1a12 B1A10 K4S510832d K4S1G0632 B1A0

    T1433-2

    Abstract: MAX1512 MAX1512ETA MO229
    Text: 19-2911 Rev 2; 8/04 KIT ATION EVALU E L B A IL AVA EEPROM-Programmable TFT VCOM Calibrator The MAX1512 is a programmable VCOM-adjustment solution for thin-film transistor TFT liquid-crystal displays (LCDs). The MAX1512 simplifies the labor-intensive VCOM-adjustment process and replaces mechanical


    Original     		PDF MAX1512 T1433-1 T1433-2 T1433-2 MAX1512ETA MO229

    MAX1512

    Abstract: MAX1512ETA MO229 T1433-2
    Text: 19-2911 Rev 1; 6/04 KIT ATION EVALU E L B A IL AVA EEPROM-Programmable TFT VCOM Calibrator The MAX1512 is a programmable VCOM-adjustment solution for thin-film transistor TFT liquid-crystal displays (LCDs). The MAX1512 simplifies the labor-intensive VCOM-adjustment process and replaces mechanical


    Original     		PDF MAX1512 T1433-1 T1433-2 MAX1512ETA MO229 T1433-2

    b1a12

    Abstract: PC133 SDRAM registered DIMM 512MB samsung pc133 sdram 512mb ECC unbuffered K4S560832E M390S2858ET1-C7A M390S2858ETU-C7A M390S3253ET1-C7A M390S3253ETU-C7A M390S6450ET1-C7A M390S6450ETU-C7A
    Text: 256MB, 512MB, 1GB Registered DIMM SDRAM SDRAM Registered Module 168pin Registered Module based on 256Mb E-die with 72-bit ECC Revision 1.4 May 2004 * Samsung Electronics reserves the right to change products or specification without notice. Rev. 1.4 May 2004


    Original     		PDF 256MB, 512MB, 168pin 256Mb 72-bit K4S510632E b1a12 PC133 SDRAM registered DIMM 512MB samsung pc133 sdram 512mb ECC unbuffered K4S560832E M390S2858ET1-C7A M390S2858ETU-C7A M390S3253ET1-C7A M390S3253ETU-C7A M390S6450ET1-C7A M390S6450ETU-C7A

    Untitled

    Abstract: No abstract text available
    Text: 256MB, 512MB, 1GB Registered DIMM SDRAM SDRAM Registered Module 168pin Registered Module based on 256Mb E-die with 72-bit ECC Revision 1.6 October 2006 * Samsung Electronics reserves the right to change products or specification without notice. Rev. 1.6 Oct. 2006


    Original     		PDF 256MB, 512MB, 168pin 256Mb 72-bit K4S510632E

    Untitled

    Abstract: No abstract text available
    Text: 19-2911 Rev 2; 8/04 KIT ATION EVALU E L B A IL AVA EEPROM-Programmable TFT VCOM Calibrator The MAX1512 is a programmable VCOM-adjustment solution for thin-film transistor TFT liquid-crystal displays (LCDs). The MAX1512 simplifies the labor-intensive VCOM-adjustment process and replaces mechanical


    Original     		PDF MAX1512

    b1a12

    Abstract: PC133 SDRAM registered DIMM 512MB samsung pc133 sdram 512mb ECC unbuffered K4S560832E M390S2858ET1-C7A M390S2858ETU-C7A M390S3253ET1-C7A M390S3253ETU-C7A M390S6450ET1-C7A M390S6450ETU-C7A
    Text: 256MB, 512MB, 1GB Registered DIMM SDRAM SDRAM Registered Module 168pin Registered Module based on 256Mb E-die with 72-bit ECC Revision 1.2 February 2004 * Samsung Electronics reserves the right to change products or specification without notice. Rev. 1.2 February 2004


    Original     		PDF 256MB, 512MB, 168pin 256Mb 72-bit b1a12 PC133 SDRAM registered DIMM 512MB samsung pc133 sdram 512mb ECC unbuffered K4S560832E M390S2858ET1-C7A M390S2858ETU-C7A M390S3253ET1-C7A M390S3253ETU-C7A M390S6450ET1-C7A M390S6450ETU-C7A

    Untitled

    Abstract: No abstract text available
    Text: 19-2911 Rev 3; 8/06 KIT ATION EVALU E L B A IL AVA EEPROM-Programmable TFT VCOM Calibrator The MAX1512 is a programmable VCOM-adjustment solution for thin-film transistor TFT liquid-crystal displays (LCDs). The MAX1512 simplifies the labor-intensive VCOM-adjustment process and replaces mechanical


    Original     		PDF MAX1512

    b1a12

    Abstract: No abstract text available
    Text: White Electronic Designs WV3DG72256V-AD2 PRELIMINARY 2GB – 2x128Mx72 SDRAM, REGISTERED FEATURES DESCRIPTION „ Burst Mode Operation „ Auto and Self Refresh capability „ LVTTL compatible inputs and outputs „ Serial Presence Detect with EEPROM „ Fully synchronous: All signals are registered on the


    Original     		PDF 2x128Mx72 WV3DG72256V-AD2 WV3DG72256V 256Mx4 128Mx4) 100MHz 133MHz b1a12

    Untitled

    Abstract: No abstract text available
    Text: Programmable VCOM Calibrator with EEPROM and Output Buffer ISL24212 Features The ISL24212 is an 8-bit programmable current sink that can be used in conjunction with an external voltage divider to generate a voltage source VCOM positioned between the analog supply


    Original     		PDF ISL24212 ISL24212 5m-1994. MO-229-WEED-3 FN7590

    tic 128d

    Abstract: No abstract text available
    Text: W h a t HEW LETT mLUM PA C K A R D General Purpose Motion Control IC Technical Data H CTL-1100 S e rie s F e a tu r e s D e s c r ip tio n • Low P ow er CMOS • PDIP and PLCC V ersions A vailable • E nhanced V ersion o f the HCTL-1000 • DC, DC B rushless, and


    OCR Scan     		PDF CTL-1100 HCTL-1000 HCTL-1100 other100 HCTL-1100 HCTL-1000/ HCTL-1100. tic 128d

    16-STATE

    Abstract: MC68341
    Text: SECTION 1O IEEE 1149.1 TEST ACCESS PORT The MC68341 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to development of this


    OCR Scan     		PDF MC68341 16-state

    MC68349

    Abstract: No abstract text available
    Text: SECTION S IEEE 114S.1 TEST ACCESS PORT The MC68349 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to development of this


    OCR Scan     		PDF MC68349 16-state

    MC68340

    Abstract: No abstract text available
    Text: SECTION S IEEE 114S.1 TEST ACCESS PORT The MC68340 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to development of this


    OCR Scan     		PDF MC68340 16-state