Untitled
Abstract: No abstract text available
Text: 37E D • 43G5271 0G2fci0Gb 4 I HAS Hlgh-Rellability High-Speed C M O S Logic ICs HARRIS SEMICOND SECTOR CD54HC4002/3A CD54HCT4002/3A Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CH ARACTERISTICS (CL = 50 pF, Input >„ t, = 6 ns)
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43G5271
CD54HC4002/3A
CD54HCT4002/3A
CD54HC/
CD54HC/HCT
2k-47k
1250C
54HCT
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Untitled
Abstract: No abstract text available
Text: _ High-Reliability High-Speed CMOS Logic ICs CD54HC4002/3A CD54HCT4002/3A Switching Sp6€d Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (Cl = 50 pF, Input t„ 1, = 6 ns)_
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CD54HC4002/3A
CD54HCT4002/3A
54HCT
2k-47k
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54LS
Abstract: RCA CMOS LOGIC FAMILY
Text: High-Reliability High-Speed CM O S Logic ICs CD54HC688/3A CD54HCT688/3A Burn-In Tsst-Circuil Connections Static OPEN 19 CD54HC/HCT688 Dynamic Use Static II for /3A burn-io and Dynamic for Life Test. STATIC BURN-IN 1 GROUND Vcc (6V) 1-18 20 OPEN CD54HC/HCT688
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CD54HC688/3A
CD54HCT688/3A
CD54HC/HCT688
CD54HC/HCT688
2k-47k
CD54HC4002/3A
CD54HCT4002/3A
RCA-CD54HC4002
CD54HCT4002
CD54HCT4015
54LS
RCA CMOS LOGIC FAMILY
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Untitled
Abstract: No abstract text available
Text: High-Reliability High-Speed C M O S Logic fCs C D54HC688/3A CD54HCT688/3A 3urn-ln Test-Circuit Connections Static OPEN 19 C D 5 4H C/H CT 688 Dynamic OPEN C D 5 4H C/H CT 688 Use Static II for /3A burn-in and Dynam ic for Life Test. STATIC BURN-IN 1 GROUND
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D54HC688/3A
CD54HCT688/3A
2k-47k
CD54HC4002/3A
CD54HCT4002/3A
CD54H
CT4015
CD54HC4015/3A
CD54HCT4015/3A
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Untitled
Abstract: No abstract text available
Text: 3?E 43ÛE271 D HARRIS SEMICOND QGSbDGM D ^ High-Reliability High-Speed C M O S Logic ICs n SECTOR "P 4S-T 8-Bit Magnitude Comparator - 4 -5 -: a r CD54HC688/3A CD54HCT688/3A T -^ -C R -0 5 The R C A CD54HC688 and CD54HCT688 are 8-bit magni tude comparators designed for use in computer and logic
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CD54HC688/3A
CD54HCT688/3A
CD54HC688
CD54HCT688
360//A
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Untitled
Abstract: No abstract text available
Text: . High-Reliability High-Speed C M O S Logic ICs CD54HC688/3A CD54HCT688/3A 8-Bit Magnitude Comparator T he R C A C D 5 4 H C 6 88 and CD 54 H C T 6 8 8 are 8-bit m agni tude com parators designed for use in com puter and logic ap p lication s that require the com parison of two 8-bit binary
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CD54HC688/3A
CD54HCT688/3A
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CD54HC688
Abstract: CD54HCT688
Text: High-Reliability High-Speed C M O S Logic ICs CD54HC688/3A CD54HCT688/3A 8-Bit Magnitude Comparator T h e R C A C D 5 4 H C 6 8 8 a n d C D 5 4 H C T 6 8 8 a re 8 -b it m a g n i tu d e c o m p a ra to rs d e s ig n e d fo r u se in c o m p u te r a n d lo g ic
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CD54HC688
CD54HCT688
CD54HC688/3A
CD54HCT688/3A
92CS-5677IRI
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74HC4052E
Abstract: 74HC194E 74HC4046AE 74HC4067E 74HC4538E 74HCT4511E 54HCT20 74HC4060E 074h 74hct27e
Text: Product Selectors Index to Devices CMOS Logic TTL Logic Plastic Pkg. CERDIP Plastic Pkg. C D 74H C 00E .M CD 74H C 02E.M C D 74H C 03E .M •C D 7 4H C 04 E .M C D 74H C 08E.M CD 54H C 00F CD 54H C 02F CD 54H C 03F •C D 5 4 H C 0 4 F CD 54H C 08F C D 74H CT00E.M
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4316F
CD54HCT4351F
CD54HCT4352F
CD54HCT4353F
CD54HCT4510F
CD54HCT4511F
54HCT4514F
CD54HCT4515F
54HCT4516F
C054H
74HC4052E
74HC194E
74HC4046AE
74HC4067E
74HC4538E
74HCT4511E
54HCT20
74HC4060E
074h
74hct27e
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CD74HC4063E
Abstract: cd74hct192e C074HC377E CD74HC40S1E C074HC132E CD74HCT4017E CD74HC643E C074HC174E CD74HCT563e rca CD54HCT4094F
Text: The QMOS Product Line RCA also offers the QM OS series of high-speed CMOS logic integrated circuits which include an extensive line of products that are pin compatible with many existing bipolar 54/74LSTTL and CM OS 4000 series of digital logic types. The new QM OS IC ’s provide high-speed
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54/74LSTTL
74/54H
CD74HCT4051E
CD54HCT4051F
CO74HCT4062E
CD54HCT4052F
CD74HCT4053E
CD54HCT4053F
CD74HCT406QE
CD54HCT4060F
CD74HC4063E
cd74hct192e
C074HC377E
CD74HC40S1E
C074HC132E
CD74HCT4017E
CD74HC643E
C074HC174E
CD74HCT563e rca
CD54HCT4094F
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Untitled
Abstract: No abstract text available
Text: 37E High-Reliability High-Speed C M O S Logic ICs , D M30S571 HARRIS CD54HC688/3A CD54HCT688/3A Ü GS t i G a S SEHICOND 'P'Ri-O'î'C 2 SECT0R " P q S 'l 7 T -M V M Burn-ln Test-Circuit Connections Static Use Static II for/3A burn-ln and Dynamic for Life Test.
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M30S571
CD54HC688/3A
CD54HCT688/3A
CD54HC/HCT688
2k-47k
CD54HC4002/3A
CD54HCT4002/3A
CD54HCT4015
CD54HC4015/3A
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