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    BIT ERROR RATE TESTER Search Results

    BIT ERROR RATE TESTER Result Highlights (5)

    Part ECAD Model Manufacturer Description Download Buy
    MP-54RJ45DNNE-100 Amphenol Cables on Demand Amphenol MP-54RJ45DNNE-100 Cat5e STP Double Shielded Patch Cable (Braid+Foil Screened) with RJ45 Connectors - 350MHz CAT5e Rated 100ft Datasheet
    MP-54RJ45DNNE-015 Amphenol Cables on Demand Amphenol MP-54RJ45DNNE-015 Cat5e STP Double Shielded Patch Cable (Braid+Foil Screened) with RJ45 Connectors - 350MHz CAT5e Rated 15ft Datasheet
    MP-54RJ45SNNE-050 Amphenol Cables on Demand Amphenol MP-54RJ45SNNE-050 Cat5e STP Shielded Patch Cable (Foil-Screened) with RJ45 Connectors - 350MHz CAT5e Rated 50ft Datasheet
    MP-54RJ45DNNE-005 Amphenol Cables on Demand Amphenol MP-54RJ45DNNE-005 Cat5e STP Double Shielded Patch Cable (Braid+Foil Screened) with RJ45 Connectors - 350MHz CAT5e Rated 5ft Datasheet
    MP-54RJ45SNNE-010 Amphenol Cables on Demand Amphenol MP-54RJ45SNNE-010 Cat5e STP Shielded Patch Cable (Foil-Screened) with RJ45 Connectors - 350MHz CAT5e Rated 10ft Datasheet

    BIT ERROR RATE TESTER Datasheets Context Search

    Catalog Datasheet MFG & Type PDF Document Tags

    APP332

    Abstract: AN332 DS2172 Bit Error Rate Tester
    Text: Maxim > App Notes > COMMUNICATIONS CIRCUITS TELECOM Keywords: DS2172, bit error rate tester, BERT May 08, 2001 APPLICATION NOTE 332 DS2172 Simplified Receiver Operation Abstract: DS2172 Bit Error Rate Tester BERT simplified receiver operation during repetitive pattern mode.


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    PDF DS2172, DS2172 com/an332 DS2172: AN332, APP332, Appnote332, APP332 AN332 Bit Error Rate Tester

    DS2174

    Abstract: DS2172 DS31412 DS3146 DS3148
    Text: Application Note 2706 Bit-Error-Rate Testing the DS314x Series of DS3/E3 Framers www.maxim-ic.com INTRODUCTION This application note demonstrates how to use pattern generation, synchronization, and bit test features of the DS2174 enhanced bit error-rate tester BERT with the single and multiport versions of the DS314x series of


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    PDF DS314x DS2174 DS314x DS2172/DS21372, 512-byte 155MHz 80MHz 622Mbps DS3141/2/3/4 DS2172 DS31412 DS3146 DS3148

    C32-C40

    Abstract: 50-Pin DIP Connector SMD diode DS1 DS2174 SMD TQFP microcontroller DS87C520-ECL how to use in crystal osc 11.0592mhz ECU-V1H102KBM DS2174DK SEMICONDUCTOR dallas
    Text: DS2174DK Enhanced Bit Error-Rate Tester Design Kit www.maxim-ic.com GENERAL DESCRIPTION FEATURES The DS2174DK is a fully integrated demonstration kit for the DS2174 enhanced bit error-rate tester BERT . This demo kit contains all the necessary circuitry to evaluate the device in all modes of


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    PDF DS2174DK DS2174DK DS2174 DS2174, RS-232 44-Pin com/DS2174) DS2174 C32-C40 50-Pin DIP Connector SMD diode DS1 SMD TQFP microcontroller DS87C520-ECL how to use in crystal osc 11.0592mhz ECU-V1H102KBM SEMICONDUCTOR dallas

    Untitled

    Abstract: No abstract text available
    Text: Bit Error Rate Tester BitAlyzer BA Series Data Sheet BitAlyzer® Error Analysis to Rapidly Understand your BER Performance Limitations, Assess Deterministic versus Random Errors, Perform Detailed Pattern-dependent Error Analysis, Perform Error Burst Analysis, and Error-free Interval Analysis


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    PDF 5W-25538-4

    DS2652x

    Abstract: 110E 2E15 DS26521 DS26522 DS26524 DS26528 0x1101-0x1102
    Text: Maxim > App Notes > TELECOM Keywords: BERT, T1, E1, J1, Single Chip Transceiver SCT Dec 20, 2006 APPLICATION NOTE 3968 How to Use the Bit-Error-Rate Tester (BERT) on the DS2652x STCs Abstract: This application note explains how to configure the bit-error-rate tester (BERT) in the DS2652x


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    PDF DS2652x DS2652x DS26521: DS26522: DS26524: DS26528: AN3968, APP3968, 110E 2E15 DS26521 DS26522 DS26524 DS26528 0x1101-0x1102

    lfsr galois

    Abstract: free verilog code of prbs pattern generator lfsr fibonacci XAPP661 prbs pattern generator using analog verilog generating pwm verilog code PPC405 XAPP662 prbs using lfsr 8 bit LFSR for test pattern generation
    Text: Application Note: Virtex-II Pro Family R XAPP661 v2.0 June 25, 2003 RocketIO Transceiver Bit-Error Rate Tester Author: Dai Huang and Michael Matera Summary This application note describes the implementation of a RocketIO transceiver bit-error rate tester (BERT) reference design demonstrating a serial link (1.0 Gb/s to 3.125 Gb/s) between


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    PDF XAPP661 PowerPCTM405 PPC405) XAPP661 an2002. lfsr galois free verilog code of prbs pattern generator lfsr fibonacci prbs pattern generator using analog verilog generating pwm verilog code PPC405 XAPP662 prbs using lfsr 8 bit LFSR for test pattern generation

    free verilog code of prbs pattern generator

    Abstract: verilog code 16 bit LFSR in PRBS pattern generator lfsr galois prbs using lfsr lfsr fibonacci XAPP661 verilog code for 10 gb ethernet verilog code 8 bit LFSR verilog HDL program to generate PWM
    Text: Application Note: Virtex-II Pro Family R RocketIO Transceiver Bit-Error Rate Tester Author: Dai Huang and Michael Matera XAPP661 v2.0.2 May 24, 2004 Summary This application note describes the implementation of a RocketIO transceiver bit-error rate tester (BERT) reference design demonstrating a serial link (1.0 Gb/s to 3.125 Gb/s) between


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    PDF XAPP661 PPC405) XAPP661 free verilog code of prbs pattern generator verilog code 16 bit LFSR in PRBS pattern generator lfsr galois prbs using lfsr lfsr fibonacci verilog code for 10 gb ethernet verilog code 8 bit LFSR verilog HDL program to generate PWM

    DS2174

    Abstract: AN389 APP389 DS2155 DS2156 DS2172 DS21Q55 not32 bc24
    Text: Maxim > App Notes > TELECOM Keywords: T1, E1, J1, SCT, BERT, single chip transceiver, bit error rate test, SCTs, transceivers, bert controller Aug 13, 2002 APPLICATION NOTE 389 DS2155 Internal BERT Programming Abstract: Application note 389 describes how to use the internal Bit Error Rate Test BERT controller found in


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    PDF DS2155 DS2155, com/an389 DS2155: DS2156: DS21Q55: AN389, APP389, Appnote389, DS2174 AN389 APP389 DS2156 DS2172 DS21Q55 not32 bc24

    fiber optic module circuit

    Abstract: optical receiver ESCON AN36 RCC700A
    Text: www.fairchildsemi.com Application Note 36 RCC700A Bit Error Rate Results at 200 Megabaud This application note provides a summary of Bit Error Rate BER results done on ESCON fiber optic transceivers as well as the combination of RCC700A and ESCON™ transceivers at 200 Megabaud. The results enable one to estimate


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    PDF RCC700A RCC700A. AN50000036 fiber optic module circuit optical receiver ESCON AN36

    smartrf04eb

    Abstract: swra097 rf Generator CC2500 FSK labview set top box RF DN503 cc2500 microcontroller interfacing RF MODULE CC2500 DN002
    Text: Design Note DN002 Practical Sensitivity Testing By Morten Engjom Keywords • Receiver Testing • Sensitivity 1 • PER Packet Error Rate • BER (Bit Error Rate) Introduction To properly evaluate the receiver part of a transceiver, it is necessary to be able to


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    PDF DN002 CC1100/CC2500 SWRA097 smartrf04eb swra097 rf Generator CC2500 FSK labview set top box RF DN503 cc2500 microcontroller interfacing RF MODULE CC2500 DN002

    DS2174

    Abstract: DS2174Q T DS2174Q DS2174QN
    Text: DS2174 EBERT www.maxim-ic.com GENERAL DESCRIPTION FEATURES The DS2174 enhanced bit error-rate tester EBERT is a software-programmable test-pattern generator, receiver, and analyzer capable of meeting the most stringent error-performance requirements of digital transmission facilities. It


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    PDF DS2174 DS2174 DS2174Q DS2174QN) DS2174Q T DS2174Q DS2174QN

    DS2174

    Abstract: No abstract text available
    Text: DS2174 EBERT www.maxim-ic.com GENERAL DESCRIPTION FEATURES The DS2174 enhanced bit error-rate tester EBERT is a software-programmable test-pattern generator, receiver, and analyzer capable of meeting the most stringent error-performance requirements of digital transmission facilities. It


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    PDF DS2174 DS2174 DS2174QN)

    free verilog code of prbs pattern generator

    Abstract: verilog code of prbs pattern generator lfsr galois PRBS29 64b/66b encoder prbs using lfsr verilog prbs generator verilog code 16 bit LFSR in PRBS verilog code 8 bit LFSR in scrambler XILINX/lfsr galois
    Text: Application Note: Virtex-II Pro X FPGA Family R XAPP762 v1.0 Sept. 30, 2004 RocketIO X Bit-Error Rate Tester Reference Design Author: Dai Huang Summary This application note describes the implementation of a RocketIO X bit-error rate tester (XBERT) reference design. The reference design generates and verifies non-encoded highspeed serial data on one or multiple point-to-point links (2.5 Gb/s to 10 Gb/s) between


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    PDF XAPP762 3ae-2002, free verilog code of prbs pattern generator verilog code of prbs pattern generator lfsr galois PRBS29 64b/66b encoder prbs using lfsr verilog prbs generator verilog code 16 bit LFSR in PRBS verilog code 8 bit LFSR in scrambler XILINX/lfsr galois

    verilog code of prbs pattern generator

    Abstract: free verilog code of prbs pattern generator verilog code 16 bit LFSR in PRBS VHDL CODE FOR 16 bit LFSR in PRBS verilog code 16 bit LFSR verilog code 8 bit LFSR in scrambler vhdl code for 16 prbs generator vhdl code 16 bit LFSR prbs pattern generator prbs using lfsr
    Text: Application Note: Virtex-4 Family of FPGAs R Virtex-4 RocketIO Bit-Error Rate Tester Author: Vinod Kumar Venkatavaradan XAPP713 v1.1 April 18, 2007 Summary This application note describes the implementation of a Virtex -4 RocketIO™ bit-error rate tester (XBERT) reference design. The XBERT reference design generates and verifies nonencoded or 8B/10B-encoded high-speed serial data on one or multiple point-to-point links


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    PDF XAPP713 8B/10B-encoded 40-bit verilog code of prbs pattern generator free verilog code of prbs pattern generator verilog code 16 bit LFSR in PRBS VHDL CODE FOR 16 bit LFSR in PRBS verilog code 16 bit LFSR verilog code 8 bit LFSR in scrambler vhdl code for 16 prbs generator vhdl code 16 bit LFSR prbs pattern generator prbs using lfsr

    CCITT V.52

    Abstract: MIL-STD-38510 RJ-013 books schmitt trigger cmos
    Text: RJ-013 BIT ERROR RATE TESTER BERT FEATURES n n n n n n n n n Synchronous and asynchronous operation Implementation of five data patterns for synchronous operation Supports asynchronous characters of 8-11 bits Pattern compatible with V.52 Single error injections


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    PDF RJ-013 16-pin RJ-013 Mil-Std-38510, CCITT V.52 MIL-STD-38510 books schmitt trigger cmos

    DS2172

    Abstract: DS2172T DS2172TN PS22 PS29 PS30 ps12 type BEC23
    Text: DS2172 Bit Error Rate Tester BERT www.dalsemi.com PIN ASSIGNMENT TDATA TDIS TCLK VSS VDD RCLK RDIS RDATA Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communications systems Operates at speeds from DC to 52 MHz


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    PDF DS2172 32-bit DS2172 32-PIN DS2172T DS2172TN PS22 PS29 PS30 ps12 type BEC23

    Untitled

    Abstract: No abstract text available
    Text: DS2172 Bit Error Rate Tester BERT www.dalsemi.com FEATURES PIN ASSIGNMENT TDATA TDIS TCLK VSS VDD RCLK RDIS RDATA Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communications systems Operates at speeds from DC to 52 MHz


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    PDF DS2172 32-bit DS2172 32-PIN

    PR11

    Abstract: transistor bc29 32-PIN DS2172 DS2172T DS2172TN PS22 PS30 BC30
    Text: DS2172 Bit Error Rate Tester BERT www.dalsemi.com FEATURES PIN ASSIGNMENT TDATA TDIS TCLK VSS VDD RCLK RDIS RDATA Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communications systems Operates at speeds from DC to 52 MHz


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    PDF DS2172 32-bit DS2172 32-PIN PR11 transistor bc29 DS2172T DS2172TN PS22 PS30 BC30

    32-PIN

    Abstract: DS2172 DS2172T DS2172TN PS22 PS30 O.151
    Text: DS2172 Bit Error Rate Tester BERT www.dalsemi.com FEATURES PIN ASSIGNMENT TDATA TDIS TCLK VSS VDD RCLK RDIS RDATA Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communications systems Operates at speeds from DC to 52 MHz


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    PDF DS2172 32-bit DS2172 32-PIN DS2172T DS2172TN PS22 PS30 O.151

    32-PIN

    Abstract: DS2172 PS22 PS29 PS30
    Text: DS2172 Bit Error Rate Tester BERT www.dalsemi.com Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communications systems Operates at speeds from DC to 52 MHz Programmable polynomial length and feedback taps for generation of any other


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    PDF DS2172 32-bit DS2172 32-PIN PS22 PS29 PS30

    HXNV01600

    Abstract: No abstract text available
    Text: HXNV01600 16 Megabit Non-Volatile Magneto-Resistive RAM Features • ■ ■ ■ ■ ■ ■ ■ Total Dose Hardness 1x106 rad Si Dose Rate Upset Hardness 1x1010 rad(Si)/s Dose Rate Survivability 1x1012 rad(Si)/s Soft Error Rate ≤ 1x10-10 upsets/bit-day


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    PDF HXNV01600 1x106 1x1010 1x1012 1x10-10 1x1014 ADS-14229 HXNV01600

    LB4 bridge diode

    Abstract: ps3 power supply DS2172 PS22 PS29 PS30 ps12 type
    Text: DS2172 DS2172 Bit Error Rate Tester BERT FEATURES PIN ASSIGNMENT TDATA TDIS TCLK VSS VDD RCLK RDIS RDATA • Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communications systems • Operates at speeds from DC to 52 MHz


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    PDF DS2172 DS2172 LB4 bridge diode ps3 power supply PS22 PS29 PS30 ps12 type

    BEC26

    Abstract: DS2172 PS22 PS29 PS30
    Text: DS2172 DS2172 Bit Error Rate Tester BERT FEATURES PIN ASSIGNMENT TDATA TDIS TCLK VSS VDD RCLK RDIS RDATA • Generates/Detects digital bit patterns for analyzing, evaluating and troubleshooting digital communications systems • Operates at speeds from DC to 52 MHz


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    PDF DS2172 DS2172 BEC26 PS22 PS29 PS30

    PS24

    Abstract: PR27 4093 motorola 32-PIN DS21372 DS21372N PS22 PS29 PS30 BC28
    Text: DS21372 3.3V Bit Error Rate Tester BERT www.dalsemi.com TDATA TDIS TCLK VSS VDD RCLK RDIS RDATA Generates/detects digital bit patterns for analyzing, evaluating and troubleshooting digital communications systems Operates at speeds from DC to 20 MHz Programmable polynomial length and


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    PDF DS21372 32-bit DS21372 32-PIN PS24 PR27 4093 motorola DS21372N PS22 PS29 PS30 BC28