Untitled
Abstract: No abstract text available
Text: Use of Life Tested Parts Application Note May 1999 AN9654.1 Author: J. E. Vinson, Ph. D. History The use of life tested parts in flight hardware continually becomes an issue for customers. The life test referred to here is the standard life test called for during Quality
|
Original
|
PDF
|
AN9654
125oC.
|
Use of Life Tested Parts
Abstract: AN9654
Text: Use of Life Tested Parts Application Note November 28, 2006 AN9654.2 Author: J. E. Vinson, Ph. D. History The use of life tested parts in flight hardware continually becomes an issue for customers. The life test referred to here is the standard life test called for during Quality
|
Original
|
PDF
|
AN9654
Use of Life Tested Parts
|
HARRIS
Abstract: la log failure rate TDDB Harris CMOS Integrated Circuits HARRIS SEMICONDUCTOR
Text: Harris Semiconductor No. AN9654 Harris Space Products October 1996 Use of Life Tested Parts Author: J. E. Vinson History than 10 years worth of powered on hours. Highly accelerated tests are needed to gather wearout data in a reasonable period of time. A functional circuit is limited in its
|
Original
|
PDF
|
AN9654
1-800-4-HARRIS
HARRIS
la log
failure rate TDDB
Harris CMOS Integrated Circuits
HARRIS SEMICONDUCTOR
|
6 SIGMA
Abstract: No abstract text available
Text: End of Life Derating: A Necessity or Overkill Application Note November 1999 AN9867 Author: J. E. Vinson, Ph.D., Sr. Principal Engineer, Reliability, jvinson@intersil.com Abstract Customers have the practice of derating the performance specifications for integrated circuits. This may come from a
|
Original
|
PDF
|
AN9867
6 SIGMA
|