EEPROM retention testing
Abstract: AN-1009 CS100 CS160 NM93C46 NM93C46N
Text: Fairchild Application Note 1009 Robert Stodieck March 1997 ENDURANCE The number of write/erase cycles an EEPROM can withstand before a bit in the memory fails. A common definition of “failure” is the failure of a single bit in one memory chip. In the case of the NM93C46, a one bit failure in a 1k bit memory. Note that by this criterion 100% failure could mean that only one bit in each memory has failed.
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NM93C46,
an012504
EEPROM retention testing
AN-1009
CS100
CS160
NM93C46
NM93C46N
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