AN005280 Search Results

AN005280 Datasheets Context Search

Catalog Datasheet	MFG & Type	Document Tags	PDF
7910 Abstract: AN-336 derating curve flow chart Text: National Semiconductor Application Note 336 Charles Carinalli Josip Huljev March 1983 INTRODUCTION The short and long term reliability of National Semiconductor’s interface circuits, like any integrated circuit, is very dependent on its environmental condition. Beyond the	Original	an005280 7910 AN-336 derating curve flow chart	PDF
AN-336 Abstract: Circuit Card Assembly mtbf Text: National Semiconductor Application Note 336 Charles Carinalli Josip Huljev March 1983 INTRODUCTION The short and long term reliability of National Semiconductor’s interface circuits, like any integrated circuit, is very dependent on its environmental condition. Beyond the	Original	th959 AN-336 Circuit Card Assembly mtbf	PDF
AN-336 Abstract: derating curve flow chart Application Note National Semiconductor Text: National Semiconductor Application Note 336 Charles Carinalli Josip Huljev September 2002 Introduction Failure rate is the number of devices that will be expected to fail in a given period of time such as, per million hours . The mean time between failure (MTBF) is the average time (in	Original	AN-336 AN-336 derating curve flow chart Application Note National Semiconductor	PDF
Circuit Card Assembly mtbf Abstract: AN-336 Text: INTRODUCTION The short and long term reliability of National Semiconductor’s interface circuits, like any integrated circuit, is very dependent on its environmental condition. Beyond the mechanical/environmental factors, nothing has a greater influence on this reliability than the electrical and thermal	Original	an005280 Circuit Card Assembly mtbf AN-336	PDF
AN-336 Abstract: an3365 DIP25 Text: ᆅჾ ெࡔࡔॆӷ‫ິࠅ༹ڞ‬ ᆌᆩጀ๥336 Charles Carinalli Josip Huljev 2002౎9ሆ āāࠤቱ୲๟ኸሞߴۨ‫้ڦ‬क़ాǄ૩සǈ௅ӥྤၭ้ǅ āāࢅഄ໲ඪࢆण‫ۉׯ‬ୟᅃᄣ, ெࡔࡔॆӷ‫ڦິࠅ༹ڞ‬ ᇨ೺݀ิࠤቱ‫ڦ‬ഗॲຕణăೝ਩࿮ࠤቱ้क़ǄMTBFǅ	Original	AN-336 AN005280 600mW 150oC, 150oC 108oC AN-336 an3365 DIP25	PDF