Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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F374
Abstract: SN54BCT8374A SN74BCT8374A SN74BCT8374
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
SN74BCT8374
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
SN54BCT8374A
BCT374
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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JD 1803
Abstract: jd 1803 IC jd 1803 data sheet SNV55LVDS31W SNV55LVDS32W jd 1803 data SMV320C6701GLPW14 54LS74A bistable multivibrator using ic 555 SNV54LVTH162245WD
Text: Mil Sel Guide 04-home-new.qxd R 8/11/2004 2:21 PM E A L W Page 1 O R L D S I G N A L P TM R O C E S S I N G Military Semiconductors Selection Guide 2004-2005 Mil Sel Guide 04-home-new.qxd 8/11/2004 2:21 PM Page 2 Table of Contents and Introduction Enhanced Plastic
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04-home-new
JD 1803
jd 1803 IC
jd 1803 data sheet
SNV55LVDS31W
SNV55LVDS32W
jd 1803 data
SMV320C6701GLPW14
54LS74A
bistable multivibrator using ic 555
SNV54LVTH162245WD
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F374
Abstract: SN54BCT8374A SN74BCT8374A
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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BCT8374A
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
SCBA004C
SDYA010
SDYA012
SZZU001B,
SDYU001N,
SCET004,
BCT8374A
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jd 1803 IC
Abstract: JD 1803 jd 1803 data sheet Mil JAN jm38510 Cross Reference LM 4017 decade counter driver bistable multivibrator using ic 555 UC1895 integrate JD 1803 eltek flatpack jd 1803 data
Text: R E A L MILITARY SEMICONDUCTORS SELECTION GUIDE 2002 W O R L D S I G N A L P R O S E S S I N G TM Important Information AMERICAS PRODUCT INFORMATION Product Information Center PIC . . . . . . . . . . . .(972) 644-5580 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .(800) 477-8924
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT374
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F374
Abstract: SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
BCT8374A
SN54BCT8374A
F374
SN54BCT8374A
SN74BCT8374A
SCBS045e
SN74BCT8374
bct8374
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE Family of Testability Products
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SN54BCT8374A,
SN74BCT8374A
SCBS045E
SN54BCT8374A
BCT374
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TSMC 0.18 um MOSfet
Abstract: M38510 10102BCA IDT7204L 5962-8768401MQA 0.18um LDMOS TSMC sl1053 TSMC 0.25Um LDMOS UT63M125BB SMD RTAX250S-CQ208 5962-04221
Text: DSCC Supplemental Information Sheet for Electronic QML-38535 Specification Details: Date: 9/2/2008 Specification: MIL-PRF-38535 Title: Advanced Microcircuits Federal Supply Class FSC : 5962 Conventional: No Specification contains quality assurance program: Yes
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QML-38535
MIL-PRF-38535
MIL-STD-790
MIL-STD-690
-581DSCC
QML-38535
TSMC 0.18 um MOSfet
M38510 10102BCA
IDT7204L
5962-8768401MQA
0.18um LDMOS TSMC
sl1053
TSMC 0.25Um LDMOS
UT63M125BB SMD
RTAX250S-CQ208
5962-04221
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5962L0053605VYC
Abstract: 5962-9069204QXA ATMEL 302 24C16 UT9Q512E-20YCC MOH0268D UT54ACS164245SEIUCCR Z085810 5962-9762101Q2A UT28F256QLET-45UCC 5962R0250401KXA
Text: NOT MEASUREMENT SENSITIVE MIL-HDBK-103AJ 19 SEPTEMBER 2011 SUPERSEDING MIL-HDBK-103AH 28 MARCH 2011 DEPARTMENT OF DEFENSE HANDBOOK LIST OF STANDARD MICROCIRCUIT DRAWINGS This handbook is for guidance only. Do not cite this document as a requirement. AMSC N/A
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MIL-HDBK-103AJ
MIL-HDBK-103AH
MIL-HDBK-103AJ
5962L0053605VYC
5962-9069204QXA
ATMEL 302 24C16
UT9Q512E-20YCC
MOH0268D
UT54ACS164245SEIUCCR
Z085810
5962-9762101Q2A
UT28F256QLET-45UCC
5962R0250401KXA
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Untitled
Abstract: No abstract text available
Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability
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SCBS045E
BCT374
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