CY27S03A
Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
Text: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability
|
Original
|
PDF
|
CY7C122
CY27S03A
15JC10
CY7C190
cy7c9101
cy7c122 die
VIC068A user guide
|
CY7C9101
Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901
Text: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the
|
Original
|
PDF
|
|
SSC 9101
Abstract: c494 223A10
Text: EbE D CYPRESS mg • ssa^bba 0004401 y ■ SEMICONDUCTOR CYPRESS . : PRELIM INARY i - •••••• ^ SEMICONDUCTOR T ^ U S -iO CY1E494 JÇŸÎ5SÎÎ1 CY100E494 ■ ■■ . 16,384 x 4 ECL Static RAM • Open em itter output for ease of memory expansion
|
OCR Scan
|
PDF
|
CY1E494
CY100E494
10KH/10K
CY1E494,
CY10E494
CY100E494
00a44fib
CY10E494
SSC 9101
c494
223A10
|
Untitled
Abstract: No abstract text available
Text: CY10E494 CY100E494 CY101E494 CYPRESS SEMICONDUCTOR 16,384x4 ECL Static RAM Features • Capable o f w ithstanding >2001V E SD • 16,384 x 4 bits organization • Open emitter output for ease of memory expansion • Ultra high speed/standard power • Industry-standard pinout
|
OCR Scan
|
PDF
|
CY10E494
CY100E494
CY101E494
384x4
CY101E494
CY10E494L--12VC
494-10D
10E494--10KMB
10E494--12DM
10E494--12KMB
|
K74 PACKAGE DIAGRAM
Abstract: IR 10e 1h
Text: = ^~' _ = p r e l im in a r y . ^ SEMICONDUCTOR Features • CY10E494 CY100E494 CY101E494 16,384 x 4 bits organization • Ultra high speed/standard power — tAA = 7 ns — I f E — 180 mA 16,384 x 4 ECL Static RAM • Open emitter output for ease of
|
OCR Scan
|
PDF
|
10KH/10K-
100K-compatible
CY10E494
CY100E494
CY101E494
CY101E494
10E494-7VC
CY10E494-7K
10E494-7DC
10E494-8V
K74 PACKAGE DIAGRAM
IR 10e 1h
|
1r 10e
Abstract: N25U
Text: CY10E494 CY100E494 CY101E494 " 'Y P P F Ç Ç 1 6 ,3 8 4 x 4 ECL Static RAM SEMICONDUCTOR Features • 16,384 x 4 bits organization • Ultra high speed/standard power — tAA = 7 n s — IEK = 180 mA • Low-power version — tAA = 12 ns — I e e = Î35 mA
|
OCR Scan
|
PDF
|
CY10E494
CY100E494
CY101E494
10KH/10K-
100K-compatible
CY101E494
CY10E494-7DC
CY10E494-7KC
CY10E494--
1r 10e
N25U
|
Untitled
Abstract: No abstract text available
Text: r CYPRESS SEMICONDUCTOR Features • Open em itter output for ease of memory expansion • 16,384 x 4 bits organization • Ultra high speed/standard power • — tAA = 7 ns Industry standard pinout Functional Description — IE E = 180 mA • CY1E494 CY10E494
|
OCR Scan
|
PDF
|
CY1E494
CY10E494
CY100E494
-/10K
100E494
1E494
494-7JC
|
CY7C2901
Abstract: No abstract text available
Text: ÌB Ìcy p ress • Table 10. Die Sizes of Cypress Devices continued P a rt N um ber Size (mil2) P a rt N um ber Size (mil2) ECL Logic CY 2909A 7968 CY100E301L 14875 CY2910A 21750 CY100E302L 14875 CY2911A 7968 CY100E422 6960 11800 CY100E474 10830 CY7C510
|
OCR Scan
|
PDF
|
CY100E301L
CY2910A
CY100E302L
CY2911A
CY100E422
CY100E474
CY7C510
CY100E494
CY7C516
CY10E301L
CY7C2901
|